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    • 2. 发明公开
    • DISPOSITIF OPTIQUE DE MESURE D'UN PARAMÈTRE PHYSIQUE ET PROCÉDÉ ASSOCIÉ
    • 光学装置用于测量物理参数和相关方法
    • EP3019822A1
    • 2016-05-18
    • EP14738460.6
    • 2014-07-04
    • Institut National Polytechnique de Toulouse (INPT)Centre National de la Recherche Scientifique (CNRS)
    • BOSCH, ThierryBONY, FrancisLUNA ARRIAGA, Antonio
    • G01B9/02
    • G01J9/02G01B9/02083G01B9/02092
    • The invention relates to an optical device (10) for determining a physical parameter which comprises: a laser diode (11) for emitting a beam toward a target; a means for detecting (13) an interferometric signal SM(t) which comprises the information on the physical parameter to be determined, and which is generated by an interference between the emitted beam and a light beam reflected by the target; means for converting (15) the signal SM(t) obtained by the detection means (13) into a measurement of the physical parameter, said conversion means (15) comprising: first means (17) for suppressing a continuous component Off(t) of the interferometric signal SM(t); second means (18) for determining interferometric peaks in the interferometric signal SM(t) obtained from the signal obtained at the output of the first means (17). The invention also relates to an associated method. Said method is particularly suitable for speckle interferometric signals.
    • 测定的物理参数的光学装置(10)包括:用于发射朝向目标的光束的激光二极管(11); 关于检测(13)上的干涉信号SM(t)的其中包括关于所述物理参数的信息,是确定的开采,并且所有这是由于所发射的光束和由目标反射的光束之间的干涉生成的元件; firstElement(17)用于抑制直流分量关闭(吨):包含由所述检测元件(13)中获得到的物理参数的测量,所述转换元件(15)元件,用于将(15)的信号SM(t)的 干涉信号SM(t)的; secondElement(18),用于在从在所述第一元件(17)的输出端获得的信号而获得的干涉信号SM(t)的确定性采矿干涉峰。 相关的方法,特别是适合于散斑干涉信号从而进行说明。