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1. 发明申请

US20070167842A1 In-vivo examination method and in-vivo examination apparatus 有权
标题翻译：体内检查方法和体内检查装置
公开(公告)号：US20070167842A1
公开(公告)日：2007-07-19
申请号：US11640921
申请日：2006-12-19
申请人： Yoshihisa Tanikawa , Tadashi Hirata , Yasuaki Natori , Chika Nakajima , Yoshihiro Kawano
发明人： Yoshihisa Tanikawa , Tadashi Hirata , Yasuaki Natori , Chika Nakajima , Yoshihiro Kawano
IPC分类号： A61B6/00
CPC分类号： A61B1/045 , A61B1/043 , A61B5/0068 , A61B5/0071 , A61B5/0084
摘要： An object is to easily and reliably reach an examination site. The present invention provides an examination method of carrying out in-vivo examination using an in-vivo examination apparatus capable of fluorescence examination and reflected-light examination and includes the steps of setting a reference position so as to set an examination site by carrying out reflected-light examination, switching from reflected-light examination to fluorescence examination, and moving from the reference position to the examination site.
摘要翻译：目的是轻松可靠地到达考场。本发明提供使用能够进行荧光检查和反射光检查的体内检查装置进行体内检查的检查方法，包括以下步骤：设定参考位置，以便通过进行反射光线检查，从反射光检查切换到荧光检查，从参考位置移动到检查点。

2. 发明授权

US07801589B2 In-vivo examination method and in-vivo examination apparatus 有权
标题翻译：体内检查方法和体内检查装置
公开(公告)号：US07801589B2
公开(公告)日：2010-09-21
申请号：US11640921
申请日：2006-12-19
申请人： Yoshihisa Tanikawa , Tadashi Hirata , Yasuaki Natori , Chika Nakajima , Yoshihiro Kawano
发明人： Yoshihisa Tanikawa , Tadashi Hirata , Yasuaki Natori , Chika Nakajima , Yoshihiro Kawano
IPC分类号： A61B6/00
CPC分类号： A61B1/045 , A61B1/043 , A61B5/0068 , A61B5/0071 , A61B5/0084
摘要： An object is to easily and reliably reach an examination site. The present invention provides an examination method of carrying out in-vivo examination using an in-vivo examination apparatus capable of fluorescence examination and reflected-light examination and includes the steps of setting a reference position so as to set an examination site by carrying out reflected-light examination, switching from reflected-light examination to fluorescence examination, and moving from the reference position to the examination site.
摘要翻译：目的是轻松可靠地到达考场。本发明提供使用能够进行荧光检查和反射光检查的体内检查装置进行体内检查的检查方法，包括以下步骤：设定参考位置，以便通过进行反射光线检查，从反射光检查切换到荧光检查，从参考位置移动到检查点。

3. 发明授权

US07301626B2 Laser-scanning examination apparatus 有权
标题翻译：激光扫描检查仪
公开(公告)号：US07301626B2
公开(公告)日：2007-11-27
申请号：US11182782
申请日：2005-07-18
申请人： Atsuhiro Tsuchiya , Yoshihiro Kawano , Yoshihisa Tanikawa , Tadashi Hirata
发明人： Atsuhiro Tsuchiya , Yoshihiro Kawano , Yoshihisa Tanikawa , Tadashi Hirata
IPC分类号： G01J3/30
CPC分类号： G01N21/6458 , G02B21/002 , G02B21/0064 , G02B21/0076 , G02B21/0084 , G02B21/16
摘要： The invention reduces the loss of fluorescence intensity obtained from a specimen to acquire clear fluorescence images when irradiating the specimen with ultrashort-pulse laser light produced by a laser light source. The invention provides a laser-scanning examination apparatus including a laser light source for producing ultrashort-pulse laser light; a laser light source for producing continuous-wave laser light; a measurement head including an optical scanning unit for scanning the laser light on a specimen and an objective optical system; an imaging unit for detecting return light from the specimen in response to the ultrashort-pulse laser light; and an imaging unit for detecting return light from the specimen in response to the continuous-wave laser light. The laser light sources and one imaging unit are connected to the measurement head by an optical fiber, and the other imaging unit is connected to the measurement head by another optical fiber with a larger core diameter.
摘要翻译：本发明减少了从样品获得的荧光强度的损失，以便在用激光光源产生的超短脉冲激光照射样品时获得清晰的荧光图像。本发明提供了一种激光扫描检查装置，其包括用于产生超短脉冲激光的激光光源; 用于产生连续波激光的激光源; 测量头，包括用于扫描样本上的激光的光学扫描单元和物镜光学系统; 用于响应于超短脉冲激光来检测来自样本的返回光的成像单元; 以及用于响应于连续波激光来检测来自样本的返回光的成像单元。激光光源和一个成像单元通过光纤连接到测量头，另一个成像单元通过具有较大芯直径的另一光纤连接到测量头。

4. 发明申请

US20060017920A1 Laser-scanning examination apparatus 有权
标题翻译：激光扫描检查仪
公开(公告)号：US20060017920A1
公开(公告)日：2006-01-26
申请号：US11182782
申请日：2005-07-18
申请人： Atsuhiro Tsuchiya , Yoshihiro Kawano , Yoshihisa Tanikawa , Tadashi Hirata
发明人： Atsuhiro Tsuchiya , Yoshihiro Kawano , Yoshihisa Tanikawa , Tadashi Hirata
IPC分类号： G01J3/30
CPC分类号： G01N21/6458 , G02B21/002 , G02B21/0064 , G02B21/0076 , G02B21/0084 , G02B21/16
摘要： The invention reduces the loss of fluorescence intensity obtained from a specimen to acquire clear fluorescence images when irradiating the specimen with ultrashort-pulse laser light produced by a laser light source. The invention provides a laser-scanning examination apparatus including a laser light source for producing ultrashort-pulse laser light; a laser light source for producing continuous-wave laser light; a measurement head including an optical scanning unit for scanning the laser light on a specimen and an objective optical system; an imaging unit for detecting return light from the specimen in response to the ultrashort-pulse laser light; and an imaging unit for detecting return light from the specimen in response to the continuous-wave laser light. The laser light sources and one imaging unit are connected to the measurement head by an optical fiber, and the other imaging unit is connected to the measurement head by another optical fiber with a larger core diameter.
摘要翻译：本发明减少了从样品获得的荧光强度的损失，以便在用激光光源产生的超短脉冲激光照射样品时获得清晰的荧光图像。本发明提供了一种激光扫描检查装置，其包括用于产生超短脉冲激光的激光光源; 用于产生连续波激光的激光源; 测量头，包括用于扫描样本上的激光的光学扫描单元和物镜光学系统; 用于响应于超短脉冲激光来检测来自样本的返回光的成像单元; 以及用于响应于连续波激光来检测来自样本的返回光的成像单元。激光光源和一个成像单元通过光纤连接到测量头，另一个成像单元通过具有较大芯直径的另一光纤连接到测量头。

5. 发明申请

US20050211872A1 Optical-scanning examination apparatus 有权
标题翻译：光学扫描检查装置
公开(公告)号：US20050211872A1
公开(公告)日：2005-09-29
申请号：US11085047
申请日：2005-03-22
申请人： Yoshihiro Kawano , Tadashi Hirata , Tatsuo Nakata , Yoshihisa Tanikawa
发明人： Yoshihiro Kawano , Tadashi Hirata , Tatsuo Nakata , Yoshihisa Tanikawa
IPC分类号： G02B21/00 , G02B23/26 , G02B7/04
CPC分类号： G02B21/0048 , G02B21/004 , G02B21/0076
摘要： The invention provides an optical-scanning examination apparatus with a simple configuration, in which the resolution of acquired images can be freely changed and in which the fluorescence image intensity and examination depth can be adjusted to suit the purpose of examination. The optical-scanning examination apparatus includes a light source unit; a focusing lens for forming a first intermediate image of excitation light; an imaging lens; a first objective lens; an optical fiber bundle; a second objective lens; and an imaging unit for imaging return light that returns via the second objective lens, the optical fiber bundle, the first objective lens, and the imaging lens. In addition, a scanning mirror device, which is disposed at the first intermediate image position, is formed of a plurality of mirrors that simultaneously receive the first intermediate image and that can be selectively turned on and off.
摘要翻译：本发明提供了一种具有简单结构的光学扫描检查装置，其中可以自由地改变所获取的图像的分辨率，并且可以调整荧光图像强度和检查深度以适应检查的目的。光扫描检查装置包括：光源单元; 用于形成激发光的第一中间图像的聚焦透镜; 成像透镜; 第一个物镜; 光纤束; 第二个物镜; 以及用于对通过第二物镜，光纤束，第一物镜和成像透镜返回的返回光成像的成像单元。此外，设置在第一中间图像位置的扫描镜装置由同时接收第一中间图像并且可以选择性地打开和关闭的多个反射镜形成。

6. 发明授权

US07015444B2 Optical-scanning examination apparatus 有权
标题翻译：光学扫描检查装置
公开(公告)号：US07015444B2
公开(公告)日：2006-03-21
申请号：US11085047
申请日：2005-03-22
申请人： Yoshihiro Kawano , Tadashi Hirata , Tatsuo Nakata , Yoshihisa Tanikawa
发明人： Yoshihiro Kawano , Tadashi Hirata , Tatsuo Nakata , Yoshihisa Tanikawa
IPC分类号： G02B27/40 , G02B27/64 , G02B7/04
CPC分类号： G02B21/0048 , G02B21/004 , G02B21/0076
摘要： The invention provides an optical-scanning examination apparatus with a simple configuration, in which the resolution of acquired images can be freely changed and in which the fluorescence image intensity and examination depth can be adjusted to suit the purpose of examination. The optical-scanning examination apparatus includes a light source unit; a focusing lens for forming a first intermediate image of excitation light; an imaging lens; a first objective lens; an optical fiber bundle; a second objective lens; and an imaging unit for imaging return light that returns via the second objective lens, the optical fiber bundle, the first objective lens, and the imaging lens. In addition, a scanning mirror device, which is disposed at the first intermediate image position, is formed of a plurality of mirrors that simultaneously receive the first intermediate image and that can be selectively turned on and off.
摘要翻译：本发明提供了一种具有简单结构的光学扫描检查装置，其中可以自由地改变所获取的图像的分辨率，并且可以调整荧光图像强度和检查深度以适应检查的目的。光扫描检查装置包括：光源单元; 用于形成激发光的第一中间图像的聚焦透镜; 成像透镜; 第一个物镜; 光纤束; 第二个物镜; 以及用于对通过第二物镜，光纤束，第一物镜和成像透镜返回的返回光成像的成像单元。此外，设置在第一中间图像位置的扫描镜装置由同时接收第一中间图像并且可以选择性地打开和关闭的多个反射镜形成。

7. 发明申请

US20050281476A1 Examination apparatus 审中-公开
标题翻译：检查仪器
公开(公告)号：US20050281476A1
公开(公告)日：2005-12-22
申请号：US11080561
申请日：2005-03-16
申请人： Yoshihisa Tanikawa , Yoshihiro Kawano , Tadashi Hirata , Kazuhiko Osa
发明人： Yoshihisa Tanikawa , Yoshihiro Kawano , Tadashi Hirata , Kazuhiko Osa
IPC分类号： A61B5/00 , A61B5/0402 , A61B8/06 , G06K9/00 , G06K9/40 , H04N5/232
CPC分类号： A61B5/0059 , A61B5/0066 , A61B5/0068 , A61B5/0402 , A61B8/06 , H04N5/23212
摘要： An examination apparatus that can acquire detailed images from a specimen exhibiting dynamic behavior is provided. The examination apparatus comprises an imaging unit that images a specimen exhibiting dynamic behavior; a behavior detecting unit that detects the dynamic behavior of the specimen; an image storing unit that stores the dynamic behavior of the specimen detected by the behavior detecting unit and images of the specimen imaged by the imaging unit so as to be associated with each other; and a still-image extraction unit that extracts an image of the specimen when the specimen is substantially still based on the dynamic behavior of the specimen from the images of the specimen stored in the image storing unit.
摘要翻译：提供了一种能够从表现动态行为的样本获得详细图像的检查装置。该检查装置包括成像单元，其对表现出动态行为的样本进行成像; 行为检测单元，其检测所述检体的动态行为; 图像存储单元，其存储由所述行为检测单元检测到的样本的动态行为和由所述成像单元成像的所述样本的图像以使得彼此相关联; 以及静止图像提取单元，其基于来自存储在图像存储单元中的样本的图像的样本的动态行为，基本上静止时，提取样本的图像。

8. 发明申请

US20090231422A1 MICROSCOPE EXAMINATION APPARATUS 有权
标题翻译：显微镜检查装置
公开(公告)号：US20090231422A1
公开(公告)日：2009-09-17
申请号：US12435600
申请日：2009-05-05
申请人： Hiroya Fukuyama , Yoshihisa Tanikawa , Tadashi Hirata , Seiya Takahashi
发明人： Hiroya Fukuyama , Yoshihisa Tanikawa , Tadashi Hirata , Seiya Takahashi
IPC分类号： H04N7/18
CPC分类号： G02B21/24 , G02B21/26 , G02B27/646
摘要： The invention provides a microscope examination apparatus including a light source; an illumination optical system configured to guide light from the light source to a specimen; an objective lens configured to collimate return light from the specimen, the objective lens being provided in such a manner as to be displaceable at least in a direction intersecting an optical axis of the objective lens; an image-forming lens configured to image the return light from the specimen, which is collimated by the objective lens; an optical detector configured to detect the return light imaged by the image-forming lens; a microscope main body including the image-forming lens and the optical detector; and an objective-lens driving mechanism configured to drive the objective lens in a direction correcting image blur due to a displacement of the specimen.
摘要翻译：本发明提供一种包括光源的显微镜检查装置; 照明光学系统，被配置为将来自所述光源的光引导到样本; 物镜，被配置为准直来自所述样本的返回光，所述物镜以至少在与所述物镜的光轴相交的方向可位移的方式设置; 成像透镜，被配置为对由所述物镜准直的来自所述样本的返回光进行成像; 光学检测器，被配置为检测由图像形成透镜成像的返回光; 包括图像形成透镜和光学检测器的显微镜主体; 以及物镜驱动机构，被配置为在校正由于样本的位移造成的图像模糊的方向上驱动物镜。

9. 发明申请

US20070177256A1 Microscope examination apparatus 审中-公开
标题翻译：显微镜检查仪
公开(公告)号：US20070177256A1
公开(公告)日：2007-08-02
申请号：US11651552
申请日：2007-01-10
申请人： Hiroya Fukuyama , Yoshihisa Tanikawa , Tadashi Hirata , Seiya Takahashi
发明人： Hiroya Fukuyama , Yoshihisa Tanikawa , Tadashi Hirata , Seiya Takahashi
IPC分类号： G02B21/00
CPC分类号： G02B21/24 , G02B21/26 , G02B27/646
摘要： The invention provides a microscope examination apparatus including a light source; an illumination optical system configured to guide light from the light source to a specimen; an objective lens configured to collimate return light from the specimen, the objective lens being provided in such a manner as to be displaceable at least in a direction intersecting an optical axis of the objective lens; an image-forming lens configured to image the return light from the specimen, which is collimated by the objective lens; an optical detector configured to detect the return light imaged by the image-forming lens; a microscope main body including the image-forming lens and the optical detector; and an objective-lens driving mechanism configured to drive the objective lens in a direction correcting image blur due to a displacement of the specimen.
摘要翻译：本发明提供一种包括光源的显微镜检查装置; 照明光学系统，被配置为将来自所述光源的光引导到样本; 物镜，被配置为准直来自所述样本的返回光，所述物镜以至少在与所述物镜的光轴相交的方向可位移的方式设置; 成像透镜，被配置为对由所述物镜准直的来自所述样本的返回光进行成像; 光学检测器，被配置为检测由图像形成透镜成像的返回光; 包括图像形成透镜和光学检测器的显微镜主体; 以及物镜驱动机构，被配置为在校正由于样本的位移造成的图像模糊的方向上驱动物镜。

10. 发明授权

US07782528B2 Microscope examination apparatus 有权
标题翻译：显微镜检查仪
公开(公告)号：US07782528B2
公开(公告)日：2010-08-24
申请号：US12435600
申请日：2009-05-05
申请人： Hiroya Fukuyama , Yoshihisa Tanikawa , Tadashi Hirata , Seiya Takahashi
发明人： Hiroya Fukuyama , Yoshihisa Tanikawa , Tadashi Hirata , Seiya Takahashi
IPC分类号： G02B21/36
CPC分类号： G02B21/24 , G02B21/26 , G02B27/646
摘要： A microscope examination apparatus including a light source; an illumination optical system configured to guide light from the light source to a specimen; an objective lens configured to collimate return light from the specimen, the objective lens being provided in such a manner as to be displaceable at least in a direction intersecting an optical axis of the objective lens; an image-forming lens configured to image the return light from the specimen, which is collimated by the objective lens; an optical detector configured to detect the return light imaged by the image-forming lens; a microscope main body including the image-forming lens and the optical detector; and an objective-lens driving mechanism configured to drive the objective lens in a direction correcting image blur due to a displacement of the specimen.
摘要翻译：一种显微镜检查装置，包括光源; 照明光学系统，被配置为将来自所述光源的光引导到样本; 物镜，被配置为准直来自所述样本的返回光，所述物镜以至少在与所述物镜的光轴相交的方向可位移的方式设置; 成像透镜，被配置为对由所述物镜准直的来自所述样本的返回光进行成像; 光学检测器，被配置为检测由图像形成透镜成像的返回光; 包括图像形成透镜和光学检测器的显微镜主体; 以及物镜驱动机构，被配置为在校正由于样本的位移造成的图像模糊的方向上驱动物镜。

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