会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 4. 发明公开
    • FLOW PATH MEMBER, AND HEAT EXCHANGER AND SEMICONDUCTOR DEVICE USING SAME
    • ÖUN IT LE MENT IT IT IT IT IT IT IT IT IT IT IT IT IT IT IT IT IT
    • EP2833402A1
    • 2015-02-04
    • EP13767597.1
    • 2013-03-29
    • Kyocera CorporationKabushiki Kaisha Toyota Jidoshokki
    • ABE, YuichiNABESHIMA, YutakaIWATA, YoshitakaMORI, ShogoKAMIYAMA, Daizo
    • H01L23/473
    • H01L23/3675F28F3/12H01L23/145H01L23/4334H01L23/473H01L2924/0002H01L2924/00
    • Provided are a flow path member that suppresses flow path breakage, a heat exchanger and a semiconductor device using the same. This flow path member (1) has a flow path (5) in which a fluid flows and which is constituted by a lid portion (2), a partition wall portion (3b), a side wall portion (3) and a bottom plate portion (4). At least one of the partition wall portion and the sidewall portion is partly embedded in at least one of the lid portion (2) and the bottom plate portion (4) for direct connection. Therefore, even if a thermal stress is repeatedly developed in the flow path member (1), breakage of junctures (8) of the lid portion (2), the partition wall portion (3b), the side wall portion (3) and the bottom plate portion (4) that constitute the flow path is suppressed, and sealing performance of the flow path (5) is increased. Further, breakage of the flow path (5) can be suppressed even if a high-pressure fluid is passed through the flow path (5), breakage of the flow path due to the thermal stress can be suppressed in a heat exchanger and a semiconductor device using the flow path member (1), heat exchange efficiency can be improved, and reliability can be improved.
    • 提供抑制流路破裂的流路构件,使用其的热交换器和半导体装置。 该流路构件(1)具有流体流动的流路(5),其由盖部(2),分隔壁部(3b),侧壁部(3)和底板 部分(4)。 分隔壁部分和侧壁部分中的至少一个部分地嵌入到盖部分(2)和底板部分(4)中的至少一个中用于直接连接。 因此,即使在流路构件(1)中重复显示热应力,盖部(2),分隔壁部(3b),侧壁部(3)和接头(8)的接合部(8) 构成流路的底板部(4)被抑制,并且流路(5)的密封性能提高。 此外,即使高压流体通过流路(5)也能够抑制流路(5)的破损,能够抑制热交换器和半导体中的热应力引起的流路的破裂 使用流路构件(1)的装置,可以提高热交换效率,并且可以提高可靠性。