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    • 1. 发明授权
    • Display panel
    • 显示面板
    • US08599181B2
    • 2013-12-03
    • US13227455
    • 2011-09-07
    • Yu-Min LinHsin-Li ChenFeng-Yuan Gan
    • Yu-Min LinHsin-Li ChenFeng-Yuan Gan
    • G06F3/038
    • H01L31/12G02F1/13338G02F2001/13312G06F3/0412G09G3/20G09G2300/0408G09G2360/144H01L31/145H01L31/18
    • A photo detector is disclosed. The photo detector includes a substrate, a first patterned semiconductor layer, a dielectric layer, a patterned conductive layer, an inter-layer dielectric, a second patterned semiconductor layer, two first electrodes disposed on the inter-layer dielectric and two second electrodes disposed on portions of the second semiconductor layer. The first patterned semiconductor layer having a first doping region and a second doping region is disposed on a transistor region. The dielectric layer is disposed to cover the substrate and the first semiconductor layer, the patterned conductive layer is disposed on the dielectric layer, and the inter-layer dielectric having at least two openings adapted to expose the first doping region and the second doping region is disposed to cover the dielectric layer. The second patterned semiconductor layer is disposed on a photosensitive region and the first electrodes are electrically connected to the first patterned semiconductor layer.
    • 公开了一种光电检测器。 光检测器包括衬底,第一图案化半导体层,电介质层,图案化导电层,层间电介质,第二图案化半导体层,设置在层间电介质上的两个第一电极和设置在层间电介质上的两个第二电极 第二半导体层的部分。 具有第一掺杂区域和第二掺杂区域的第一图案化半导体层设置在晶体管区域上。 介电层设置成覆盖基板和第一半导体层,图案化的导电层设置在电介质层上,并且具有适于暴露第一掺杂区域和第二掺杂区域的至少两个开口的层间电介质是 被设置成覆盖电介质层。 第二图案化半导体层设置在光敏区域上,并且第一电极电连接到第一图案化半导体层。
    • 2. 发明授权
    • Photo detector and method for fabricating the same
    • 光电检测器及其制造方法
    • US08054304B2
    • 2011-11-08
    • US11943602
    • 2007-11-21
    • Yu-Min LinHsin-Li ChenFeng-Yuan Gan
    • Yu-Min LinHsin-Li ChenFeng-Yuan Gan
    • G06F3/038G09G5/00
    • H01L31/12G02F1/13338G02F2001/13312G06F3/0412G09G3/20G09G2300/0408G09G2360/144H01L31/145H01L31/18
    • A photo detector is disclosed. The photo detector includes a substrate, a first patterned semiconductor layer with a first state, a dielectric layer, a patterned conductive layer, an inter-layer dielectric, a second patterned semiconductor layer with a second state, two first electrodes disposed on the inter-layer dielectric and two second electrodes disposed on portions of the second semiconductor layer. The first patterned semiconductor layer having a first doping region and a second doping region is disposed on a transistor region of the substrate. The dielectric layer is disposed to cover the substrate and the first semiconductor layer, the patterned conductive layer is disposed on the dielectric layer, and the inter-layer dielectric having at least two openings adapted to expose the first doping region and the second doping region is disposed to cover the dielectric layer. The second patterned semiconductor layer is disposed on a photosensitive region and the first electrodes are electrically connected to the first patterned semiconductor layer.
    • 公开了一种光电检测器。 光检测器包括基板,具有第一状态的第一图案化半导体层,电介质层,图案化导电层,层间电介质,具有第二状态的第二图案化半导体层,设置在第二状态的第二图案化半导体层, 层电介质和设置在第二半导体层的部分上的两个第二电极。 具有第一掺杂区域和第二掺杂区域的第一图案化半导体层设置在衬底的晶体管区域上。 介电层设置成覆盖基板和第一半导体层,图案化的导电层设置在电介质层上,并且具有适于暴露第一掺杂区和第二掺杂区的至少两个开口的层间电介质是 被设置成覆盖电介质层。 第二图案化半导体层设置在光敏区域上,并且第一电极电连接到第一图案化半导体层。
    • 3. 发明申请
    • PHOTO DETECTOR AND METHOD FOR FABRICATING THE SAME
    • 照片检测器及其制造方法
    • US20110316830A1
    • 2011-12-29
    • US13227455
    • 2011-09-07
    • Yu-Min LinHsin-Li ChenFeng-Yuan Gan
    • Yu-Min LinHsin-Li ChenFeng-Yuan Gan
    • G09G5/10H01L31/12H01L31/18
    • H01L31/12G02F1/13338G02F2001/13312G06F3/0412G09G3/20G09G2300/0408G09G2360/144H01L31/145H01L31/18
    • A photo detector is disclosed. The photo detector includes a substrate, a first patterned semiconductor layer, a dielectric layer, a patterned conductive layer, an inter-layer dielectric, a second patterned semiconductor layer, two first electrodes disposed on the inter-layer dielectric and two second electrodes disposed on portions of the second semiconductor layer. The first patterned semiconductor layer having a first doping region and a second doping region is disposed on a transistor region. The dielectric layer is disposed to cover the substrate and the first semiconductor layer, the patterned conductive layer is disposed on the dielectric layer, and the inter-layer dielectric having at least two openings adapted to expose the first doping region and the second doping region is disposed to cover the dielectric layer. The second patterned semiconductor layer is disposed on a photosensitive region and the first electrodes are electrically connected to the first patterned semiconductor layer.
    • 公开了一种光电检测器。 光检测器包括衬底,第一图案化半导体层,电介质层,图案化导电层,层间电介质,第二图案化半导体层,设置在层间电介质上的两个第一电极和设置在层间电介质上的两个第二电极 第二半导体层的部分。 具有第一掺杂区域和第二掺杂区域的第一图案化半导体层设置在晶体管区域上。 介电层设置成覆盖基板和第一半导体层,图案化的导电层设置在电介质层上,并且具有适于暴露第一掺杂区域和第二掺杂区域的至少两个开口的层间电介质是 被设置成覆盖电介质层。 第二图案化半导体层设置在光敏区域上,并且第一电极电连接到第一图案化半导体层。
    • 4. 发明申请
    • PHOTO DETECTOR AND METHOD FOR FABRICATING THE SAME
    • 照片检测器及其制造方法
    • US20090027371A1
    • 2009-01-29
    • US11943602
    • 2007-11-21
    • Yu-Min LinHsin-Li ChenFeng-Yuan Gan
    • Yu-Min LinHsin-Li ChenFeng-Yuan Gan
    • G09G3/00H01L31/18H01L31/062
    • H01L31/12G02F1/13338G02F2001/13312G06F3/0412G09G3/20G09G2300/0408G09G2360/144H01L31/145H01L31/18
    • A photo detector is disclosed. The photo detector includes a substrate, a first patterned semiconductor layer with a first state, a dielectric layer, a patterned conductive layer, an inter-layer dielectric, a second patterned semiconductor layer with a second state, two first electrodes disposed on the inter-layer dielectric and two second electrodes disposed on portions of the second semiconductor layer. The first patterned semiconductor layer having a first doping region and a second doping region is disposed on a transistor region of the substrate. The dielectric layer is disposed to cover the substrate and the first semiconductor layer, the patterned conductive layer is disposed on the dielectric layer, and the inter-layer dielectric having at least two openings adapted to expose the first doping region and the second doping region is disposed to cover the dielectric layer. The second patterned semiconductor layer is disposed on a photosensitive region and the first electrodes are electrically connected to the first patterned semiconductor layer.
    • 公开了一种光电检测器。 光检测器包括基板,具有第一状态的第一图案化半导体层,电介质层,图案化导电层,层间电介质,具有第二状态的第二图案化半导体层,设置在第二状态的第二图案化半导体层, 层电介质和设置在第二半导体层的部分上的两个第二电极。 具有第一掺杂区域和第二掺杂区域的第一图案化半导体层设置在衬底的晶体管区域上。 介电层设置成覆盖基板和第一半导体层,图案化的导电层设置在电介质层上,并且具有适于暴露第一掺杂区和第二掺杂区的至少两个开口的层间电介质是 被设置成覆盖电介质层。 第二图案化半导体层设置在光敏区域上,并且第一电极电连接到第一图案化半导体层。