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    • 54. 发明公开
    • ELECTRICAL CONTACT MATERIAL
    • ELEKTRISCHES KONTAKTMATERIAL
    • EP2413337A1
    • 2012-02-01
    • EP10755584.9
    • 2010-03-03
    • A.L.M.T. Corp.
    • HATAKEYAMA, TakashiUENISHI, NoboruSUZUKI, YasuhikoGOMA, Norihito
    • H01H1/023C22C1/05C22C1/10C22C5/06C22C32/00
    • H01H1/023C22C1/05C22C1/10C22C5/06H01H1/0233H01H1/027
    • Provided are an electrical contact material capable of reducing wear-out rates after breaking tests in an overload test and a short-circuit test of a breaker or the like; and an electrical contact material capable of preventing welding after breaking tests in a short-circuit test of a breaker or the like. The electrical contact material (31) according to one aspect includes 4% by mass or more and 7% by mass or less of graphite, the remainder is composed of silver and an unavoidable impurity, a deflection thereof is greater than or equal to 0.5 mm, a Vickers hardness thereof is greater than or equal to 55, and an oxygen content therein is less than or equal to 100 ppm. It is preferable that the electrical contact material (31) further includes a tungsten carbide. It is preferable that an average particle diameter of the tungsten carbide is greater than or equal to 40 nm and less than or equal to 3 µm and a content of the tungsten carbide is greater than or equal to 2% by mass and less than or equal to 4% by mass. The electrical contact material (31) according to another aspect includes 0.5% by mass or more and 2% by mass or less of graphite, the remainder is composed of silver and an unavoidable impurity, a deflection thereof is greater than or equal to 0.8 mm, a Vickers hardness thereof is greater than or equal to 40, and an oxygen content therein is less than or equal to 100 ppm.
    • 提供了能够在过载测试中断裂测试和断路器等的短路测试之后降低磨损率的电接触材料; 以及能够防止断路器等的短路试验中的断裂试验后的焊接的电接触材料。 根据一个方面的电接触材料(31)包括4质量%以上且7质量%以下的石墨,余量由银和不可避免的杂质构成,其偏转量大于或等于0.5mm 维氏硬度大于或等于55,其中的氧含量小于或等于100ppm。 优选的是,电接触材料(31)还包括碳化钨。 碳化钨的平均粒径优选为40nm以上且3μm以下,碳化钨的含量优选为2质量%以下且小于等于 至4质量%。 根据另一方面的电接触材料(31)包括0.5质量%以上且2质量%以下的石墨,其余为银和不可避免的杂质,其偏转量大于或等于0.8mm 维氏硬度大于或等于40,其中的氧含量小于或等于100ppm。
    • 58. 发明公开
    • Heat spreader and semiconductor device using the same
    • Wärmeverteilerund Halbleitervorrichtung damit
    • EP1939993A2
    • 2008-07-02
    • EP07255042.9
    • 2007-12-24
    • A.L.M.T. CORP.
    • Takashima, Kouichi
    • H01S5/00
    • H01S5/02492H01L23/36H01L2924/0002H01S5/0224H01S5/02272H01S5/02276H01S5/02469H01L2924/00
    • The present invention provides a heat spreader 1 which includes a substrate 7 composed of a metal-containing material and in which a second-component connection surface 6 of the substrate 7 is provided with wettability with a solder and a solder block layer 14 is formed in at least one of respective regions, adjacent to each other, of the second-component connection surface 6 and a side surface 13. When a semiconductor device 4 is manufactured by connecting a semiconductor laser 2 to the element connection surface 5 through an element connecting layer 8, and then connecting a heat sink 3 to the second-component connection surface 6 through a second-component connecting layer 9 having a melting point lower than that of the element connecting layer 8, the semiconductor block layer 14 can inhibit the melted solder from creeping up along the side surface 13, which can prevent defects that the solder that has crept up short-circuits the semiconductor laser 2 and blocks a luminous flux of laser light emitted from an emission surface 12 of the semiconductor laser 2.
    • 本发明提供一种散热器1,其包括由含金属材料构成的基板7,并且其中基板7的第二部件连接表面6与焊料具有润湿性,并且在其中形成焊料阻挡层14 第二部件连接表面6和侧表面13彼此相邻的相应区域中的至少一个。当通过元件连接层将半导体激光器2连接到元件连接表面5来制造半导体器件4时 8,然后通过熔点低于元件连接层8的熔点的第二部件连接层9将散热器3连接到第二部件连接表面6,半导体阻挡层14可以抑制熔化的焊料从 沿着侧表面13爬行,这可以防止已经起伏的焊料短路半导体激光器2的缺陷并阻挡1a的光通量 从半导体激光器2的发射表面12发射的光。