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1. 发明申请

US20020198617A1 System and method for controlling priority of lots employed in MES 审中-公开
标题翻译：控制在MES中使用的批次的优先权的系统和方法
公开(公告)号：US20020198617A1
公开(公告)日：2002-12-26
申请号：US09983432
申请日：2001-10-24
发明人： Wonin Baek , Heungchul Park , Joodeok Yun , Jonghyun Baek , Joosuck Jung
IPC分类号： G06F019/00
CPC分类号： G06Q10/06 , G05B19/41865 , G05B2219/31372 , G05B2219/32316 , G05B2219/32323 , G05B2219/45031 , Y02P90/12 , Y02P90/20
摘要： The present invention relates to a method for controlling priority of lots employed in a MES, and more particularly, to a method for controlling priority of lots employed in a MES, wherein the priority of the lots provided by the MES can be automatically set up depending on a processing cycle time.
摘要翻译：本发明涉及一种用于控制在MES中使用的批次的优先权的方法，更具体地说，涉及一种用于控制在MES中使用的批次的优先权的方法，其中由MES提供的批次的优先级可以根据处理周期时间。

2. 发明授权

US06411859B1 Flow control in a semiconductor fabrication facility 有权
标题翻译：半导体制造设备中的流量控制
公开(公告)号：US06411859B1
公开(公告)日：2002-06-25
申请号：US09143322
申请日：1998-08-28
申请人： Michael R. Conboy , Patrick J. Ryan , Elfido Coss, Jr.
发明人： Michael R. Conboy , Patrick J. Ryan , Elfido Coss, Jr.
IPC分类号： G06F1900
CPC分类号： H01L21/67276 , G05B19/41865 , G05B2219/32265 , G05B2219/32316 , Y02P90/20
摘要： Techniques for controlling the flow of wafer lots in a semiconductor fabrication facility having multiple storage locations and a fabrication facility employing such techniques are provided. A process and system for controlling the flow of wafer lots within a semiconductor fabrication facility, in accordance with one embodiment of the invention, includes determining a first storage location for a wafer lot, determining, prior to moving the wafer lot, an availability condition of the first storage location based on a condition level of the first storage location and a priority of the wafer lot, and storing the wafer lot in the storage location if the location is available and storing the wafer lot in an alternate location if the storage location is unavailable. The storage location may, for example, be a stocker. In this manner, the invention may, for example, advantageously anticipate or sense bubbles or log jams of wafer lots in a fabrication facility and redirect wafer lots in order to avoid or reduce any bubble effect. This can, for example, significantly increase the throughput of wafers through the fabrication facility.
摘要翻译：提供了用于控制具有多个存储位置的半导体制造设备中的晶片批次的流动的技术以及采用这种技术的制造设备。根据本发明的一个实施例的用于控制半导体制造设备内的晶片批次的流动的工艺和系统包括确定晶片批次的第一存储位置，在移动晶片批之前确定可用状态所述第一存储位置基于所述第一存储位置的状态级别和所述晶片批次的优先级，并且如果所述位置可用则将所述晶片批次存储在所述存储位置中，并且如果所述存储位置是所述存储位置，则将所述晶片批次存储在备用位置不可用存储位置可以例如是储存器。以这种方式，本发明可以例如有利地预期或感测制造设施中的晶片批次的气泡或木材堵塞，并且重定向晶片批次以避免或减少任何气泡效应。例如，这可以显着增加通过制造设备的晶片的生产量。

3. 发明授权

US5493501A Production control system selecting optimum dispatching rule 失效
标题翻译：生产控制系统选择最优调度规则
公开(公告)号：US5493501A
公开(公告)日：1996-02-20
申请号：US286348
申请日：1994-08-05
申请人： Hiroshi Kondo
发明人： Hiroshi Kondo
IPC分类号： B23Q41/08 , B65G61/00 , G05B19/418 , G06F19/00 , G06Q50/00 , G06Q50/04 , H01L21/02 , G06F17/60
CPC分类号： G06Q10/06 , G05B19/41865 , G05B2219/31318 , G05B2219/31379 , G05B2219/32191 , G05B2219/32256 , G05B2219/32263 , G05B2219/32292 , G05B2219/32297 , G05B2219/32301 , G05B2219/32316 , Y02P90/20 , Y02P90/22 , Y02P90/26
摘要： A production control system for electron devices manufactured through many stages including plural apparatuses comprises dispatching rule storing means, a statistical analyzer and a simulator. The dispatching rule storing means stores plural dispatching rules including a first-in first-out rule, three of lot selective rules and dead line rule. The statistical analyzer accumulates status data representing the status off each of apparatuses and lots to be processed for a fixed period of time, and generates a statistical data by statistically processing the status data as accumulated. The simulator simulates the production line to evaluate an efficiency thereof based on the statistical data and each one of the plural dispatching rules. An optimum dispatching rule is selected which provides the optimum efficiency for the production line among the plural dispatching rules.
摘要翻译：通过多个装置制造的电子装置的生产控制系统包括调度规则存储装置，统计分析器和模拟器。调度规则存储装置存储包括先进先出规则，批次选择规则中的三个和死线规则的多个调度规则。统计分析器在一段固定的时间段内积累表示待处理装置和批次的状态的状态数据，并通过统计处理累积的状态数据来生成统计数据。仿真器模拟生产线，以根据统计数据和多个调度规则中的每一个来评估其效率。选择最优调度规则，为多个调度规则中的生产线提供最佳效率。

4. 发明授权

EP0644470B1 Production control system selecting optimum dispatching rule 失效
标题翻译：与最优分配规则的选择生产控制系统
公开(公告)号：EP0644470B1
公开(公告)日：2000-04-05
申请号：EP94112283.0
申请日：1994-08-05
申请人： NEC CORPORATION
发明人： Kondo, Hiroshi
IPC分类号： G05B13/04 , G06F17/60 , G05B19/418
CPC分类号： G06Q10/06 , G05B19/41865 , G05B2219/31318 , G05B2219/31379 , G05B2219/32191 , G05B2219/32256 , G05B2219/32263 , G05B2219/32292 , G05B2219/32297 , G05B2219/32301 , G05B2219/32316 , Y02P90/20 , Y02P90/22 , Y02P90/26

5. 发明公开

EP0644470A2 Production control system selecting optimum dispatching rule 失效
标题翻译：生产控制系统与优化分配规则的选择。
公开(公告)号：EP0644470A2
公开(公告)日：1995-03-22
申请号：EP94112283.0
申请日：1994-08-05
申请人： NEC CORPORATION
发明人： Kondo, Hiroshi
IPC分类号： G05B13/04 , G06F17/60
CPC分类号： G06Q10/06 , G05B19/41865 , G05B2219/31318 , G05B2219/31379 , G05B2219/32191 , G05B2219/32256 , G05B2219/32263 , G05B2219/32292 , G05B2219/32297 , G05B2219/32301 , G05B2219/32316 , Y02P90/20 , Y02P90/22 , Y02P90/26
摘要： A production control system for electronic devices manufactured through many stages including plural apparatuses comprises dispatching rule storing means, a statistical analyzer and a simulator. The dispatching rule storing means stores plural dispatching rules including a first-in first-out rule, three of lot selective rules and dead line rule. The statistical analyzer accumulates status data representing the status of each of apparatuses and lots to be processed for a fixed period of time, and generates a statistical data by statistically processing the status data as accumulated. The simulator simulates the production line to evaluate an efficiency thereof based on the statistical data and each one of the plural dispatching rules. An optimum dispatching rule is selected which provides the optimum efficiency for the production line among the plural dispatching rules.

6. 发明公开

EP0644470A3 Production control system selecting optimum dispatching rule 失效
标题翻译：产品制造商Auswahl der optimizeen Zuteilungsregel。
公开(公告)号：EP0644470A3
公开(公告)日：1998-04-15
申请号：EP94112283.0
申请日：1994-08-05
申请人： NEC CORPORATION
发明人： Kondo, Hiroshi
IPC分类号： G05B13/04 , G06F17/60
CPC分类号： G06Q10/06 , G05B19/41865 , G05B2219/31318 , G05B2219/31379 , G05B2219/32191 , G05B2219/32256 , G05B2219/32263 , G05B2219/32292 , G05B2219/32297 , G05B2219/32301 , G05B2219/32316 , Y02P90/20 , Y02P90/22 , Y02P90/26
摘要： A production control system for electronic devices manufactured through many stages including plural apparatuses comprises dispatching rule storing means, a statistical analyzer and a simulator. The dispatching rule storing means stores plural dispatching rules including a first-in first-out rule, three of lot selective rules and dead line rule. The statistical analyzer accumulates status data representing the status of each of apparatuses and lots to be processed for a fixed period of time, and generates a statistical data by statistically processing the status data as accumulated. The simulator simulates the production line to evaluate an efficiency thereof based on the statistical data and each one of the plural dispatching rules. An optimum dispatching rule is selected which provides the optimum efficiency for the production line among the plural dispatching rules.
摘要翻译：一种用于通过多个装置制造的电子装置的生产控制系统包括调度规则存储装置，统计分析器和模拟器。调度规则存储装置存储包括先进先出规则，批次选择规则中的三个和死线规则的多个调度规则。统计分析器在一段固定的时间段内累积代表每个装置和待处理的状态的状态数据，并通过统计处理累积的状态数据来生成统计数据。模拟器模拟生产线，以根据统计数据和多个调度规则中的每一个来评估其效率。选择最优调度规则，为多个调度规则中的生产线提供最佳效率。

7. 发明公开

KR1020030000081A 엠이에스에서 로트의 우선 순위 제어 시스템 및 그 방법 无效
标题翻译：在制造执行系统中控制优先权的系统和方法
公开(公告)号：KR1020030000081A
公开(公告)日：2003-01-06
申请号：KR1020010035714
申请日：2001-06-22
申请人： 주식회사 미라콤아이앤씨
发明人： 백원인 , 박흥철 , 윤주덕 , 백종현 , 정주석
IPC分类号： H01L21/00
CPC分类号： G06Q10/06 , G05B19/41865 , G05B2219/31372 , G05B2219/32316 , G05B2219/32323 , G05B2219/45031 , Y02P90/12 , Y02P90/20
摘要： PURPOSE: A method for controlling priority of a lot in a manufacturing execution system(MES) is provided to shorten an interval of process time by automatically making a priority list of the lot in the MES. CONSTITUTION: Queue time and process time in every process is arbitrarily inputted through a control computer(20) for controlling production to set a setup value. Start time and finish time in every process is inputted through an equipment computer(10) for controlling an item regarding a process for fabricating a product to set a measure value. A ratio of a measure value to a setup value is determined to obtain process cycle time substantially used in every process. The process cycle time to use is calculated according to the measure value reflected on the setup value. The priority list of the lot is made according to the result of calculation. The priority list of the lot is displayed on a screen.
摘要翻译：目的：提供一种用于控制制造执行系统（MES）中的批次优先级的方法，以通过自动制定MES中批次的优先级列表来缩短处理时间间隔。构成：通过控制计算机（20）任意地输入每个进程中的队列时间和处理时间，用于控制生产以设置设置值。在每个处理中的开始时间和完成时间通过设备计算机（10）输入，用于控制关于制造产品的处理的项目以设置测量值。确定测量值与设定值的比率，以获得在每个过程中基本使用的处理周期时间。根据设定值反映的测量值计算使用过程周期。批次的优先级列表是根据计算结果进行的。批次的优先级列表显示在屏幕上。

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