会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明公开
    • VERMESSUNGSEINRICHTUNG UND VERFAHREN NACH DEM GRUNDPRINZIP DER KONFOKALEN MIKROSKOPIE
    • 测量装置和方法的基本原理激光共聚焦显微镜
    • EP1825217A1
    • 2007-08-29
    • EP05813473.5
    • 2005-12-01
    • Sirona Dental Systems GmbH
    • SCHWOTZER, Axel
    • G01B11/24G02B21/00
    • G02B21/0064G02B21/0028
    • The invention relates to a measuring device for the confocal measurement of an object. Said device comprises a light source (1), imaging optics (4) and an image detector (10). The device is equipped with elements (11) for modifying the optical path length in the beam path between the diaphragm assembly (3) and the object (6), the optical distance of the image plane being modifiable in a predetermined manner and elements for influencing at least one characteristic (intensity, frequency, spectrum) of the light (5) that is emitted from the light source (1) to the object (6) or the light (7) that is reflected by the object (6) and that strikes the sensor (10), during an exposure period (tB1) of an exposure. According to the invention, a predetermined relationship, (in the form of a profile), between the characteristic of the light (5, 7) and the optical distance of the image plane from the imaging optics (4) is produced during the exposure period (tB1). The device is also equipped with elements, which supply a measured value for the exposure period (tB1) that is dependent on the characteristics of the light of the viewing beam path (7). A height co-ordinate (zs) of the object (6) can be reconstructed from the measured value of the exposure period (tB1) and a reference value.