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    • 2. 发明授权
    • Driving method of variable resistance element and memory device
    • 可变电阻元件和存储器件的驱动方法
    • US07236388B2
    • 2007-06-26
    • US11169535
    • 2005-06-28
    • Yasunari HosoiYukio TamaiKazuya IshiharaShinji KobayashiNobuyoshi Awaya
    • Yasunari HosoiYukio TamaiKazuya IshiharaShinji KobayashiNobuyoshi Awaya
    • G11C11/00
    • G11C29/50G11C13/0007G11C13/0069G11C29/50008G11C2013/009G11C2213/31
    • A variable resistance element is configured to be provided with a perovskite-type oxide between a first electrode and a second electrode, of which electric resistance between the first electrode and the second electrode is changed by applying a voltage pulse of a predetermined polarity between the first electrode and the second electrode, and the variable resistance element has a resistance hysteresis characteristic, in which a changing rate of a resistance value is changed from positive to negative with respect to increase of a cumulative pulse applying time in the application of the voltage pulse. The voltage pulse is applied to the variable resistance element so that the cumulative pulse applying time is not longer than a specific cumulative pulse applying time, in which the changing rate of the, resistance value is changed from positive to negative with respect to increase of the cumulative pulse applying time in the resistance hysteresis characteristic.
    • 可变电阻元件被配置为在第一电极和第二电极之间设置有钙钛矿型氧化物,其中通过在第一电极和第二电极之间施加预定极性的电压脉冲来改变第一电极和第二电极之间的电阻 电极和第二电极,并且可变电阻元件具有电阻滞后特性,其中电阻值的变化率相对于施加电压脉冲的累积脉冲施加时间的增加而从正变化到负。 电压脉冲被施加到可变电阻元件,使得累积脉冲施加时间不长于特定的累积脉冲施加时间,其中电阻值的变化率相对于增加的电阻值从正变化到负 累积脉冲施加时间在电阻滞后特性。
    • 7. 发明授权
    • Variable resistance element, its manufacturing method and semiconductor memory device comprising the same
    • 可变电阻元件,其制造方法和包括该可变电阻元件的半导体存储器件
    • US07796416B2
    • 2010-09-14
    • US12092766
    • 2006-12-13
    • Kazuya IshiharaYasunari HosoiShinji Kobayashi
    • Kazuya IshiharaYasunari HosoiShinji Kobayashi
    • G11C11/00
    • H01L27/101H01L27/2436H01L45/08H01L45/1233H01L45/145H01L45/146H01L45/1625H01L45/1633Y10T29/49082
    • Provided is a variable resistance element capable of performing a stable resistance switching operation and having a favorable resistance value retention characteristics, comprising a variable resistor 2 sandwiched between a upper electrode 1 and lower electrode 3 and formed of titanium oxide or titanium oxynitride having a crystal grain diameter of 30 nm or less. When the variable resistance 2 is formed under the substrate temperature of 150° C. to 500° C., an anatase-type crystal having a crystal grain diameter of 30 nm or less is formed. Since the crystalline state of the variable resistor changes by applying a voltage pulse and the resistance value changes, no forming process is required. Moreover, it is possible to perform a stable resistance switching operation and obtain an excellent effect that the resistance fluctuation is small even if the switching is repeated, or the variable resistance element is stored for a long time under a high temperature.
    • 提供一种能够进行稳定的电阻切换操作并具有良好的电阻值保持特性的可变电阻元件,包括夹在上电极1和下电极3之间并由具有晶粒的氧化钛或氮氧化钛形成的可变电阻器2 直径30nm以下。 当在150℃至500℃的衬底温度下形成可变电阻2时,形成晶粒直径为30nm以下的锐钛矿型晶体。 由于可变电阻器的结晶状态通过施加电压脉冲而变化,并且电阻值改变,因此不需要形成工艺。 此外,即使重复切换,或者可变电阻元件在高温下长时间存储,也可以进行稳定的电阻切换操作,并获得优异的电阻波动小的效果。
    • 10. 发明授权
    • Nonvolatile semiconductor memory device
    • 非易失性半导体存储器件
    • US07433222B2
    • 2008-10-07
    • US11647329
    • 2006-12-29
    • Yasunari HosoiNobuyoshi AwayaIsao Inoue
    • Yasunari HosoiNobuyoshi AwayaIsao Inoue
    • G11C11/00
    • G11C13/0069G11C13/0007G11C13/003G11C2013/009G11C2213/31G11C2213/32G11C2213/72G11C2213/76G11C2213/79
    • A nonvolatile semiconductor device is configured so that a load circuit applying voltage to a variable resistive element is provided electrically connecting in series to the variable resistive element, a load resistive characteristic of the load circuit can be switched between two different characteristics. The two load resistive characteristics are selectively switched depending on whether a resistive characteristic of the variable resistive element transits from low resistance state to high resistance state, or vice versa, voltage necessary for transition from one of the two resistive characteristics to the other is applied by applying writing voltage to a serial circuit of the variable resistive element and load circuit. After the resistive characteristic of the variable resistive element transits from one to the other, voltage applied to the variable resistive element does not allow a resistive characteristic to return from the other to one depending on the selected load resistive characteristic.
    • 非易失性半导体器件被配置为使得向可变电阻元件施加电压的负载电路被提供为电连接到可变电阻元件,负载电路的负载电阻特性可以在两个不同特性之间切换。 根据可变电阻元件的电阻特性是否从低电阻状态转变为高电阻状态,反之亦然,两个负载电阻特性被选择性地切换,或者反过来,通过两个电阻特性之一转换到另一个电阻特性所需的电压被施加 对可变电阻元件和负载电路的串联电路施加写入电压。 在可变电阻元件的电阻特性从一个转变到另一个之后,施加到可变电阻元件的电压根据所选择的负载电阻特性不允许电阻特性从另一个返回到一个。