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1. 发明公开

EP3594691A1 AUTOMATED ANALYZER 审中-公开
公开(公告)号：EP3594691A1
公开(公告)日：2020-01-15
申请号：EP18764008.1
申请日：2018-01-31
申请人： Hitachi High-Technologies Corporation
发明人： MAKINO Akihisa , AKUTSU Masashi , MISHIMA Hiroyuki , YASUI Akihiro
IPC分类号： G01N35/04
摘要： An automated analyzer is provided with one or more dispensing lines 109, 209 that are each for loading and unloading, at one end thereof, a sample rack 101 having placed therein one or more sample containers accommodating a sample for analysis and for conveying the sample rack back and forth from a dispensing position for dispensing the sample from the sample containers and sample rack removal parts 111, 211 that are provided adjacent to the other ends of the dispensing lines 109, 209 and provide and receive sample racks to and from the dispensing lines 109, 209. According to this configuration, it is possible to convey an urgent sample while suppressing device complexity, preventing cost from increasing, and also maintaining speed.

2. 发明公开

EP3422017A1 AUTOMATED ANALYSIS DEVICE AND CLEANING METHOD 有权转让
公开(公告)号：EP3422017A1
公开(公告)日：2019-01-02
申请号：EP17756114.9
申请日：2017-01-31
申请人： Hitachi High-Technologies Corporation
发明人： MURAMATSU Yoshiki , YASUI Akihiro , SUZUKI Yoshihiro , ARUGA Yoichi
IPC分类号： G01N35/10
摘要： [Subject]
The invention provides a highly reliable automatic analyzer and dispenser probe cleaning method that allows for the removal of leftover cleaning water from the outer wall surfaces of a probe without increasing the size of a cleaning bath and contaminating the outer wall surfaces of the probe.
[Solving Means]
A cleaning bath 113 (108, 106) comprises: a cleaning water outlet 203 for discharging into the cleaning bath 113 (108, 116) the cleaning water supplied from a cleaning water supply mechanism 123; and a compressed air outlet 204, disposed on the trajectory of the cleaning water discharged from the cleaning water outlet 203, for discharging the compressed air supplied from a compressed air supply mechanism 124 toward a sample probe 111b or a reagent probe 120 inserted in the cleaning bath 113 (108, 106).

3. 发明公开

EP3598142A1 AUTOMATED ANALYSIS DEVICE 有权转让
公开(公告)号：EP3598142A1
公开(公告)日：2020-01-22
申请号：EP18767506.1
申请日：2018-03-08
申请人： Hitachi High-Technologies Corporation
发明人： YASUI Akihiro , MAKINO Akihisa , AKUTSU Masashi , MISHIMA Hiroyuki , SUZUKI Yoshihiro
IPC分类号： G01N35/02 , G01N35/04
摘要： Provided is an automated analysis device with which sufficient reaction process data can be acquired irrespective of the scale of the device, and with which it is possible to ensure freedom of the device configuration. An automated analysis device 100 is provided with: a reaction disk 1 which circumferentially accommodates a plurality of reaction vessels 2; a specimen dispensing mechanism 11 which dispenses a specimen into the reaction vessels 2; a reagent dispensing mechanism 7 which dispenses a reagent into the reaction vessels 2; a measuring unit 4 which measures a reaction process of a mixture of the specimen and the reagent in the reaction vessels 2; and a cleaning mechanism 3 which cleans the reaction vessels 2 after measurement. Further, the automated analysis device 100 includes a controller 21 which controls the drive of the reaction disk 1 such that in one cycle the reaction vessels 2 move by an amount A in the circumferential direction in such a way that N and A are mutually prime, B and C are mutually prime, and the relationship A × B = N × C ± 1 holds, where N is the total number of reaction vessels 2 accommodated in the reaction disk 1, the reaction disk 1 moves through C (where C > 1) rotations + an amount equivalent to one reaction vessel after B (where B > 2) cycles, and the number of reaction vessels 2 moved in one cycle is A (where N > A > N/B + 1).

4. 发明公开

EP2881742A1 AUTOMATIC ANALYSIS DEVICE 有权转让
标题翻译：自动分析装置
公开(公告)号：EP2881742A1
公开(公告)日：2015-06-10
申请号：EP13825221.8
申请日：2013-07-25
申请人： Hitachi High-Technologies Corporation
发明人： YASUI Akihiro , TOKIEDA Hitoshi , ORIHASHI Toshihide , SAITO Yoshiaki , SUZUKI Naoto
IPC分类号： G01N35/10
摘要： Implemented is an automatic analyzer capable of ensuring sufficient nozzle cleaning and suppressing deterioration in the accuracy of analysis even when the processing of the sample is speeded up. When it is judged that there remains no analysis item of the sample, a judgment is made on whether the sample dispensation quantity of the n-th sample dispensation is less than a dispensation quantity threshold value or not (steps S4 and S6). If the sample dispensation quantity of the n-th sample dispensation is less than the dispensation quantity threshold value, a cleaning pattern W3 or W4 is selected (step S11 or S12) by making a judgment on whether or not all the sample dispensation quantities of the first through (n - 1)-th sample dispensations are less than the dispensation quantity threshold value (step S8). If the sample dispensation quantity of the n-th sample dispensation is the dispensation quantity threshold value or more in the step S6, a cleaning pattern W1 or W2 is selected (step S9 or S10) by making the judgment on whether or not all the sample dispensation quantities of the first through (n - 1)-th sample dispensations are less than the dispensation quantity threshold value (step S7).
摘要翻译：实现了自动分析仪，即使样品加工速度加快，也能确保充分的喷嘴清洁并抑制分析精度的下降。在判断为没有样品的分析项目的情况下，判断第n个试样分注的试样分注量是否小于分注量阈值（步骤S4，S6）。如果第n次试样分注的试样分注量小于分注量阈值，则通过判断试样分注量的全部样本分注量是否满足要求，选择清洁图案W3或W4（步骤S11或S12）第（n-1）次样品分配小于分配量阈值（步骤S8）。如果在步骤S6中第n次试样分注的试样分注量是分注量阈值以上，则通过判断是否全部试样来选择清洗图案W1或W2（步骤S9或S10）第一至第（n-1）个样本分配的分配量小于分配量阈值（步骤S7）。

5. 发明公开

EP3517969A1 AUTOMATIC ANALYSIS DEVICE 有权转让
公开(公告)号：EP3517969A1
公开(公告)日：2019-07-31
申请号：EP17852953.3
申请日：2017-09-14
申请人： Hitachi High-Technologies Corporation
发明人： YASUI Akihiro , YOSHIDA Gorou , MURAMATSU Yoshiki , YAMAZAKI Isao
IPC分类号： G01N35/00 , G01N35/04 , G01N35/10
摘要： An automatic analyzer (100) includes: a storage unit (21b) that stores various parameters of the automatic analyzer (100) in association with each of elevations used in the automatic analyzers (100), the parameters being optimized for each of the elevations; an input unit (21d) that acquires information of an elevation at which the automatic analyzer (100) is provided; and a controller (21a) that reads the parameters stored in the storage unit (21b) and sets the read parameters to the automatic analyzer (100) based on the elevation acquired by the input unit (21d). As a result, various parameters can be easily adjusted according to a usage environment of the device.

6. 发明公开

EP3287793A1 AUTOANALYZER AND METHOD 有权转让
标题翻译：自动分析器和方法
公开(公告)号：EP3287793A1
公开(公告)日：2018-02-28
申请号：EP16783015.7
申请日：2016-04-07
申请人： Hitachi High-Technologies Corporation
发明人： YASUI Akihiro , CHIDA Saori , HIRANO Masaaki
IPC分类号： G01N35/10
CPC分类号： G01N35/1009 , G01N21/31 , G01N35/10 , G01N35/1004 , G01N35/1016 , G01N2035/00237
摘要： Provided is a specimen dispensing mechanism 12 that includes a specimen nozzle 12a dispensing a specimen to be analyzed in a specimen chamber 15 to a reaction chamber 2 by suctioning and ejecting the specimen, and the specimen dispensing mechanism 12 is controlled so as to perform a specimen suctioning process of inserting the specimen nozzle 12a into the specimen chamber 15 and suctioning the specimen in the specimen chamber 15, a liquid suctioning process of suctioning a liquid by the specimen nozzle 12a after the specimen suctioning process, and an ejection process of ejecting the liquid and a portion of the specimen to the empty reaction chamber 2 from the specimen nozzle 12a in this order. Thereby, it is possible to provide an automatic analyser and a method which are capable of dispensing a small amount of specimen with a high level of accuracy, without depending on the outer shape of a specimen nozzle or the viscosity of the specimen.
摘要翻译：本发明提供一种检体分注机构12，该检体分注机构12具备通过吸引和排出检体而将检体室15内的分析对象检体分注到反应室2内的检体喷嘴12a，控制检体分注机构12以进行检体将试样管嘴12a插入试样室15并吸引试样室15内的试样的吸引工序，在试样吸引工序后利用试样喷嘴12a吸引液体的吸液工序和喷射液体的喷射工序并将试样的一部分从试样喷嘴12a依次输送到空反应室2。由此，能够提供不依赖于试样喷嘴的外形或试样的粘度而能够高精度地分注少量试样的自动分析装置和方法。

7. 发明公开

EP3093668A1 AUTOMATED ANALYZER 有权转让
标题翻译：自动分析仪
公开(公告)号：EP3093668A1
公开(公告)日：2016-11-16
申请号：EP15734929.1
申请日：2015-01-05
申请人： Hitachi High-Technologies Corporation
发明人： YASUI Akihiro , SUZUKI Yoshihiro , NAKAMURA Kazuhiro , TOKIEDA Hitoshi
IPC分类号： G01N35/10 , G01N35/04
CPC分类号： G01N35/1011 , G01N35/1079 , G01N2035/0412 , G01N2035/0453 , G01N2035/1025
摘要： There is provided an automatic analysis device which can properly control an operation of a dispensing nozzle by identifying a target with which the dispensing nozzle comes into contact, and which can avoid damage to the dispensing nozzle. In a case where a sample container 15 has a rubber-made lid 35, if a sample nozzle 12a descends and comes into contact with the lid 35, the sample nozzle 12a is relatively moved inside an arm 42 as far as a lid detection distance 48, and a detector 44 detects a detection plate 43. A fact that the sample nozzle 12a comes into contact with the lid 35 is stored together with position information of the sample nozzle 12a, into an operation commanding unit. The sample nozzle 12a further continues to descend, and a suction operation of a sample 34 is performed at a predetermined position. In a case where the sample nozzle 12a collides with a frame portion 36 of the lid 35 and external force is applied thereto, the detector 44 detects that the detection plate 43 is relatively moved as far as the detection distance 48. Thereafter, the sample nozzle 12a stops descending, when excessive external force is applied due to the sample nozzle 12a trying to descend and the detection plate 43 is relatively moved as far as an obstacle detection distance 49.
摘要翻译：提供了一种自动分析装置，其可以通过识别分配喷嘴接触的目标来适当地控制分配喷嘴的操作，并且可以避免对分配喷嘴的损坏。在样本容器15具有橡胶制成的盖子35的情况下，如果样品喷嘴12a下降并与盖子35接触，则样本喷嘴12a在臂42内相对移动到盖检测距离48 检测器44检测出检测板43.试样喷嘴12a与盖35接触的事实与采样喷嘴12a的位置信息一起存储到操作指令单元中。样本喷嘴12a进一步下降，并且在预定位置执行样品34的抽吸操作。在样本喷嘴12a与盖35的框架部36碰撞并施加外力的情况下，检测器44检测到检测板43相对移动到检测距离48之前。此后，样本喷嘴当试样喷嘴12a试图下降并且检测板43被相对移动到障碍物检测距离49时，施加过大的外力时，12a停止下降。

8. 发明公开

EP2770329A1 AUTOMATED ANALYZER 有权转让
标题翻译：自动化分析仪
公开(公告)号：EP2770329A1
公开(公告)日：2014-08-27
申请号：EP12841806.8
申请日：2012-10-12
申请人： Hitachi High-Technologies Corporation
发明人： YASUI Akihiro , SUZUKI Yoshihiro , TOKIEDA Hitoshi
IPC分类号： G01N35/00 , G01N35/04 , G01N35/10
CPC分类号： G01N35/0092 , G01N35/025 , G01N35/04 , G01N35/1002 , G01N35/1009 , G01N2035/0094 , G01N2035/0413 , G01N2035/0444 , G01N2035/1032
摘要： Provided is an automated analyzer that is compact and capable of multiple types of analysis, and that can maintain high processing capacity and dispensation accuracy even when an item requiring dilution/pretreatment and a general reaction measurement item are mixed. The automated analyzer includes a plurality of sample dispensing mechanisms that can be independently driven. The plurality of sample dispensing mechanisms each include a sample collection position, a sample nozzle for collecting the sample, and a washing tank for washing the sample nozzle. The sample dispensing mechanisms are configured to collect the sample from a plurality of sample collection positions and are operated independently to perform sample dispensation into reaction containers on a reaction disc. At least one of the sample dispensing mechanisms is provided for each of a sample requiring dilution/pretreatment and a sample that does not require dilution/pretreatment. The automated analyzer is provided with a control means for causing the respective mechanisms to be operated in a dedicated manner. The sample is dispensed such that no vacancy is created in the reaction containers.
摘要翻译：提供了一种紧凑且能够进行多种分析的自动分析仪，即使当需要稀释/预处理的物品和一般反应测量项目混合时，也可以保持高处理能力和分配精度。自动分析仪包括可独立驱动的多个样品分配机构。多个样品分配机构各自包括样品收集位置，用于收集样品的样品喷嘴和用于洗涤样品喷嘴的洗涤槽。样品分配机构被配置为从多个样品收集位置收集样品并独立地操作以将样品分配到反应盘上的反应容器中。为需要稀释/预处理的样品和不需要稀释/预处理的样品中的每一个提供至少一个样品分配机构。所述自动分析装置设置有用于使各机构以专用方式操作的控制装置。分配样品使得在反应容器中不产生空位。

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