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61. 发明公开

EP1333498A3 Solid state image sensor array for correcting curvilinear distortion of a camera lens system and method for fabricating the image sensor array 有权
标题翻译：图像传感器阵列用于校正照相机透镜系统的曲线失真及其制造方法
公开(公告)号：EP1333498A3
公开(公告)日：2005-05-04
申请号：EP02021760.0
申请日：2002-09-25
申请人： Agilent Technologies Inc. (a Delaware Corporation)
发明人： Gordon, Gary B.
IPC分类号： H01L27/146 , H01L27/148
CPC分类号： H01L27/14601 , H01L27/14806 , H04N5/3572 , H04N5/3696
摘要： A solid state image sensor array (300; 500; 900) for correcting curvilinear distortion and method for fabricating the image sensor array utilizes straight line segments (606, 608) that approximate the curvature of the curvilinear distortion to define structures of the image sensor array. The use of these straight line segments results in photosensitive elements (302; 502; 902A, 902B, 902C, 902D) that are distributed in a non-uniform pattem to compensate for the curvilinear distortion, which may be barrel or pincushion distortion. In addition, the use of straight line segments increases the efficiency of the photosensitive elements by maximizing the surface area of the photosensitive elements. Furthermore, since the structures of the image sensor array are defined by the straight line segments, the design of the image sensor array is suitable for conventional high volume fabrication process.

62. 发明授权

EP1006585B1 Color detection active pixel sensors 有权
标题翻译：用于颜色检测的有源像素传感器
公开(公告)号：EP1006585B1
公开(公告)日：2005-05-04
申请号：EP99309267.5
申请日：1999-11-22
申请人： Agilent Technologies Inc. a Delaware Corporation
发明人： Cao, Min , Vande Voorde, Paul J. , Perner, Frederick A. , Vook, Dietrich W.
IPC分类号： H01L27/146 , H01L31/09 , H01L31/11
CPC分类号： H01L27/14609 , H01L27/14647

63. 发明授权

EP1304543B1 Positioning with conductive indicia ( silicon optical bench ) 有权
标题翻译：有导电标记（硅光具座）定位
公开(公告)号：EP1304543B1
公开(公告)日：2005-04-06
申请号：EP01308967.7
申请日：2001-10-22
申请人： Agilent Technologies, Inc. (a Delaware corporation)
发明人： Zucchelli, Libero , Gastaldi, Luigi
IPC分类号： G01B7/004 , G02B6/42 , H01L21/66
CPC分类号： H01L22/34 , G02B6/422 , H05K1/0268 , H05K3/303 , H05K2201/09781 , H05K2203/166 , Y02P70/613 , Y10T29/49126

64. 发明授权

EP1262811B1 Total internal reflection optical switch utilizing a moving droplet 有权
标题翻译：全内反射光学开关利用移动液滴
公开(公告)号：EP1262811B1
公开(公告)日：2005-03-23
申请号：EP02002173.9
申请日：2002-01-29
申请人： Agilent Technologies, Inc. (a Delaware corporation)
发明人： Hu, Gongjian , Robrish, Peter
IPC分类号： G02B26/02 , G02F1/00
CPC分类号： G02B6/3538 , G02B6/3544 , G02B6/357 , G02B6/3576 , G02B6/3596 , G02B26/004

65. 发明公开

EP1512978A2 Loaded-board, guided-probe test fixture 失效
公开(公告)号：EP1512978A2
公开(公告)日：2005-03-09
申请号：EP04027669.3
申请日：1997-07-29
申请人： Agilent Technologies Inc. (a Delaware Corporation)
发明人： Sayre, Tracy, L. , Slutz, Robert, A. , Kanack, Kris, J.
IPC分类号： G01R1/04 , G01R1/073
CPC分类号： G01R1/07378 , G01R1/07328 , G01R1/07357 , G01R1/07371
摘要： A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates (516) and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited -access, no-clean test targets (520). The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates (524), personality pins (528) and an alignment plate (534) in order to couple test targets (520) with multiplexed tester resources (500). The guided-probe test fixture of the present invention may also utilize a universal interface plate (852) with double-headed spring probes (854) and/or a wireless interface printed circuit board (502) to facilitate the electrical coupling of test targets (520) to tester resources (500). Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board (518) containing both standard-access and limited-access, no-clean test targets (520). The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets (520), while at the same time capable of probing standard-access test targets (520).

66. 发明授权

EP1333292B1 Displaying a number of measurement curves 无效
标题翻译：显示数的测量特性
公开(公告)号：EP1333292B1
公开(公告)日：2005-03-02
申请号：EP02015811.9
申请日：2002-07-16
申请人： Agilent Technologies Inc. a Delaware Corporation
发明人： Goericke, Michael
IPC分类号： G01R19/25 , G01R13/28
CPC分类号： G01R13/28 , G01R19/2516

67. 发明授权

EP1329752B1 Tip for optical waveguide 有权
标题翻译：端件的光波导
公开(公告)号：EP1329752B1
公开(公告)日：2005-02-23
申请号：EP02024088.3
申请日：2002-10-29
申请人： Agilent Technologies Inc. a Delaware Corporation
发明人： Thoma, Peter , Mueller, Emmerich
IPC分类号： G02B6/30
CPC分类号： G02B6/241 , G02B6/262 , G02B6/30 , G02B6/3604 , G02B6/4203 , G02B6/4207 , G02B6/4212 , G02B6/4225

68. 发明公开

EP1507406A1 Image sensor with active reset and randomly addressable pixels 有权
标题翻译： Bildsensor mit aktiverRücksetzungund wahlfreien Pixeln
公开(公告)号：EP1507406A1
公开(公告)日：2005-02-16
申请号：EP04005865.3
申请日：2004-03-11
申请人： Agilent Technologies Inc. (a Delaware Corporation)
发明人： Fowler, Boyd, Dr.
IPC分类号： H04N5/217 , H04N3/15 , H04N5/335
CPC分类号： H04N5/363 , H04N5/23241 , H04N5/3745
摘要： An imaging array having one or more columns of pixels is disclosed. Each pixel includes a photodiode including first and second terminals, a local reset circuit for connecting the first terminal to a column reset line; and a buffer circuit for selectively connecting the first terminal to a column bit line in response to a word select signal. Each column also includes a column reset circuit having an operational amplifier and a low-pass filter. The operational amplifier has a first input connected to the column bit line for that column and a second input connected to a reset signal generator that generates a reset signal during a reset cycle. The output of the operational amplifier is connected to the column reset line during the reset cycle. In one embodiment, the gain of the operational amplifier and the passband of the low-pass filter are varied during the reset cycle.
摘要翻译：公开了具有一个或多个像素列的成像阵列。每个像素包括包括第一和第二端子的光电二极管，用于将第一端子连接到列复位线的本地复位电路; 以及缓冲电路，用于响应于字选择信号选择性地将第一端连接到列位线。每列还包括具有运算放大器和低通滤波器的列复位电路。运算放大器具有连接到该列的列位线的第一输入端和连接到在复位周期期间产生复位信号的复位信号发生器的第二输入。在复位周期中，运算放大器的输出端连接到列复位线。在一个实施例中，运算放大器的增益和低通滤波器的通带在复位周期期间变化。

69. 发明授权

EP1100234B1 ATM service disruption measurement 有权
标题翻译： ATM服务中断测量
公开(公告)号：EP1100234B1
公开(公告)日：2005-02-09
申请号：EP00309671.6
申请日：2000-11-01
申请人： Agilent Technologies, Inc. (a Delaware corporation)
发明人： Carder, Norman , Johnstone, Colin
IPC分类号： H04L12/56
CPC分类号： H04Q11/0478 , H04L2012/5627 , H04L2012/5628

70. 发明授权

EP1098291B1 Method and system for compensating for defects in a multi-light valve display system 有权
标题翻译：一种用于在光阀彩色显示装置补偿误差的方法和装置
公开(公告)号：EP1098291B1
公开(公告)日：2005-02-09
申请号：EP00123555.5
申请日：2000-10-27
申请人： Agilent Technologies, Inc. (a Delaware corporation)
发明人： Walker, Richard C.
IPC分类号： G09G3/34
CPC分类号： G09G3/3413 , G09G3/34 , G09G2310/0235 , G09G2330/08 , G09G2330/10

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