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    • 4. 发明授权
    • Semiconductor device and method for testing the same
    • 半导体装置及其测试方法
    • US07131042B2
    • 2006-10-31
    • US10421533
    • 2003-04-21
    • Jung-Hwan Choi
    • Jung-Hwan Choi
    • G01R31/28
    • G01R31/31926
    • Test board configurations and test method for semiconductor devices with simultaneous bi-directional (SBD) data ports are disclosed. The devices have two SBD data ports with a pass mode that relays data between the ports. Significantly, each device contains configurable switching elements that allow a test mode, wherein unidirectional input/output data on one SBD data port is mapped to bi-directional data on the other SBD data port. This allows device testing with automated test equipment that employs unidirectional data signaling, and yet allows such test equipment to test the SBD capability of such devices.
    • 公开了具有同时双向(SBD)数据端口的半导体器件的测试板配置和测试方法。 这些设备具有两个SBD数据端口,通过模式在端口之间中继数据。 重要的是,每个设备都包含允许测试模式的可配置开关元件,其中一个SBD数据端口上的单向输入/输出数据映射到另一个SBD数据端口上的双向数据。 这允许使用采用单向数据信号的自动测试设备进行设备测试,并允许这种测试设备测试这些设备的SBD能力。
    • 6. 发明授权
    • Delay lock loop circuit
    • 延时锁回路电路
    • US06859078B2
    • 2005-02-22
    • US10641313
    • 2003-08-14
    • Jung-Hwan Choi
    • Jung-Hwan Choi
    • H03L7/22H03L7/07H03L7/081H03L7/06
    • H03L7/0812H03L7/07
    • A delay lock loop circuit includes a reference loop for receiving an external clock signal and for generating a second output signal and a first output signal which includes a plurality of signals having different respective phases. A fine loop receives the external clock signal and the first output signal of the reference loop and generates an internal clock signal. A transition detecting circuit receives the second output signal of the reference loop and generates a protection signal by detecting a transition of the logic state of the second output signal of the reference loop. In response to the protection signal, the delay lock loop circuit in accordance with the present invention protects itself from an external clock signal that has a frequency that is out of the range of operable frequencies of the delay lock loop circuit, for example by disabling the entire circuit, or a portion of the circuit.
    • 延迟锁定环电路包括用于接收外部时钟信号并用于产生第二输出信号的参考回路和包括具有不同相位相位的多个信号的第一输出信号。 精细回路接收外部时钟信号和参考环路的第一个输出信号,并产生内部时钟信号。 转移检测电路接收参考回路的第二输出信号,并通过检测参考回路的第二输出信号的逻辑状态的转变来产生保护信号。 响应于保护信号,根据本发明的延迟锁定环路电路保护自身不具有超出延迟锁定环电路的可操作频率范围的频率的外部时钟信号,例如通过禁用 整个电路或电路的一部分。
    • 8. 发明授权
    • Open drain type output buffer
    • 开漏型输出缓冲器
    • US06831478B2
    • 2004-12-14
    • US10425824
    • 2003-04-30
    • Jung-Hwan Choi
    • Jung-Hwan Choi
    • H03K19003
    • H04L25/028H03K19/00323
    • The open-drain type output buffer includes a first driver and at east one of (1) at least one secondary driver and (2) at least one tertiary driver. The first driver selectively pulls an output node towards a low voltage based on input data. The secondary and tertiary drivers have first and second states. Each secondary and tertiary driver pulls the output node towards the low voltage when in the first state, and pulls the output node towards the low voltage in the second state. A control circuit, when a secondary driver is included, controls the secondary driver such that the secondary driver is in the second state when it has been determined that at least two consecutive low voltage output data have been generated. The control circuit, when a tertiary driver is included, controls the tertiary driver such that the tertiary driver is in the first state when a transition from a steady high voltage output data to a low voltage output data is determined.
    • 开漏型输出缓冲器包括第一驱动器,并且在(1)至少一个辅助驱动器的东侧和(2)至少一个第三驱动器的东一侧。 第一个驱动器基于输入数据选择性地将输出节点拉向低电压。 二级和三级驾驶员有第一和第二州。 当处于第一状态时,每个次级和三级驱动器将输出节点拉向低电压,并且在第二状态下将输出节点拉向低电压。 当包括次级驱动器时,控制电路控制次级驱动器,使得当已经确定已经生成了至少两个连续的低电压输出数据时,辅助驱动器处于第二状态。 当包括三级驱动器时,控制电路控制第三驱动器,使得当确定从稳定的高电压输出数据到低电压输出数据的转变时,第三驱动器处于第一状态。
    • 9. 发明授权
    • Delay-locked-loop circuit
    • 延迟锁定环电路
    • US08675428B2
    • 2014-03-18
    • US13729412
    • 2012-12-28
    • Jung-Hwan Choi
    • Jung-Hwan Choi
    • G11C8/00
    • G11C8/00G11C7/1051G11C7/1066G11C7/22G11C7/222G11C8/18G11C11/4076H03L7/07H03L7/08H03L7/0814H03L7/0816H03L7/0818
    • A delay-locked-loop (DLL) circuit having a DLL that operates when an external clock signal has a low frequency and a DLL that operates when an external clock signal has a high frequency is disclosed. The DLL circuit includes a first DLL and second DLL. The first DLL adjusts a delay time of an external clock signal to generate a first internal clock signal synchronized with the external clock signal when the external clock signal has a low frequency. The second DLL adjusts the delay time of the external clock signal to generate a second internal clock signal synchronized with the external clock signal when the external clock signal has a high frequency.
    • 公开了一种具有当外部时钟信号具有低频率时操作的DLL的延迟锁定环路(DLL)电路,以及当外部时钟信号具有高频率时操作的DLL。 DLL电路包括第一DLL和第二DLL。 当外部时钟信号具有低频率时,第一个DLL调整外部时钟信号的延迟时间,以产生与外部时钟信号同步的第一个内部时钟信号。 当外部时钟信号具有高频率时,第二个DLL调整外部时钟信号的延迟时间,以产生与外部时钟信号同步的第二个内部时钟信号。