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    • 2. 发明申请
    • COMPACT, HIGH-EFFICIENCY CONDENSATION NUCLEUS COUNTER
    • WO2003091708A3
    • 2003-11-06
    • PCT/US2003/009820
    • 2003-04-02
    • MSP CORPORATION
    • LIU, Benjamin, Y., H.
    • G01N15/06
    • A condensation nucleus counter (20, 90) has a series of flow passageways forming a flow path, including a first passageway (24, 30, 42, 54, 56, 106, 110, 118, 122) for carrying the gas stream having the particles to be detected which is heated, so that the gas stream is heated prior to entering a saturator (30, 110). The saturator (30, 110) is positioned as part of the flow path (24, 30, 42, 54, 56, 106, 110, 118) for the gas stream and is made of a porous material having a portion immersed in a liquid working fluid (36). The porous material is selected so that capillary action will move the liquid working fluid (36, 114) along the length of the saturator (30, 110). Vapor from the working liquid will be transferred to the gas stream as it moves through the saturator (30). The gas stream then passes to a condenser or cooler (54, 122) that reduces the temperature of the gas stream and causes the working fluid vapor to condense on the particles in the gas stream to form droplets. A particle detector (58, 132), such as a light scattering particle detector (58, 132), then receives the gas stream and detects the droplets that have been formed.
    • 7. 发明申请
    • METHOD AND APPARATUS FOR GENERATING CHARGED PARTICLES
    • 用于产生带电粒子的方法和设备
    • WO2006044725A2
    • 2006-04-27
    • PCT/US2005/037132
    • 2005-10-18
    • MSP CORPORATIONDICK, WilliamLIU, Benjamin, Y.H.
    • DICK, WilliamLIU, Benjamin, Y.H.
    • H01L21/67028B05D1/06
    • A method for establishing a calibrating standard for wafer inspection includes depositing solid ionized particles of a known size range with an aerosol onto a wafer. The method also includes depositing particles onto a wafer in a deposition chamber by using an aerosol stream and the solid particles suspended in a gas; ionizing the aerosol stream with a negative or positive charge polarity or both by passing the aerosol stream through a non-radioactive ionizer 40 to produce charged particles and supplying such aerosol stream to the deposition chamber. An apparatus 110 for producing charged particles includes an atomizer 10 and a non-radioactive ionizer 40 in fluid communication with each other. The apparatus 110 may also include an electrospray droplet generator for producing an aerosol with dry-solid particles and an ionizer that ionizes the molecules of the gas. The apparatus may also include a generator for generating an aerosol with particles suspended in the gas with a non-radioactive ionizer 40 that ionizes the gas in the aerosol causing the aerosol particles to be charged. The apparatus 110 may further include an electrostatic classifier for classifying the charged particles to a selected size range.
    • 用于建立用于晶片检查的校准标准的方法包括将具有气溶胶的已知尺寸范围的固体电离粒子沉积到晶片上。 该方法还包括通过使用气溶胶流和悬浮在气体中的固体颗粒将颗粒沉积到沉积室中的晶片上; 通过使气溶胶流通过非放射性离子发生器40以产生带电粒子并将这种气溶胶流供应到沉积室来使负极或正极电荷极性的气溶胶流离子化或二者。 用于产生带电粒子的装置110包括彼此流体连通的雾化器10和非放射性离子发生器40。 装置110还可以包括用于产生具有干固体颗粒的气溶胶和电离气体分子的离子发生器的电喷雾液滴发生器。 该装置还可以包括发生器,该发生器用非放射性离子发生器40产生具有悬浮在气体中的颗粒的气溶胶,该非放射性离子发生器40使气溶胶中的气体离子化,使气溶胶颗粒带电。 装置110还可以包括静电分类器,用于将带电粒子分类至选定的尺寸范围。
    • 8. 发明申请
    • HIGH-PERFORMANCE VAPORIZER FOR LIQUID-PRECURSOR AND MULTI-LIQUID-PRECURSOR VAPORIZATION IN SEMICONDUCTOR THIN FILM DEPOSITION
    • 用于液体前驱物的高性能蒸发器和半导体薄膜沉积中的多液体前驱体蒸发
    • WO2005068682A2
    • 2005-07-28
    • PCT/US2004/041944
    • 2004-12-15
    • MSP CORPORATIONLIU, Benjamin, Y., H.MA, Yamin
    • LIU, Benjamin, Y., H.MA, Yamin
    • C23C16/448
    • C23C16/4486B01B1/005
    • A vaporization system (50, 92, 92a, 92b, 180) for thin film formation and for introducing vapors into a deposition chamber (26, 84, 130) for depositing films onto a semi-conductor surface has a vaporization chamber (52, 116, 192) that is selectively provided with at least two different, that is selectively provided with at least two different, separate, precursor liquids (54A, 54B, 54C, 110A, 110B, 186) carried in a gas stream that may be a single carrier gas, or a selected one of a plurality of carrier gases from gas sources (12, 62A, 62B, 62C, 98A, 98B, 184). When the liquids being introduced are likely to be subject to thermal decomposition from contact with high temperature surfaces, an atomizer (94, 142A, 142B, 154A, 154B, 182) is used at the inlet of the vaporization chamber (52, 116, 192) to provide an aerosol to the vaporization chamber (52, 116, 192) from one or more individual carrier gases from gas sources 12, 62A, 62B, 62C, 98A, 98B for simultaneous or sequential introduction into the vaporization chamber (52, 116, 192). The vaporization chamber (52, 116, 192) may be designed to insure complete vaporization by incorporating a recirculating gas flow through heated passageways (198, 124, 202, 212) before the vaporized gas/vapor mixture exits the vaporization chamber (52, 116, 192).
    • 用于薄膜形成和用于将蒸气引入用于将膜沉积到半导体表面上的沉积室(26,84,130)中的蒸发系统(50,92,92a,92b,180)具有蒸发室(52,116 ,192),其被选择性地设置有至少两个不同的,其被选择性地设置有携带在气流中的至少两种不同的分离的前体液体(54A,54B,54C,110A,110B,186) 载气或来自气体源(12,62A,62B,62C,98A,98B,184)的多种载气中的选定的一种。 当引入的液体可能经受与高温表面接触的热分解时,在蒸发室(52,116,192)的入口处使用雾化器(94,142A,142B,154A,154B,182) )以从气源12,62A,62B,62C,98A,98B的一种或多种单独的载气提供气雾剂以同时或顺序地引入蒸发室(52,116) ,192)。 蒸发室(52,116,192)可以被设计成通过在汽化的气体/蒸气混合物离开蒸发室(52,116)之前并入循环气流通过加热通道(198,124,202,212)来确保完全蒸发 ,192)。
    • 10. 发明申请
    • SCANNING DEPOSITION HEAD FOR DEPOSITING PARTICLES ON A WAFER
    • 扫描沉积头用于在水平面上沉积颗粒
    • WO2002061172A1
    • 2002-08-08
    • PCT/US2002/001462
    • 2002-01-18
    • MSP CORPORATION
    • SUN, James, J.LIU, Benjamin, Y., H.
    • C23C20/00
    • H01L21/6715C23C18/00C30B7/00
    • A deposition chamber (18) is formed in a housing (10) that has a substrate carrier (12) on the interior. The substrate carrier (12) is rotatable about a central axis (20), and a particle deposition head (24) is mounted in the chamber (18) on a support (40) that can be moved linearly along lines that are substantially radial to the central axis (20) of the substrate carrier (12). The deposition head (24) thus can be moved to different radial positions of a substrate (26) carried on the substrate carrier (12) as the carrier (12) rotates during deposition from the head (24) to provide for a wide variety of deposition patterns on the substrate. The deposition head (24) has a pair of aerosol discharge openings (28, 30), one being the end of a substantially tubular central passageway (28) and the other being the end of an annular passageway (30) that surrounds the central tubular passageway (28).
    • 沉积室(18)形成在壳体(10)中,在壳体(10)内部具有衬底载体(12)。 衬底载体(12)可围绕中心轴线(20)旋转,并且颗粒沉积头(24)安装在腔室(18)中的支撑件(40)上,支撑件(40)可以沿着基本上径向到 衬底载体(12)的中心轴线(20)。 因此,当沉积头(24)从头部(24)沉积时,沉积头(24)可以移动到承载在基底载体(12)上的基底(26)的不同的径向位置,以便提供各种各样的 衬底上的沉积图案。 沉积头(24)具有一对气溶胶排放口(28,30),一对是大致管状的中央通道(28)的端部,另一个是环形通道(30)的端部,环形通道 通道(28)。