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    • 1. 发明公开
    • Testing method for a polarizing plate
    • 测试方法
    • EP1602911A1
    • 2005-12-07
    • EP04013192.2
    • 2004-06-03
    • Optimax Technology Corp.
    • Yeh, Shih-FengCheng, Yao-Chung
    • G01M11/02G01N21/21
    • G01M11/02G01N21/21
    • The testing method for a polarizing plate (16) includes the following two types of testing: a selected light beam passing through a filter (13), a polarizer (14), a concave lens (15) or a filter, a mirror polarizer, a concave lens e.g. made of polystyrene and finally to a sample of a polarizing plate (16), the sample is rotated along z-axis to ascertain that if there is any variation of shade in an optical domain, in order to differentiate defective samples from qualified ones. By applying the method, gooseflesh in the sample is ascertained by naked eyes easily while feeding; the checking result can be reflected to a factory owner. The test cost is low and requires only inexpensive instruments. Moreover, an additional processing of polarizing plate is needless.
    • 偏振片(16)的测试方法包括以下两种测试:通过滤光器(13)的选定光束,偏振器(14),凹透镜(15)或滤光器,镜面偏振器, 凹透镜例如 由聚苯乙烯制成,最后到达偏振板(16)的样品,样品沿z轴旋转,以确定如果在光学域中存在任何色调变化,以便将有缺陷的样品与合格样品区分开。 通过应用该方法,在喂食时,肉眼容易地确定样品中的鹅肉肉; 检查结果可以反映给工厂所有者。 测试成本低,只需要便宜的仪器。 此外,偏光板的附加处理是不必要的。
    • 2. 发明公开
    • Inspecting device for optical films
    • Vorrichtung zur Inspektion optischer电影
    • EP1662250A1
    • 2006-05-31
    • EP04028336.8
    • 2004-11-30
    • Optimax Technology Corp.
    • Yeh, Shih-FengCheng, Yao-Chung
    • G01N21/896G02B5/30G01B11/06G01J4/00
    • G01N21/896G01B11/0641G01N21/21G01N21/8422
    • The invention is an inspecting device for optical films used to inspect the thickness homogeneousness and defects of optical films. It comprises one or more than one illuminant, one or more than one polarization device, a filtering device and a scattering device. The light radiates a beam passing through the filtering device to filter the most suitable beam for the inspection. The beam is polarized through the polarization device. The polarized beam is magnified through the scattering device. The inspecting device has a simple structure without the need of extra expensive instruments and extra processing procedures for the samples of optical films. The inspection procedure is simple and doesn't take a long time. Its cost is also not expensive. It is beneficial to reduce the production cost.
    • 本发明是用于检查光学膜的厚度均匀性和缺陷的光学膜的检查装置。 它包括一个或多个发光体,一个或多于一个偏振装置,滤光装置和散射装置。 光照射通过过滤装置的光束,以过滤最合适的光束进行检查。 光束通过偏振装置极化。 偏振光束通过散射装置放大。 检查装置具有简单的结构,而不需要昂贵的仪器和用于光学膜样品的额外处理程序。 检查程序简单,不需要很长时间。 其成本也不贵。 降低生产成本是有益的。