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    • 4. 发明申请
    • MEMORY CELL
    • CELL
    • WO2012136206A3
    • 2012-12-13
    • PCT/DE2012200019
    • 2012-03-29
    • UNIV BERLIN TECHMARENT ANDREASBIMBERG DIETER
    • MARENT ANDREASBIMBERG DIETER
    • H01L29/80B82Y10/00G11C16/04H01L29/788
    • G11C16/0466B82Y10/00G11C16/0408G11C16/14G11C16/26H01L29/788H01L29/803
    • The invention relates to a memory cell (10) comprising at least one binary memory area for storing an item of bit information and to a method for storing an item of bit information. According to the invention, it is provided that the memory area (SB), e.g. a quantum dot layer of In(Ga)As quantum dots, can optionally store holes or electrons and allows a recombination of holes and electrons, the charge carrier type of the charge carriers stored in the memory area defines the bit information of the memory area and a charge carrier injection device (PN) is present, by means of which optionally holes or electrons can be injected into the memory area (SB) and the bit information can thus be changed. The holes and electrons come from a hole reservoir (LR) or electron reservoir (ER) which consist e.g. of p-doped or n-doped GaAs. The readout layer (AS) is a two-dimensional hole or electron gas layer.
    • 本发明涉及一种具有用于存储位信息的至少一个二进制存储区域的存储单元(10),以及用于存储Bitinfomation的方法。 根据本发明,它提供的是,存储器区域(SB),例如。 例如,在量子点层(Ga)的量子点,wahl¬例如可以存储空穴或电子和空穴和电子的重组允许存储在载流子的存储区域中的数据的电荷载流子确定的存储器区域的所述位信息,并提供一个电荷载流子注入装置(PN) 是,与可选的空穴或电子到存储器区域(SB)可以被注入,从而将位可被改变。 空穴和电子从空穴(LR)或电子储存器(ER),其例如源于 由p型或n型掺杂的GaAs构成。 读出层(AS)是一二维空穴或电子气层。
    • 9. 发明授权
    • Memory
    • 记忆
    • US08331142B2
    • 2012-12-11
    • US12970744
    • 2010-12-16
    • Dieter BimbergMartin GellerAndreas MarentTobias Nowozin
    • Dieter BimbergMartin GellerAndreas MarentTobias Nowozin
    • G11C11/34H01L29/68
    • B82Y10/00H01L29/66825H01L29/788H01L29/803
    • An embodiment of the invention relates to a memory comprising a strained double-heterostructure having an inner semiconductor layer which is sandwiched between two outer semiconductor layers, wherein the lattice constant of the inner semiconductor layer differs from the lattice constants of the outer semiconductor layers, the resulting lattice strain in the double-heterostructure inducing the formation of at least one quantum dot inside the inner semiconductor layer, said at least one quantum dot being capable of storing charge carriers therein, and wherein, due to the lattice strain, the at least one quantum dot has an emission barrier of 1.15 eV or higher, and provides an energy state density of at least three energy states per 1000 nm3, all said at least three energy states being located in an energy band of 50 meV or less.
    • 本发明的一个实施例涉及包含应变双异质结构的存储器,其具有夹在两个外半导体层之间的内半导体层,其中内半导体层的晶格常数与外半导体层的晶格常数不同, 所述双异质结构中的晶格应变导致在所述内半导体层内部形成至少一个量子点,所述至少一个量子点能够在其中存储电荷载流子,并且其中由于晶格应变,所述至少一个 量子点具有1.15eV或更高的发射势垒,并且提供每1000nm 3至少三个能量状态的能态状态密度,所有所述至少三个能态位于50meV或更小的能带内。