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1. 发明公开

EP1512978A2 Loaded-board, guided-probe test fixture 失效
公开(公告)号：EP1512978A2
公开(公告)日：2005-03-09
申请号：EP04027669.3
申请日：1997-07-29
申请人： Agilent Technologies Inc. (a Delaware Corporation)
发明人： Sayre, Tracy, L. , Slutz, Robert, A. , Kanack, Kris, J.
IPC分类号： G01R1/04 , G01R1/073
CPC分类号： G01R1/07378 , G01R1/07328 , G01R1/07357 , G01R1/07371
摘要： A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates (516) and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited -access, no-clean test targets (520). The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates (524), personality pins (528) and an alignment plate (534) in order to couple test targets (520) with multiplexed tester resources (500). The guided-probe test fixture of the present invention may also utilize a universal interface plate (852) with double-headed spring probes (854) and/or a wireless interface printed circuit board (502) to facilitate the electrical coupling of test targets (520) to tester resources (500). Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board (518) containing both standard-access and limited-access, no-clean test targets (520). The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets (520), while at the same time capable of probing standard-access test targets (520).

2. 发明公开

EP1512980A3 Loaded-board, guided-probe test fixture 失效
公开(公告)号：EP1512980A3
公开(公告)日：2005-06-15
申请号：EP04027687.5
申请日：1997-07-29
申请人： Agilent Technologies Inc. (a Delaware Corporation)
发明人： Sayre, Tracy, L. , Slutz, Robert, A. , Kanack, Kris, J.
IPC分类号： G01R1/04 , G01R1/073
CPC分类号： G01R1/07378 , G01R1/07328 , G01R1/07357 , G01R1/07371
摘要： A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates (516) and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited -access, no-clean test targets (520). The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates (524), personality pins (528) and an alignment plate (534) in order to couple test targets (520) with multiplexed tester resources (500). The guided-probe test fixture of the present invention may also utilize a universal interface plate (852) with double-headed spring probes (854) and/or a wireless interface printed circuit board (502) to facilitate the electrical coupling of test targets (520) to tester resources (500). Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board (518) containing both standard-access and limited-access, no-clean test targets (520). The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets (520), while at the same time capable of probing standard-access test targets (520).

3. 发明公开

EP1512980A2 Loaded-board, guided-probe test fixture 失效
标题翻译：装载板，引导探头测试夹具
公开(公告)号：EP1512980A2
公开(公告)日：2005-03-09
申请号：EP04027687.5
申请日：1997-07-29
申请人： Agilent Technologies Inc. (a Delaware Corporation)
发明人： Sayre, Tracy, L. , Slutz, Robert, A. , Kanack, Kris, J.
IPC分类号： G01R1/04 , G01R1/073
CPC分类号： G01R1/07378 , G01R1/07328 , G01R1/07357 , G01R1/07371
摘要： A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates (516) and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited -access, no-clean test targets (520). The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates (524), personality pins (528) and an alignment plate (534) in order to couple test targets (520) with multiplexed tester resources (500). The guided-probe test fixture of the present invention may also utilize a universal interface plate (852) with double-headed spring probes (854) and/or a wireless interface printed circuit board (502) to facilitate the electrical coupling of test targets (520) to tester resources (500). Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board (518) containing both standard-access and limited-access, no-clean test targets (520). The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets (520), while at the same time capable of probing standard-access test targets (520).
摘要翻译：公开了一种引导探针测试夹具，用于将具有电子组件的电路卡连接到板测试系统。测试夹具利用长的，倾斜的或垂直的测试探针，导板（516）和有限的探针头行程，以实现高精度，细间距探测有限接触，免清洗测试目标（520）。本发明的引导探针测试夹具还利用弹簧探针，探针安装板（524），个性针（528）和对齐板（534）以便将测试目标（520）与多路复用测试器资源（500 ）。本发明的引导探针测试夹具还可以利用具有双头弹簧探针（854）和/或无线接口印刷电路板（502）的通用接口板（852）以促进测试目标（ 520）到测试器资源（500）。因此，本发明的引导探针测试夹具能够对包含标准访问和限制访问，免清洗测试目标（520）的装载印刷电路板（518）进行复杂的电路内和功能测试，。本发明还能够提高探测精度，改善免清洁可测试性并改进有限访问测试目标（520）的精细探测，同时能够探测标准访问测试目标（520）。

4. 发明公开

EP1512977A3 Loaded-board, guided-probe test fixture 失效
公开(公告)号：EP1512977A3
公开(公告)日：2005-06-15
申请号：EP04027668.5
申请日：1997-07-29
申请人： Agilent Technologies Inc. (a Delaware Corporation)
发明人： Sayre, Tracy, L. Agilent Technologies, Inc. , Slutz, Robert, A. , Kanack, Kris, J.
IPC分类号： G01R1/073 , G01R1/04
CPC分类号： G01R1/07378 , G01R1/07328 , G01R1/07357 , G01R1/07371
摘要： A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates (516) and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited -access, no-clean test targets (520). The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates (524), personality pins (528) and an alignment plate (534) in order to couple test targets (520) with multiplexed tester resources (500). The guided-probe test fixture of the present invention may also utilize a universal interface plate (852) with double-headed spring probes (854) and/or a wireless interface printed circuit board (502) to facilitate the electrical coupling of test targets (520) to tester resources (500). Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board (518) containing both standard-access and limited-access, no-clean test targets (520). The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets (520), while at the same time capable of probing standard-access test targets (520).

5. 发明公开

EP1512979A2 Loaded-board, guided-probe test fixture 失效
公开(公告)号：EP1512979A2
公开(公告)日：2005-03-09
申请号：EP04027686.7
申请日：1997-07-29
申请人： Agilent Technologies Inc. (a Delaware Corporation)
发明人： Sayre, Tracy, L. , Slutz, Robert, A. , Kanack, Kris, J.
IPC分类号： G01R1/04 , G01R1/073
CPC分类号： G01R1/07378 , G01R1/07328 , G01R1/07357 , G01R1/07371
摘要： A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates (516) and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited -access, no-clean test targets (520). The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates (524), personality pins (528) and an alignment plate (534) in order to couple test targets (520) with multiplexed tester resources (500). The guided-probe test fixture of the present invention may also utilize a universal interface plate (852) with double-headed spring probes (854) and/or a wireless interface printed circuit board (502) to facilitate the electrical coupling of test targets (520) to tester resources (500). Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board (518) containing both standard-access and limited-access, no-clean test targets (520). The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets (520), while at the same time capable of probing standard-access test targets (520).

6. 发明公开

EP1512979A3 Loaded-board, guided-probe test fixture 失效
公开(公告)号：EP1512979A3
公开(公告)日：2005-06-15
申请号：EP04027686.7
申请日：1997-07-29
申请人： Agilent Technologies Inc. (a Delaware Corporation)
发明人： Sayre, Tracy, L. , Slutz, Robert, A. , Kanack, Kris, J.
IPC分类号： G01R1/073 , G01R1/04
CPC分类号： G01R1/07378 , G01R1/07328 , G01R1/07357 , G01R1/07371
摘要： A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates (516) and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited -access, no-clean test targets (520). The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates (524), personality pins (528) and an alignment plate (534) in order to couple test targets (520) with multiplexed tester resources (500). The guided-probe test fixture of the present invention may also utilize a universal interface plate (852) with double-headed spring probes (854) and/or a wireless interface printed circuit board (502) to facilitate the electrical coupling of test targets (520) to tester resources (500). Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board (518) containing both standard-access and limited-access, no-clean test targets (520). The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets (520), while at the same time capable of probing standard-access test targets (520).

7. 发明公开

EP1512978A3 Loaded-board, guided-probe test fixture 失效
标题翻译：与针导向件的测试适配器的印刷电路板
公开(公告)号：EP1512978A3
公开(公告)日：2005-06-15
申请号：EP04027669.3
申请日：1997-07-29
申请人： Agilent Technologies Inc. (a Delaware Corporation)
发明人： Sayre, Tracy, L. c/o Agilent Technologies, Inc. , Slutz, Robert, A. , Kanack, Kris, J.
IPC分类号： G01R1/073 , G01R1/04
CPC分类号： G01R1/07378 , G01R1/07328 , G01R1/07357 , G01R1/07371
摘要： A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates (516) and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited -access, no-clean test targets (520). The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates (524), personality pins (528) and an alignment plate (534) in order to couple test targets (520) with multiplexed tester resources (500). The guided-probe test fixture of the present invention may also utilize a universal interface plate (852) with double-headed spring probes (854) and/or a wireless interface printed circuit board (502) to facilitate the electrical coupling of test targets (520) to tester resources (500). Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board (518) containing both standard-access and limited-access, no-clean test targets (520). The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets (520), while at the same time capable of probing standard-access test targets (520).

8. 发明公开

EP1512977A2 Loaded-board, guided-probe test fixture 失效
标题翻译： PrüfadaptermitNadelführungfürbestückteLeiterplatten
公开(公告)号：EP1512977A2
公开(公告)日：2005-03-09
申请号：EP04027668.5
申请日：1997-07-29
申请人： Agilent Technologies Inc. (a Delaware Corporation)
发明人： Sayre, Tracy, L. , Slutz, Robert, A. , Kanack, Kris, J.
IPC分类号： G01R1/04 , G01R1/073
CPC分类号： G01R1/07378 , G01R1/07328 , G01R1/07357 , G01R1/07371
摘要： A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates (516) and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited -access, no-clean test targets (520). The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates (524), personality pins (528) and an alignment plate (534) in order to couple test targets (520) with multiplexed tester resources (500). The guided-probe test fixture of the present invention may also utilize a universal interface plate (852) with double-headed spring probes (854) and/or a wireless interface printed circuit board (502) to facilitate the electrical coupling of test targets (520) to tester resources (500). Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board (518) containing both standard-access and limited-access, no-clean test targets (520). The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets (520), while at the same time capable of probing standard-access test targets (520).
摘要翻译：公开了一种用于将具有电子部件的电路卡连接到电路板测试系统的导向探针测试夹具。测试夹具利用长的，倾斜的或垂直的测试探针，导向板（516）和有限的探针尖端行程，以便实现有限的，无干净的测试目标（520）的高精度，细间距探测。本发明的导向探针测试夹具还使用弹簧探针，探针安装板（524），个性销（528）和对准板（534），以便将测试目标（520）与多路测试器资源（500 ）。本发明的导向探针测试夹具还可以利用具有双头弹簧探针（854）和/或无线接口印刷电路板（502）的通用接口板（852），以便于测试目标（ 520）到测试者资源（500）。因此，本发明的导向探针测试夹具能够对装有印刷电路板（518）进行复杂的在线和功能测试，所述加载印刷电路板包含标准访问和有限访问的免清洗测试目标（520）。本发明还能够提高探测精度，改进的无干净可测试性和改进有限接入测试目标（520）的精细间距探测，同时能够探测标准接入测试目标（520）。

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