基本信息:
- 专利标题： DISTRIBUTION ANALYSIS DEVICE
- 申请号：EP12781659.3 申请日：2012-05-01
- 公开(公告)号：EP2708884B1 公开(公告)日：2018-07-11
- 发明人： KIMURA, Kenjiro
- 申请人： National University Corporation Kobe University
- 申请人地址： 1-1 Rokkodai-cho Nada-ku Kobe-shi, Hyogo 657-8501 JP
- 专利权人： National University Corporation Kobe University
- 当前专利权人： KENJIRO KIMURA; JP
- 当前专利权人地址： KENJIRO KIMURA; JP
- 代理机构： Vigand, Philippe
- 优先权： JP2011104143 20110509
- 国际公布： WO2012153496 20121115
- 主分类号： G01N27/72
- IPC分类号： G01N27/72 ; G01R33/09 ; G01R33/10 ; G01R33/12 ; G06F17/13 ; G01R33/00
摘要：
A distribution analysis device analyzes a distribution of a field having a property satisfying the Laplace equation, and includes: an obtainment unit (11) that obtains measurement data indicating the distribution of the field measured through a sensor sensing area, the sensor sensing area being an area that moves in a measurement area where the distribution of the field is measured and being an area in which the field is sensed as an aggregate; and a calculation unit (12) that calculates analysis data indicating the distribution of the field with a higher resolution than the measurement data, using an arithmetic expression that is obtained by deriving a solution of the Laplace equation using a boundary condition that an integral of the solution of the Laplace equation in a finite interval corresponding to a size of the sensor sensing area matches the measurement data.
公开/授权文献:
- EP2708884A1 DISTRIBUTION ANALYSIS DEVICE 公开/授权日：2014-03-19
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
| ------G01N27/00 | 用电、电化学或磁的方法测试或分析材料 |
| --------G01N27/72 | .通过测试磁变量 |