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    • 3. 发明公开
    • Bandgap isolated light emitter
    • Bandlückenisoliertelichtemittierende Vorrichtung
    • EP1315216A3
    • 2003-10-22
    • EP02080608.9
    • 1998-11-20
    • Honeywell Inc.
    • Johnson, Ralph H.
    • H01L29/861H01L33/00H01S5/183
    • H01S5/18341H01L33/105H01L33/145H01L33/465H01S5/18308H01S5/18311H01S5/1833H01S5/18369H01S5/2063H01S5/3054H01S5/3086H01S2301/173
    • A light emitting device having a first mirror (58), an active layer (64), a second mirror (68) and a beryllium implantation (82) resulting in a peripheral boundary of a waveguide (86) through the first and second mirrors (58, 68) the active layer (64) and the trapping layer (62). A P-N junction is situated within the implantation and the guide. The turn of the voltage is lower for the junction within the waveguide than that within ght implantation, resulting in confinement of current within the guide at a voltage applied to the device that is greater than the lower junction voltage and less than the higher junction voltage. The device also has an electron trapping layer (62) between said first mirror (58) and said active layer (64), and a conduction layer (72) situated on the second mirror (68).
    • 一种具有第一反射镜(58),有源层(64),第二反射镜(68)和铍注入(82)的发光器件,其通过第一和第二反射镜(...)导致波导(86)的周边边界 58,68)有源层(64)和捕获层(62)。 P-N结位于植入和引导下。 波导内的接合点的电压相对于ght注入内的电压的转换较低,导致电流在引导器内被施加到器件上的电压约束,该电压大于较低的结电压且小于较高的结电压。 该装置还在所述第一反射镜(58)和所述有源层(64)之间具有电子捕获层(62),以及位于第二反射镜(68)上的导电层(72)。
    • 4. 发明公开
    • Laser with a selectively changed current confining layer
    • 激光切割机Strombegrenzungsschicht
    • EP1306943A1
    • 2003-05-02
    • EP03075005.3
    • 1998-03-04
    • HONEYWELL INC.
    • Guenter, James K.Johnson, Ralph H.
    • H01S5/183H01L33/00
    • H01S5/1833H01S5/0425H01S5/18311H01S5/2081
    • A laser structure is provided with two current confining layers of a material that is subject to oxidation in the presence of an oxidizing agent. The laser structure is shaped to expose edges of the current confining layers to permit the edges to be exposed to the oxidizing agent. The current confining layers are oxidized selectively to create electrically resistive material at the oxidized portions (100, 104) and by the oxidized and electrically resistive portions in order to direct current from one electrical contact pad (14,26) by passing through a preslected portion of an active region (20) of the laser. The laser structure can be a vertical cavity surface emitting laser. The device achieves the current confining and directing function without the need to use ion bombardment or implantation to provide the current confining structure within the body of the laser.
    • 激光结构设置有在氧化剂存在下经受氧化的材料的两个电流限制层。 激光结构被成形为暴露电流限制层的边缘以允许边缘暴露于氧化剂。 电流限制层被选择性地氧化以在氧化部分(100,104)和氧化和电阻部分处产生电阻材料,以便通过通过预置部分引导来自一个电接触焊盘(14,26)的电流 的激光器的有源区域(20)。 激光器结构可以是垂直腔表面发射激光器。 该装置实现了电流限制和引导功能,而不需要使用离子轰击或植入来在激光器的主体内提供电流约束结构。
    • 6. 发明公开
    • Double diffused lead-out for a semiconducteur device
    • Doppeldiffundierte KontaktleitungfürHalbleiterbauelement。
    • EP0437949A1
    • 1991-07-24
    • EP90313694.3
    • 1990-12-14
    • HONEYWELL INC.
    • Johnson, Ralph H.
    • H01L21/74H01L21/22
    • H01L29/66166H01L21/743
    • A structure and a device which allow low resistance connection to internal circuit devices comprising a double diffused leadout is described. The first leadout diffusion (17,18) is lightly doped with dopant from either chemical group III or V to constitute N- or P- type material respectively. The lightly doped region has a high resistivity. The second diffusion (13,14) is diffused, using a dopant from the same chemical group as the first dopant, into the first diffusion. The second diffusion is diffused with enough dopant to constitute N + or P + material and has a low resistivity. The double diffused leadout creates a low resistance connection to the internal circuitry of an IC device while maintaining breakdown with the protective overlayer (31).
    • 描述了允许与包括双扩散引出件的内部电路装置的低电阻连接的结构和装置。 第一引出扩散(17,18)分别用化学III或V族的掺杂剂轻掺杂以构成N-或P-型材料。 轻掺杂区域具有高电阻率。 使用与第一掺杂剂相同的化学基团的掺杂剂将第二扩散(13,14)扩散到第一扩散中。 第二扩散部分用足够的掺杂剂扩散以构成N +或P +材料,并具有低电阻率。 双扩散引出产生与IC器件的内部电路的低电阻连接,同时保护与保护覆层(31)的击穿。
    • 7. 发明公开
    • Bandgap isolated light emitter
    • 带隙孤立的光发射器
    • EP1315216A2
    • 2003-05-28
    • EP02080608.9
    • 1998-11-20
    • Honeywell Inc.
    • Johnson, Ralph H.
    • H01L29/861H01L33/00H01S5/183
    • H01S5/18341H01L33/105H01L33/145H01L33/465H01S5/18308H01S5/18311H01S5/1833H01S5/18369H01S5/2063H01S5/3054H01S5/3086H01S2301/173
    • A light emitting device having a first mirror (58), an active layer (64), a second mirror (68) and a beryllium implantation (82) resulting in a peripheral boundary of a waveguide (86) through the first and second mirrors (58, 68) the active layer (64) and the trapping layer (62). A P-N junction is situated within the implantation and the guide. The turn of the voltage is lower for the junction within the waveguide than that within ght implantation, resulting in confinement of current within the guide at a voltage applied to the device that is greater than the lower junction voltage and less than the higher junction voltage. The device also has an electron trapping layer (62) between said first mirror (58) and said active layer (64), and a conduction layer (72) situated on the second mirror (68).
    • 一种具有第一反射镜(58),有源层(64),第二反射镜(68)和铍注入(82)的发光器件,其产生通过第一和第二反射镜(86)的波导(86)的外围边界 58,68)有源层(64)和俘获层(62)。 P-N结位于植入和导引器内。 对于波导内的接合点,电压的转变比在ght注入内的接合低,导致在施加到器件的电压大于下结电压且小于上结电压的情况下,导管内的电流被限制。 该器件还具有在所述第一反射镜(58)和所述有源层(64)之间的电子俘获层(62)以及位于第二反射镜(68)上的导电层(72)。