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    • 4. 发明公开
    • Disordering of semiconductors
    • 半导体的异常
    • EP0269359A3
    • 1989-03-29
    • EP87310162.0
    • 1987-11-18
    • XEROX CORPORATION
    • Epler, John E.Burnham, Robert D.
    • H01L21/268H01L21/263H01S3/19
    • H01S5/20H01L21/182H01L21/24H01L21/2636H01S5/2059H01S5/3428H01S5/4031
    • An energy beam induced layer disordering (EBILD) process is used to (a) locally melt in a scanned pattern regions of a solid state semiconductor heterostructure to produce an alloy of intermediate composition having different optical properties and/or (b) incorporating significantly large amounts of an impurity, present in an encapsulation surface layer of a solid state semiconductor heterostructure, into regions of the heterostructure via absorption of the impurity into liquid alloy melt to form regions having different optical and/or electrical properties and (c) thereafter optionally applying IID to enlarge or extend the disordered/as-grown boundaries of the initially melted region. As a direct write analogue to surface initiated impurity-induced disordering (IID), EBILD is a flexible and viable process with high importance for continuous reproducibility and high yield in the fabrication of optoelectronic devices and thin film electronic and optoelectronic circuitry. The invention provides impurity incorporation from a solid phase impurity source using an energy beam liquid phase technique to bring about absorption of the impurity with underlying constituents in a desired pattern to produce regions that may be disordered and possess different electrical properties or optical properties or both compared to regions not part of the scanned pattern.
    • 5. 发明公开
    • Disordering of semiconductors
    • Verfahren zurVeränderungder Eigenschften von Halbleitern。
    • EP0269359A2
    • 1988-06-01
    • EP87310162.0
    • 1987-11-18
    • XEROX CORPORATION
    • Epler, John E.Burnham, Robert D.
    • H01L21/268H01L21/263H01S3/19
    • H01S5/20H01L21/182H01L21/24H01L21/2636H01S5/2059H01S5/3428H01S5/4031
    • An energy beam induced layer disordering (EBILD) process is used to (a) locally melt in a scanned pattern regions of a solid state semiconductor heterostructure to produce an alloy of intermediate composition having different optical properties and/or (b) incorporating significantly large amounts of an impurity, present in an encapsulation surface layer of a solid state semiconductor heterostructure, into regions of the heterostructure via absorption of the impurity into liquid alloy melt to form regions having different optical and/or electrical properties and (c) thereafter optionally applying IID to enlarge or extend the disordered/as-grown boundaries of the initially melted region. As a direct write analogue to surface initiated impurity-induced disordering (IID), EBILD is a flexible and viable process with high importance for continuous reproducibility and high yield in the fabrication of optoelectronic devices and thin film electronic and optoelectronic circuitry. The invention provides impurity incorporation from a solid phase impurity source using an energy beam liquid phase technique to bring about absorption of the impurity with underlying constituents in a desired pattern to produce regions that may be disordered and possess different electrical properties or optical properties or both compared to regions not part of the scanned pattern.
    • 使用能量束感应层无序(EBILD)工艺来(a)在固态半导体异质结构的扫描图案区域局部熔化,以产生具有不同光学性质的中间组合物合金和/或(b)大量掺入 存在于固态半导体异质结构的封装表面层中的杂质通过将杂质吸收到液态合金熔体中而形成具有不同光学和/或电特性的区域,并且随后可选地应用IID 扩大或延伸初始熔化区域的无序/生长边界。 作为直接写入类似于表面引发的杂质诱导的无序(IID)的方法,EBILD是一种灵活和可行的方法,对于光电子器件和薄膜电子和光电子电路的连续再现性和高产率具有重要意义。 本发明使用能量束液相技术从固相杂质源中提供杂质掺杂,以使所需杂质与所需图案的底层组分吸收,产生可能无序并且具有不同电性能或光学性质的区域,或两者都被比较 到不是扫描图案的一部分的区域。