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1. 发明授权

US08039776B2 Quantitative differential interference contrast (DIC) microscopy and photography based on wavefront sensors 有权
标题翻译：基于波前传感器的定量微分干涉对比（DIC）显微镜和摄影
公开(公告)号：US08039776B2
公开(公告)日：2011-10-18
申请号：US12435165
申请日：2009-05-04
申请人： Xiquan Cui , Changhuei Yang , Guillermo J. Tearney
发明人： Xiquan Cui , Changhuei Yang , Guillermo J. Tearney
IPC分类号： G01J1/20
CPC分类号： G02B21/0092 , G01J9/02 , G02B21/14 , H01L27/14643
摘要： A wavefront microscope or camera utilizes a wavefront sensor to measure the local intensity and phase gradient of the wavefront and output image maps based on the intensity and phase gradient. A wavefront sensor provides a metal film having patterned structured two dimensional (2D) apertures that convert a phase gradient of a wavefront into a measurable form onto a photodetector array. A computer is used to analyze the data by separating signals projected and recorded on the array from the different apertures, predict a center of each projection, and sum signals for each projection to display the intensity while determining a center position change/offset from the predicted center to display the phase gradient of the wavefront.
摘要翻译：波前显微镜或相机利用波前传感器来测量波前的局部强度和相位梯度，并根据强度和相位梯度输出图像图。波前传感器提供具有图案化结构化二维（2D）孔径的金属膜，其将波前的相位梯度转换成可测量的形式到光电检测器阵列上。计算机用于通过将从阵列中投影和记录的信号与不同的孔分开来预测每个投影的中心，并且每个投影的和信号显示强度同时确定从预测的中心位置改变/偏移中心显示波前的相位梯度。

2. 发明授权

US08525091B2 Wavefront imaging devices comprising a film with one or more structured two dimensional apertures and their applications in microscopy and photography 有权
标题翻译：波前成像装置包括具有一个或多个结构化二维孔的膜及其在显微镜和摄影中的应用
公开(公告)号：US08525091B2
公开(公告)日：2013-09-03
申请号：US13229741
申请日：2011-09-11
申请人： Xiquan Cui , Changhuei Yang , Guillermo J. Tearney
发明人： Xiquan Cui , Changhuei Yang , Guillermo J. Tearney
IPC分类号： G01J1/20
CPC分类号： G02B21/0092 , G01J9/02 , G02B21/14 , H01L27/14643
摘要： Embodiments of the present invention relate to a wavefront sensor comprising a film and a photodetector. The film has one or more structured two dimensional apertures configured to convert a phase gradient of a wavefront into a measurable form. The photodetector is configured to receive the wavefront through the one or more 2D apertures and measure the phase gradient of the wavefront.
摘要翻译：本发明的实施例涉及一种包括膜和光电检测器的波前传感器。胶片具有一个或多个结构化的二维孔径，其被配置为将波前的相位梯度转换成可测量的形式。光电检测器被配置为通过一个或多个2D孔接收波前，并测量波前的相位梯度。

3. 发明申请

US20120061554A1 QUANTITATIVE DIFFERENTIAL INTERFERENCE CONTRAST (DIC) MICROSCOPY AND PHOTOGRAPHY BASED ON WAVEFRONT SENSORS 有权
标题翻译：基于波形传感器的定量差分干涉对比（DIC）显微镜和摄影
公开(公告)号：US20120061554A1
公开(公告)日：2012-03-15
申请号：US13229741
申请日：2011-09-11
申请人： Xiquan Cui , Changhuei Yang , Guillermo J. Tearney
发明人： Xiquan Cui , Changhuei Yang , Guillermo J. Tearney
IPC分类号： H01L27/146 , G01J1/42 , H01L31/0232
CPC分类号： G02B21/0092 , G01J9/02 , G02B21/14 , H01L27/14643
摘要： Embodiments of the present invention relate to a wavefront sensor comprising a film and a photodetector. The film has one or more structured two dimensional apertures configured to convert a phase gradient of a wavefront into a measurable form. The photodetector is configured to receive the wavefront through the one or more 2D apertures and measure the phase gradient of the wavefront.
摘要翻译：本发明的实施例涉及一种包括膜和光电检测器的波前传感器。胶片具有一个或多个结构化的二维孔径，其被配置为将波前的相位梯度转换成可测量的形式。光电检测器被配置为通过一个或多个2D孔接收波前，并测量波前的相位梯度。

4. 发明授权

US09041938B2 Surface wave assisted structures and systems 有权
标题翻译：表面波辅助结构和系统
公开(公告)号：US09041938B2
公开(公告)日：2015-05-26
申请号：US13344550
申请日：2012-01-05
申请人： Guoan Zheng , Xiquan Cui , Xin Heng , Changhuei Yang , Axel Scherer
发明人： Guoan Zheng , Xiquan Cui , Xin Heng , Changhuei Yang , Axel Scherer
IPC分类号： G01B9/02 , G02B6/122 , B82Y20/00 , G01N21/552 , G02B5/00 , G02B21/00 , G02B21/14 , G02B27/52
CPC分类号： G02B6/1226 , B82Y20/00 , G01N21/554 , G02B5/008 , G02B21/0032 , G02B21/004 , G02B21/0056 , G02B21/0068 , G02B21/14 , G02B27/52
摘要： A surface wave assisted system having an aperture layer with a surface and an aperture, and a plurality of grooves around the aperture. The plurality of grooves is configured to generate an optical transfer function at the aperture by inducing a surface wave for interfering with transmission of light of a range of spatial frequency.
摘要翻译：表面波辅助系统，具有具有表面和孔径的孔层，以及围绕孔的多个凹槽。多个槽被配置为通过诱导表面波来干扰空间频率范围的光的透射来在孔处产生光学传递函数。

5. 发明授权

US08314933B2 Optofluidic microscope device with photosensor array 有权
标题翻译：具有光电传感器阵列的光电显微镜装置
公开(公告)号：US08314933B2
公开(公告)日：2012-11-20
申请号：US12398050
申请日：2009-03-04
申请人： Xiquan Cui , Xin Heng , Lap Man Lee , Changhuei Yang
发明人： Xiquan Cui , Xin Heng , Lap Man Lee , Changhuei Yang
IPC分类号： G01N21/00
CPC分类号： G01N21/53 , G01N21/6458
摘要： Embodiments of the present invention relate to techniques for improving optofluidic microscope (OFM) devices. One technique which may be used eliminates the aperture layer covering the light detector layer. Other techniques retain the aperture layer, reversing the relative position of the light source and light detector such that light passes through the aperture layer before passing through the fluid channel to the light detector. Another technique adds an optical tweezer for controlling the movement of objects moving through the fluid channel. Another technique adds an optical fiber bundle to relay light from light transmissive regions to a remote light detector. Another technique adds two electrodes at ends of the fluid channel to generate an electrical field capable of moving objects through the fluid channel while suppressing rotation. These techniques can be employed separately or in combination to improve the capabilities of OFM devices.
摘要翻译：本发明的实施例涉及用于改进光流体显微镜（OFM）装置的技术。可以使用的一种技术消除了覆盖光检测器层的孔径层。其他技术保留孔径层，反转光源和光检测器的相对位置，使得光在通过流体通道之前通过孔层，到达光检测器。另一种技术增加了用于控制移动通过流体通道的物体运动的光学镊子。另一种技术增加了光纤束，以将来自光透射区域的光中继到远程光检测器。另一种技术在流体通道的端部添加两个电极，以产生能够通过流体通道移动物体同时抑制旋转的电场。这些技术可以单独使用或组合使用以提高OFM设备的能力。

6. 发明申请

US20120026509A1 ON-CHIP PHASE MICROSCOPE/BEAM PROFILER BASED ON DIFFERENTIAL INTERFERENCE CONTRAST AND/OR SURFACE PLASMON ASSISTED INTERFERENCE 有权
标题翻译：基于差分干涉对比和/或表面质谱辅助干扰的片上相位显微镜/光束分布器
公开(公告)号：US20120026509A1
公开(公告)日：2012-02-02
申请号：US13157245
申请日：2011-06-09
申请人： Xiquan Cui , Xin Heng , Changhuei Yang , Axel Scherer , Demetri Psaltis
发明人： Xiquan Cui , Xin Heng , Changhuei Yang , Axel Scherer , Demetri Psaltis
IPC分类号： G01B9/02 , G02B21/10 , G02B5/18
CPC分类号： G02B21/0056 , G01N21/553 , G02B21/18 , G02B21/361
摘要： A differential interference contrast (DIC) determination device and method utilizes an illumination source, a layer having a pair of two apertures that receive illumination from the illumination source, and a photodetector to receive Young's interference from the illumination passing through the pair of two apertures. In addition, a surface wave assisted optofluidic microscope and method utilize an illumination source, a fluid channel having a layer with at least one aperture as a surface, and a photodetector that receives a signal based on the illumination passing through the aperture. The layer is corrugated (e.g., via fabrication) and parameters of the corrugation optimize the signal received on the photodetector.
摘要翻译：差分干涉对比度（DIC）确定装置和方法利用照明源，具有一对两个孔的层，其接收来自照明源的照明，以及光电检测器，用于接收来自穿过该对两个孔的照明的杨氏干扰。此外，表面波辅助光流体显微镜和方法利用照明源，具有至少一个孔的层作为表面的流体通道，以及基于穿过孔的照明而接收信号的光电检测器。该层是波纹状的（例如通过制造），并且波纹的参数优化了在光电检测器上接收的信号。

7. 发明申请

US20100195873A1 QUANTITATIVE DIFFERENTIAL INTERFERENCE CONTRAST (DIC) DEVICES FOR COMPUTED DEPTH SECTIONING 有权
标题翻译：用于计算深度分段的量化差分干扰对比（DIC）设备
公开(公告)号：US20100195873A1
公开(公告)日：2010-08-05
申请号：US12690952
申请日：2010-01-21
申请人： Xiquan Cui , Changhuei Yang
发明人： Xiquan Cui , Changhuei Yang
IPC分类号： G06K9/62
CPC分类号： G01N21/45 , G01B11/2441 , G02B21/0092 , G02B21/14 , G02B21/18 , G02B21/367
摘要： Embodiments of the present invention relate to a method for computing depth sectioning of an object using a quantitative differential interference contrast device having a wavefront sensor with one or more structured apertures, a light detector and a transparent layer between the structured apertures and the light detector. The method comprises receiving light, by the light detector, through the one or more structured apertures. The method also measures the amplitude of an image wavefront, and measures the phase gradient in two orthogonal directions of the image wavefront based on the light. The method can then reconstruct the image wavefront using the amplitude and phase gradient. The method can then propagate the reconstructed wavefront to a first plane intersecting an object at a first depth. In one embodiment, the method propagates the reconstructed wavefront to additional planes and generates a three-dimensional image based on the propagated wavefronts.
摘要翻译：本发明的实施例涉及一种使用具有一个或多个结构化孔径的波前传感器，光检测器和结构化孔径与光检测器之间的透明层的定量差分干涉对比装置来计算物体的深度截面的方法。该方法包括通过光检测器接收通过一个或多个结构化孔的光。该方法还测量图像波前的幅度，并且基于光测量图像波前的两个正交方向上的相位梯度。该方法可以使用幅度和相位梯度来重构图像波前。该方法然后可以将重建的波前传播到在第一深度与物体相交的第一平面。在一个实施例中，该方法将重建的波前传播到附加平面，并且基于传播的波前产生三维图像。

8. 发明申请

US20090276188A1 QUANTITATIVE DIFFERENTIAL INTERFERENCE CONTRAST (DIC) MICROSCOPY AND PHOTOGRAPHY BASED ON WAVEFRONT SENSORS 有权
标题翻译：基于波形传感器的定量差分干涉对比（DIC）显微镜和摄影
公开(公告)号：US20090276188A1
公开(公告)日：2009-11-05
申请号：US12435165
申请日：2009-05-04
申请人： Xiquan Cui , Changhuei Yang
发明人： Xiquan Cui , Changhuei Yang
IPC分类号： G01B9/02 , H01L27/142 , G06F15/00
CPC分类号： G02B21/0092 , G01J9/02 , G02B21/14 , H01L27/14643
摘要： A wavefront microscope or camera utilizes a wavefront sensor to measure the local intensity and phase gradient of the wavefront and output image maps based on the intensity and phase gradient. A wavefront sensor provides a metal film having patterned structured two dimensional (2D) apertures that convert a phase gradient of a wavefront into a measurable form onto a photodetector array. A computer is used to analyze the data by separating signals projected and recorded on the array from the different apertures, predict a center of each projection, and sum signals for each projection to display the intensity while determining a center position change/offset from the predicted center to display the phase gradient of the wavefront.
摘要翻译：波前显微镜或相机利用波前传感器来测量波前的局部强度和相位梯度，并根据强度和相位梯度输出图像图。波前传感器提供具有图案化结构化二维（2D）孔径的金属膜，其将波前的相位梯度转换成可测量的形式到光电检测器阵列上。计算机用于通过将从阵列中投影和记录的信号与不同的孔分开来预测每个投影的中心，并且每个投影的和信号显示强度同时确定从预测的中心位置改变/偏移中心显示波前的相位梯度。

9. 发明申请

US20110063623A1 ON-CHIP PHASE MICROSCOPE/BEAM PROFILER BASED ON DIFFERENTIAL INTERFERENCE CONTRAST AND/OR SURFACE PLASMON ASSISTED INTERFERENCE 有权
标题翻译：基于差分干涉对比和/或表面质谱辅助干扰的片上相位显微镜/光束分布器
公开(公告)号：US20110063623A1
公开(公告)日：2011-03-17
申请号：US12823201
申请日：2010-06-25
申请人： Xiquan Cui , Xin Heng , Changhuei Yang , Axel Scherer , Demetri Psaltis
发明人： Xiquan Cui , Xin Heng , Changhuei Yang , Axel Scherer , Demetri Psaltis
IPC分类号： G01B9/02
CPC分类号： G02B21/0056 , G01N21/553 , G02B21/18 , G02B21/361
摘要： A differential interference contrast (DIC) determination device and method utilizes an illumination source, a layer having a pair of two apertures that receive illumination from the illumination source, and a photodetector to receive Young's interference from the illumination passing through the pair of two apertures. In addition, a surface wave assisted optofluidic microscope and method utilize an illumination source, a fluid channel having a layer with at least one aperture as a surface, and a photodetector that receives a signal based on the illumination passing through the aperture. The layer is corrugated (e.g., via fabrication) and parameters of the corrugation optimize the signal received on the photodetector.
摘要翻译：差分干涉对比度（DIC）确定装置和方法利用照明源，具有一对两个孔的层，其接收来自照明源的照明，以及光电检测器，用于接收来自穿过该对两个孔的照明的杨氏干扰。此外，表面波辅助光流体显微镜和方法利用照明源，具有至少一个孔的层作为表面的流体通道，以及基于穿过孔的照明而接收信号的光电检测器。该层是波纹状的（例如通过制造），并且波纹的参数优化了在光电检测器上接收的信号。

10. 发明授权

US07768654B2 On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference 有权
标题翻译：基于差分干涉对比和/或表面等离子体辅助干涉的片上相位显微镜/光束轮廓仪
公开(公告)号：US07768654B2
公开(公告)日：2010-08-03
申请号：US11743581
申请日：2007-05-02
申请人： Xiquan Cui , Xin Heng , Changhuei Yang , Axel Scherer , Demetri Psaltis
发明人： Xiquan Cui , Xin Heng , Changhuei Yang , Axel Scherer , Demetri Psaltis
IPC分类号： G01B9/02
CPC分类号： G02B21/0056 , G01N21/553 , G02B21/18 , G02B21/361
摘要： A differential interference contrast (DIC) determination device and method utilizes an illumination source, a layer having a pair of two apertures that receive illumination from the illumination source, and a photodetector to receive Young's interference from the illumination passing through the pair of two apertures. In addition, a surface plasmon assisted optofluidic microscope and method utilize an illumination source, a fluid channel having a layer with at least one aperture as a surface, and a photodetector that receives a signal based on the illumination passing through the aperture. The layer is corrugated (e.g., via fabrication) and parameters of the corrugation optimize the signal received on the photodetector.
摘要翻译：差分干涉对比度（DIC）确定装置和方法利用照明源，具有一对两个孔的层，其接收来自照明源的照明，以及光电检测器，用于接收来自穿过该对两个孔的照明的杨氏干扰。此外，表面等离子体激元辅助光流体显微镜和方法利用照明源，具有至少一个孔的层作为表面的流体通道，以及基于穿过孔的照明而接收信号的光电检测器。该层是波纹状的（例如通过制造），并且波纹的参数优化了在光电检测器上接收的信号。

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