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1. 发明公开

EP2439589A2 X-ray image photographing method and X-ray image photographing apparatus 有权
标题翻译： Röntgenstrahlbild-Fotografierverfahren undRöntgenstrahlbild-Fotografiervorrichtung
公开(公告)号：EP2439589A2
公开(公告)日：2012-04-11
申请号：EP11184314.0
申请日：2011-10-07
申请人： Rigaku Corporation
发明人： Omote, Kazuhiko , Kambe, Makoto , Takeda, Yoshihiro
IPC分类号： G03B42/00
CPC分类号： G03B42/02 , A61B6/4035 , A61B6/484 , A61B6/588 , A61B6/589
摘要： There is provided an X-ray image photographing method and an X-ray image photographing apparatus capable of photographing a high resolution phase contrast image and a high resolution absorption contrast image in a short time according to the purpose only by finely adjusting the distance between a specimen and a detector with respect to an X-ray source.
The X-ray image photographing method enables photographing of a fine structure with a high space resolution while using an X-ray source having a finite size, and d/L is sufficiently smaller than 1, when L is a distance from an X-ray source 110 to a specimen 500 and d is a distance from the specimen 500 to a detector 130. Further, a distance between a peak position and a valley position of a phase contrast is not less than 1/3Δ and not more than 3Δ, when λ is an average wavelength of X-ray to be irradiated from the X-ray source 110 and Δ is a resolution of the detector 130.
摘要翻译：本发明提供一种能够根据目的在短时间内拍摄高分辨率相位差图像和高分辨率吸收对比图像的X射线图像拍摄方法和X射线图像摄影装置，只需通过精细地调整样品和检测器相对于X射线源。当使用具有有限尺寸的X射线源时，X射线图像拍摄方法能够以高空间分辨率拍摄精细结构，并且当L是距离X射线的距离时，d / L足够小于1 源110到样本500，d是从样本500到检测器130的距离。另外，相位对比度的峰值位置和谷点位置之间的距离不小于1/3“且不大于3” 当»是从X射线源110照射的X射线的平均波长，“是检测器130的分辨率时。

2. 发明公开

EP2439589A3 X-ray image photographing method and X-ray image photographing apparatus 有权
标题翻译： X射线图像拍摄方法和X射线图像拍摄
公开(公告)号：EP2439589A3
公开(公告)日：2014-08-27
申请号：EP11184314.0
申请日：2011-10-07
申请人： Rigaku Corporation
发明人： Omote, Kazuhiko , Kambe, Makoto , Takeda, Yoshihiro
IPC分类号： G03B42/02 , A61B6/00
CPC分类号： G03B42/02 , A61B6/4035 , A61B6/484 , A61B6/588 , A61B6/589
摘要： There is provided an X-ray image photographing method and an X-ray image photographing apparatus capable of photographing a high resolution phase contrast image and a high resolution absorption contrast image in a short time according to the purpose only by finely adjusting the distance between a specimen and a detector with respect to an X-ray source.
The X-ray image photographing method enables photographing of a fine structure with a high space resolution while using an X-ray source having a finite size, and d/L is sufficiently smaller than 1, when L is a distance from an X-ray source 110 to a specimen 500 and d is a distance from the specimen 500 to a detector 130. Further, a distance between a peak position and a valley position of a phase contrast is not less than 1/3Δ and not more than 3Δ, when λ is an average wavelength of X-ray to be irradiated from the X-ray source 110 and Δ is a resolution of the detector 130.

3. 发明授权

EP2439589B1 X-ray image photographing method and X-ray image photographing apparatus 有权
公开(公告)号：EP2439589B1
公开(公告)日：2018-06-20
申请号：EP11184314.0
申请日：2011-10-07
申请人： Rigaku Corporation
发明人： Omote, Kazuhiko , Kambe, Makoto , Takeda, Yoshihiro
IPC分类号： G03B42/02 , A61B6/00
CPC分类号： G03B42/02 , A61B6/4035 , A61B6/484 , A61B6/588 , A61B6/589
摘要： There is provided an X-ray image photographing method and an X-ray image photographing apparatus capable of photographing a high resolution phase contrast image and a high resolution absorption contrast image in a short time according to the purpose only by finely adjusting the distance between a specimen and a detector with respect to an X-ray source. The X-ray image photographing method enables photographing of a fine structure with a high space resolution while using an X-ray source having a finite size, and d/L is sufficiently smaller than 1, when L is a distance from an X-ray source 110 to a specimen 500 and d is a distance from the specimen 500 to a detector 130. Further, a distance between a peak position and a valley position of a phase contrast is not less than 1/3” and not more than 3”, when » is an average wavelength of X-ray to be irradiated from the X-ray source 110 and ” is a resolution of the detector 130.

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