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    • 1. 发明授权
    • Low cost detection technique
    • 低成本检测技术
    • US06768294B1
    • 2004-07-27
    • US09786873
    • 2001-03-12
    • Mark MoldavskyBoris Zhevrlev
    • Mark MoldavskyBoris Zhevrlev
    • G01R2302
    • G01D5/248
    • This invention discloses circuitry for signal measurement including a signal input, a microprocessor, and an oscillator, the oscillator being operable to generate a pulse signal, the frequency of which is a function of amplitude of a first signal received at the signal input, and to supply the pulse signal to the microprocessor, and the microprocessor being operable to measure the frequency of the pulse signal by comparing the pulse signal with a timing signal, thereby providing an indication of the amplitude of the first signal.
    • 本发明公开了一种用于信号测量的电路,包括信号输入,微处理器和振荡器,该振荡器可操作以产生脉冲信号,其频率是在信号输入端接收的第一信号的振幅, 将脉冲信号提供给微处理器,并且微处理器可操作以通过将脉冲信号与定时信号进行比较来测量脉冲信号的频率,从而提供第一信号幅度的指示。
    • 5. 发明授权
    • Device for testing dynamic characteristics of components using serial transmissions
    • 使用串行传输测试组件的动态特性的设备
    • US06476615B1
    • 2002-11-05
    • US09258476
    • 1999-02-26
    • Roland MarbotPascal CouteauxReza Nezamzadeh
    • Roland MarbotPascal CouteauxReza Nezamzadeh
    • G01R2302
    • G01R31/30
    • A testing device for testing dynamic characteristics of an electronic circuit using serial transmissions. The circuit includes a multiplexing device and a demultiplexing device for implementing a serial link in the component or circuit. The testing device includes a transmitter for transmitting binary signals to the multiplexing device, a receiver for receiving binary signals from the demultiplexing device, and a link for selectively providing a coupling between the transmitter and the receiver. Additionally, a clock generator delivers a first clock signal to the transmitter and a second clock signal, which has a different frequency than the first clock signal, to the receiver. In one preferred embodiment, the clock generator includes a single programmable-frequency oscillator and a variable delay circuit. The programmable-frequency oscillator delivers the first clock signal and the variable delay circuit delays the first clock signal to deliver the second clock signal. The testing device can be used with circuits operating at frequencies in the range of 100 MHz. A method of testing dynamic characteristics of an electronic circuit using a testing device is also provided.
    • 一种用于测试使用串行传输的电子电路的动态特性的测试装置。 该电路包括多路复用装置和用于在组件或电路中实现串行链路的解复用装置。 测试装置包括用于将二进制信号发送到多路复用装置的发射机,用于从解复用装置接收二进制信号的接收机以及用于选择性地提供发射机和接收机之间的耦合的链路。 此外,时钟发生器向发射机提供第一时钟信号,并向接收机提供具有与第一时钟信号不同的频率的第二时钟信号。 在一个优选实施例中,时钟发生器包括单个可编程频率振荡器和可变延迟电路。 可编程频率振荡器提供第一时钟信号,并且可变延迟电路延迟第一时钟信号以递送第二时钟信号。 测试装置可以与在100 MHz范围内工作的电路一起使用。 还提供了使用测试装置测试电子电路的动态特性的方法。
    • 6. 发明授权
    • AlGaInP-based high-output red semiconductor laser device
    • 基于AlGaInP的高输出红色半导体激光器件
    • US06778575B2
    • 2004-08-17
    • US10100920
    • 2002-03-20
    • Ryoji HiroyamaDaijiro InoueYasuhiko NomuraKunio Takeuchi
    • Ryoji HiroyamaDaijiro InoueYasuhiko NomuraKunio Takeuchi
    • G01R2302
    • B82Y20/00H01S5/0218H01S5/162H01S5/34326H01S2301/18
    • A semiconductor laser device having a real refractive index guided structure capable of obtaining a high kink light output and a high maximum light output also when a vertical beam divergence angle is at a small level of at least 12.5° and not more than 20.0° is provided. This semiconductor laser device comprises an n-type cladding layer of AlGaInP formed on an n-type GaAs substrate, an active layer having an AlGaInP layer formed on the n-type cladding layer, a p-type cladding layer of AlGaInP formed on the active layer and a light confinement layer formed to partially cover the p-type cladding layer, and a vertical beam divergence angle is at least 12.5° and not more than 20.0°. Thus, a higher kink light output and a higher maximum light output can be obtained as compared with a conventional semiconductor laser device having a vertical beam divergence angle exceeding 20.0°.
    • 提供具有实际折射率引导结构的半导体激光器件,当垂直光束发散角处于至少12.5°且不大于20.0°的较小水平时,也可以获得高扭结光输出和高最大光输出 。 该半导体激光器件包括在n型GaAs衬底上形成的AlGaInP的n型包覆层,在n型覆层上形成有AlGaInP层的有源层,形成在活性层上的AlGaInP的p型包覆层 层和形成为部分地覆盖p型包层的光限制层,垂直光束发散角为至少12.5°且不大于20.0°。 因此,与具有超过20.0°的垂直光束发散角的常规半导体激光器件相比,可以获得更高的扭结光输出和更高的最大光输出。
    • 9. 发明授权
    • Signal analysis apparatus having YTO yttrium-iron garnet tuned oscillator
    • 具有YTO钇铁石榴石调谐振荡器的信号分析仪
    • US06504354B1
    • 2003-01-07
    • US09868496
    • 2001-06-18
    • Yuichi Waida
    • Yuichi Waida
    • G01R2302
    • H03B23/00G01R23/173H03B5/1882
    • A sweep controller supplies a current to a YTO(YIG-Yttrium-Iron-Garnet Tuned Oscillator) from a current drive circuit in such a manner that frequencies corresponding to a first range in an oscillation frequency of the YTO designated as a desired frequency range for analysis with one sweep, and a second range designated as a frequency range higher than the first range for the analysis with the next one sweep are oscillated by the YTO. Moreover, the sweep controller outputs an instruction for increasing the current flowing through the YTO from the current drive circuit over a part of a period between an end of the first range and a start of the second range in order to shorten the period between the end of the first range and the start of the second range when it is detected that a difference between an end frequency of the first range and a start frequency of the second range is larger than a predetermined frequency difference.
    • 扫频控制器将来自当前驱动电路的电流提供给YTO(YIG-钇铁铁石榴石调谐振荡器),使得与YTO的振荡频率中的第一范围相对应的频率被指定为期望的频率范围, 通过一次扫描进行分析,并且指定为高于用于下一次扫描的分析的第一范围的频率范围的第二范围由YTO振荡。 此外,扫描控制器输出用于在第一范围的结束和第二范围的开始之间的时间段的一部分周期从当前驱动电路输出用于增加流过YTO的电流的指令,以便缩短端部 当检测到第一范围的结束频率与第二范围的起始频率之间的差异大于预定频率差时,第一范围的开始和第二范围的开始。
    • 10. 发明授权
    • Method for use on a parametric tester to measure the output frequency of a ring oscillator through voltage sampling
    • 用于参数测试仪的方法,通过电压采样来测量环形振荡器的输出频率
    • US06246223B1
    • 2001-06-12
    • US08984886
    • 1997-12-04
    • Shi-Tron Lin
    • Shi-Tron Lin
    • G01R2302
    • G01R23/10G01R31/2824
    • A method is provided for use on a parametric tester that allows the parametric tester to more effectively and precisely measure the output frequency of a periodic pulse signal generating means. The first step is to down convert the output frequency of the periodic pulse signal generating means to about 1 Hz. Then, the frequency-downconverted pulse train is sampled to thereby obtain a series of sampled signals In accordance with the magnitudes of the sampled signals, the sampled signals are registered to be at either a high-level state, an low-level state, or a intermediate-level state. Then, the integration time and the delay time involved in the sampling process are registered. The sampling process is continued until at least two sampled signals at the low-level state are registered. Based on these parameters, a delta transition time for the first intermediate-level state and a second delta transition time for the second intermediate-level state can be obtained. Further, the length of the period from the occurrence of the first intermediate-level state to the occurrence of the second intermediate-level state is computed based on the number of the occurrences of pulse transitions during this period. Based on the foregoing parameters, the frequency of the frequency-downconverted pulse train can be obtained, which then allows the output frequency of the periodic pulse signal generating means to be obtained.
    • 提供了一种在参数测试仪上使用的方法,其允许参数测试器更有效和精确地测量周期性脉冲信号产生装置的输出频率。 第一步是将周期性脉冲信号发生装置的输出频率降低到约1Hz。 然后,对降频转换脉冲串进行采样,从而获得一系列采样信号。根据采样信号的幅度,采样信号被登记为处于高电平状态,低电平状态或 中级国家。 然后,记录采样过程所涉及的积分时间和延迟时间。 采样过程持续到低电平状态的至少两个采样信号被注册。 基于这些参数,可以获得第一中间级状态的增量转换时间和第二中间级状态的第二增量转换时间。 另外,从该第一中间状态的发生到第二中间电平状态的发生的期间的长度是根据该期间的脉冲转移的次数计算的。 基于上述参数,可以获得频率下变频脉冲序列的频率,从而可以获得周期性脉冲信号发生装置的输出频率。