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    • 4. 发明公开
    • METHOD TO IDENTIFY GENES UNDER POSITIVE SELECTION
    • 在正选择下鉴定基因的方法
    • EP3210141A1
    • 2017-08-30
    • EP15794379.6
    • 2015-10-21
    • Baylor College of Medicine
    • LICHTARGE, OlivierHSU, Teng-KueiKATSONIS, PanagiotisKOIRE, Amanda Michele
    • G06F19/14G06F19/18
    • G06F19/18C40B30/02G06F17/13G06F19/14
    • A method and computer system for identifying genes associated with a phenotype includes obtaining data representing mutations in a cohort of subjects exhibiting a phenotype. An evolutionary action (EA) score is calculated for each mutation using the data obtained. For each gene in the cohort, respective distributions of the calculated EA scores are determined for mutations found in the gene. The determined distributions of EA scores are quantitatively compared within the cohort and with random distributions to establish comparison data. Based on the comparison data, distributions of EA scores are identified that are non-random, and linkage of each gene in the cohort to the phenotype is assessed based on the identified non-random distributions to identify genes associated with the phenotype. The phenotype can be a disease, such as cancer, and linkage of each gene in the cohort to the disease can be assessed to identify disease causing genes.
    • 用于鉴定与表型相关的基因的方法和计算机系统包括获得表示表现出表型的受试者队列中的突变的数据。 使用获得的数据为每个突变计算进化行为(EA)分数。 对于组群中的每个基因,对于在基因中发现的突变,确定计算EA评分的相应分布。 在队列内定量比较确定的EA评分分布并随机分布以建立比较数据。 基于比较数据,确定非随机EA分数的分布,并且基于鉴定的非随机分布评估队列中每个基因与表型的连锁,以鉴定与表型相关的基因。 表型可以是疾病,例如癌症,并且可以评估人群中每个基因与疾病的连锁,以鉴定引起疾病的基因。
    • 6. 发明公开
    • ANALYSIS DEVICE, ANALYSIS METHOD AND ANALYSIS PROGRAM
    • 分析装置,分析方法和分析程序
    • EP2838040A1
    • 2015-02-18
    • EP12846477.3
    • 2012-10-31
    • Osaka University
    • HAYASHI Shigehiro
    • G06F17/50
    • G06F17/5009G06F17/13G06F2217/16
    • The present invention enables calculation of a solution of a non-self-adjoint problem represented by simultaneous differential equations. An analysis device 10 includes: a setting unit 11 that sets an original differential operator of an analysis object and a boundary condition of variables; an adjoint boundary condition calculation unit 12 that calculates an adjoint boundary condition from the boundary condition; and a non-self-adjoint calculation unit 13 that calculates a primal differential operator and a dual differential operator from the original differential operator, and determines a primal eigenfunction and a dual eigenfunction by using primal simultaneous differential equations and dual simultaneous differential equations, as well as the boundary condition and the adjoint boundary condition, thereby calculating a solution of simultaneous differential equations.
    • 本发明能够计算由同时微分方程表示的非自伴问题的解。 分析装置10具备:设定部11,其设定分析对象的原始的微分算子和变量的边界条件; 伴随边界条件计算单元12,其根据边界条件计算伴随边界条件; 以及非自伴随计算单元13,其从原始微分算子计算原微分算子和双微分算子,并且通过使用原始同时微分方程和双同时微分方程来确定原始本征函数和双特征函数 作为边界条件和伴随边界条件,从而计算出联立微分方程的解。
    • 9. 发明公开
    • ELECTROMAGNETIC PERFORMANCE DETECTION METHOD FOR ORIENTED SILICON STEEL
    • VERFAHREN ZUR ERKENNUNG EINER ELEKTROMAGNETISCHEN LEISTUNGFÜRORIENTIERTEN ALUMINIUMSTAHL
    • EP2533067A1
    • 2012-12-12
    • EP11797513.6
    • 2011-04-12
    • Baoshan Iron & Steel Co., Ltd.
    • WU, MeihongJIN, WeizhongSUN, HuandeYANG, GuohuaSHEN, KanyiHUANG, JieLI, Guobao
    • G01R33/12G01N27/72
    • G06F17/13G01N27/72G01R33/0064
    • A method for detecting electromagnetic property of oriented silicon steel, the method comprises: measuring Euler angles of each of crystal grains in a specimen by use of metallographic etch-pit method; calculating orientation deviation angle θ i (degree) of the crystal grain; combining area Si (mm 2 ) of the crystal grain and correction coefficient X of element Si (X=0.1~10T/degree); correcting on the basis of the magnetic property B 0 (saturation magnetic induction, T) of single-crystal material by using these parameters (θ i , S i , X), formula for correcting is

      obtaining electromagnetic property B 8 of the oriented silicon steel by the above calculations. The present invention can implement detection of electromagnetic property of a specimen under the circumstances that there is no magnetism measuring device or that magnetism measuring devices cannot be used due to reasons such as weight and size of the specimen being too small or surface quality of the specimen being poor.
    • 一种检测取向硅钢的电磁特性的方法,该方法包括:使用金相蚀刻法测量样品中每个晶粒的欧拉角; 计算晶粒的取向偏差角度¸i(度); 将晶粒的面积Si(mm 2)和元素Si的校正系数X(X = 0.1〜10T /度)组合; 通过使用这些参数(¸i,S i,X),基于单晶材料的磁特性B 0(饱和磁感应,T)进行校正,校正公式是获得取向硅钢的电磁特性B 8 通过上述计算。 本发明可以在没有磁测量装置的情况下实现试样的电磁特性,或由于试样的重量和尺寸或试样的表面质量等原因,不能使用磁测量装置 穷人