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    • 8. 发明申请
    • THIN FILM MANUFACTURING METHOD AND SILICON MATERIAL WHICH CAN BE USED IN THE METHOD
    • 薄膜制造方法和可用于该方法的硅材料
    • US20120100306A1
    • 2012-04-26
    • US13379282
    • 2010-07-01
    • Yuma KamiyamaKazuyoshi HondaYasuharu Shinokawa
    • Yuma KamiyamaKazuyoshi HondaYasuharu Shinokawa
    • B05D3/06C01B33/02B05D3/02
    • C23C14/246C01B33/02C23C14/14
    • Particles coming from an evaporation source 9 are deposited on a substrate 21 at a specified film forming position 33 in a vacuum so as to form a thin film on the substrate 21. A rod-shaped material 32 containing a source material of the thin film is melted above the evaporation source 9 and the melted material is supplied to the evaporation source 9 in the form of droplets 14. As the rod-shaped material 32, a rod-shaped silicon material in which a plurality of first regions each surrounded by a grain boundary are present at positions of 90% length from a center toward an outer peripheral part on a cross section perpendicular to a longitudinal direction of the material, and an area-weighted average value of major diameters of the first regions is 200 μm or less, and a plurality of second regions each surrounded by a grain boundary are present at positions of 50% length from the center toward the outer peripheral part, and an area-weighted average value of major diameters of the second regions is 1000 μm or more is used.
    • 来自蒸发源9的颗粒在真空中在指定的膜形成位置33处沉积在基板21上,以在基板21上形成薄膜。包含薄膜源材料的棒状材料32是 熔化在蒸发源9上方,并且熔融的材料以液滴14的形式供应到蒸发源9.作为棒状材料32,其中多个第一区域被颗粒包围的棒状材料 边界存在于与材料的纵向方向垂直的截面上从中心朝向外周部的长度为90%的位置,第一区域的长径的面积加权平均值为200μm以下, 并且由晶界包围的多个第二区域存在于从中心向外周部分的长度为50%的位置处,并且第二区域的主要直径的面积加权平均值 区域为1000μm以上。