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    • 1. 发明公开
    • Position sensitive photomultiplier
    • 位置敏感的光电倍增管
    • EP0698911A3
    • 1996-03-13
    • EP95305888.0
    • 1995-08-23
    • HAMAMATSU PHOTONICS K.K.
    • Kyushima, Hiroyuki, c/o Hamamatsu Photonics K.K.Kawano, Eiichiro, c/o Hamamatsu Photonics K.K.Mizuide, Masuya, c/o Hamamatsu Photonics K.K.Yokota, Hiroto, c/o Hamamatsu Photonics K.K.
    • H01J43/12H01J43/04
    • H01J43/12H01J43/045
    • This invention relates to a photomultiplier for detecting the incident position of a plane of incidence, where a weak light beam is reached and to a photomultiplier having a structure for minimizing crosstalk near the incident position of the weak light beam to improve the precision of the position resolving power. Particularly, the anode of this photomultiplier, which extracts the incident position of the incident weak light as an electrical signal, is constituted by a first anode component for detecting the incident position of the incident plane in the X direction and a second anode component for detecting the incident position of the incident plane in the Y direction. The first and second anode components have flat surfaces. These flat surfaces cause the first and second anode components to capture secondary electrons emitted from a dynode in correspondence with the incident position of the weak light beam, at a position closer to the emission position. The photomultiplier detects the incident position of the weak light beam at a higher resolving power while minimizing the crosstalk.
    • 本发明涉及一种用于检测到达弱光束的入射平面的入射位置的光电倍增器和一种具有用于使弱光束的入射位置附近的串扰最小化的结构的光电倍增器,以提高位置的精确度 解决权力。 特别是,将入射的弱光的入射位置作为电信号提取出来的该光电倍增管的阳极由用于检测入射面在X方向上的入射位置的第一阳极部件和用于检测入射面的第二阳极部件 入射平面在Y方向上的入射位置。 第一和第二阳极部件具有平坦的表面。 这些平坦表面使得第一和第二阳极组件在与较弱光束的入射位置相对应的位置处在较接近发射位置的位置处捕获从倍增极发射的二次电子。 光电倍增管以较高的分辨率检测弱光束的入射位置,同时最小化串扰。
    • 2. 发明公开
    • Position sensitive photomultiplier
    • Positionempfindlicher Photovervielfacher
    • EP0698911A2
    • 1996-02-28
    • EP95305888.0
    • 1995-08-23
    • HAMAMATSU PHOTONICS K.K.
    • Kyushima, Hiroyuki, c/o Hamamatsu Photonics K.K.Kawano, Eiichiro, c/o Hamamatsu Photonics K.K.Mizuide, Masuya, c/o Hamamatsu Photonics K.K.Yokota, Hiroto, c/o Hamamatsu Photonics K.K.
    • H01J43/12H01J43/04
    • H01J43/12H01J43/045
    • This invention relates to a photomultiplier for detecting the incident position of a plane of incidence, where a weak light beam is reached and to a photomultiplier having a structure for minimizing crosstalk near the incident position of the weak light beam to improve the precision of the position resolving power. Particularly, the anode of this photomultiplier, which extracts the incident position of the incident weak light as an electrical signal, is constituted by a first anode component for detecting the incident position of the incident plane in the X direction and a second anode component for detecting the incident position of the incident plane in the Y direction. The first and second anode components have flat surfaces. These flat surfaces cause the first and second anode components to capture secondary electrons emitted from a dynode in correspondence with the incident position of the weak light beam, at a position closer to the emission position. The photomultiplier detects the incident position of the weak light beam at a higher resolving power while minimizing the crosstalk.
    • 本发明涉及一种光电倍增器,用于检测到达弱光束的入射入射位置和具有使弱光束入射位置附近的串扰最小化的结构的光电倍增管,以提高位置精度 分辨力 特别地,提取入射的弱光的入射位置作为电信号的该光电倍增管的阳极由用于检测入射面在X方向的入射位置的第一阳极部件和用于检测入射面的第二阳极部件 入射飞机在Y方向的入射位置。 第一和第二阳极部件具有平坦表面。 这些平坦表面使得第一和第二阳极部件在更靠近发射位置的位置处捕获与从多个极化发射的二次电子对应于弱光束的入射位置。 光电倍增器以更高的分辨能力检测弱光束的入射位置,同时最小化串扰。