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    • 58. 发明公开
    • Electronic device and manufacturing method thereof
    • ElektronischesGerätundzugehörigesHerstellungsverfahren
    • EP1209476A1
    • 2002-05-29
    • EP01307985.0
    • 2001-09-19
    • Seiko Instruments Inc.
    • Kato, Kazuo
    • G01R31/02G01R31/28
    • G01R31/2829G01R31/046
    • To precisely determine easily a disconnection failure in bonding connection of a flip coil of a magnetic sensor. A wiring pattern (Pb2) for connecting a +FL terminal (10a) of an X-axis sensor (10) and a wiring pattern (Pb1) for connecting a +FL terminal (20a) of a Y-axis sensor (20) are arranged on a circuit wiring board. The -FL terminals (10b,20b) of the sensors (10,20) are connected by a wiring pattern (Pb3) on the circuit wiring board. After MOS transistors (Pch MOS Tr 80,Nch MOS Tr 90) are mounted on the board, the wiring patterns (Pb1 and Pb2) are connected to each other by wiring in the MOS transistors. The MOS transistors are mounted on the circuit wiring board so that a flip coil of the X-axis sensor and a flip coil of the Y-axis sensor are connected in parallel with each other. Before the MOS transistors are mounted on the circuit wiring board, the resistance of each of the flip coils is measured. The disconnection failure in bonding connection of the flip coils can be inspected by using the fact that the difference between a measured value in a case of good bonding connection and that in a case of bad bonding connection is large.
    • 为了精确地确定磁传感器的翻转线圈的接合连接中的断开故障。 用于连接X轴传感器(10)的+ FL端子(10a)和用于连接Y轴传感器(20)的+ FL端子(20a)的布线图案(Pb1)的布线图案(Pb2) 布置在电路布线板上。 传感器(10,20)的-FL端子(10b,20b)通过电路布线板上的布线图案(Pb3)连接。 在MOS晶体管(Pch MOS Tr 80,Nch MOS Tr 90)安装在电路板上之后,布线图案(Pb1和Pb2)通过MOS晶体管中的布线彼此连接。 MOS晶体管安装在电路布线板上,使得X轴传感器的翻转线圈和Y轴传感器的翻转线圈彼此并联连接。 在MOS晶体管安装在电路布线板上之前,测量每个翻转线圈的电阻。 可以通过使用在良好的接合连接的情况下的测量值与不良接合连接的情况下的差异大的事实来检查翻转线圈的接合连接中的断开故障。
    • 60. 发明公开
    • Method and apparatus for fault detection in a resistive bridge sensor
    • 维尔法赫恩·弗里谢里恩·祖尔·费勒雷肯
    • EP1191343A2
    • 2002-03-27
    • EP01307987.6
    • 2001-09-19
    • Texas Instruments Incorporated
    • Maher, Thomas R.Corkum, David L.
    • G01R31/28
    • G01R17/10G01R31/2829
    • A full Wheatstone bridge sensor has conditioning electronics of an ASIC connected thereto. Two independently controlled diagnostic switches (S1, S2) in the ASIC are commonly connected to one of the bridge output nodes. The first diagnostic switch connects first resistor between the bridge output node and bridge supply voltage and the second diagnostic switch connects a second resistor between the bridge output and bridge ground. The first diagnostic switch closes during a first diagnostic waveform phase and opens during all other phases of operation. The second diagnostic switch closes during a second and third waveform phase and opens during all other phases of operation. The diagnostic waveforms are used to test major signal conditioning and fault reporting paths of the ASIC.
    • 一个完整的惠斯通电桥传感器具有连接到其上的ASIC的调节电路。 ASIC中的两个独立控制的诊断开关(S1,S2)通常连接到桥接输出节点之一。 第一个诊断开关将桥接输出节点和桥接电源电压之间的第一个电阻连接起来,第二个诊断开关连接桥接输出和桥接地之间的第二个电阻。 第一个诊断开关在第一个诊断波形阶段关闭,并在所有其他操作阶段打开。 第二个诊断开关在第二个和第三个波形阶段关闭,并在所有其他操作阶段打开。 诊断波形用于测试ASIC的主要信号调理和故障报告路径。