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    • 7. 发明授权
    • Rapid sample exchange for miniaturized NMR spectrometer
    • 用于小型化NMR光谱仪的快速样品交换
    • US08754646B2
    • 2014-06-17
    • US13171230
    • 2011-06-28
    • John C. PriceCharles MillerErick Winston
    • John C. PriceCharles MillerErick Winston
    • G01V3/00
    • G01R33/307G01R33/302G01R33/445
    • A method is provided for acquiring multiple NMR response signal data in rapid succession for averaging NMR spectral data from a sample. The fluid sample is placed in a capillary that extends through the magnetic field of the NMR spectrometer, including through the center of the magnetic field to place a segment of the sample in the magnetic center. After the sample fluid, initially magnetized by the magnetic field, is activated to emit an NMR pulse signal, the fluid in the capillary is advanced rapidly to put another pre-magnetized segment of the sample fluid in the fluid center, acquiring an NRM pulse signal, and continuing the cycle until a desired number of NMR response data signals from the sample have been acquired. Those response data from multiple acquisitions are then averaged.
    • 提供一种快速连续获取多个NMR响应信号数据的方法,用于对来自样品的NMR光谱数据进行平均。 将流体样品置于穿过NMR光谱仪的磁场的毛细管中,包括通过磁场的中心,将样品的一段放置在磁性中心。 在初始被磁场磁化的样品流体被激活以发射NMR脉冲信号之后,毛细管中的流体被快速前进,以将样品流体的另一个预先磁化的区段放在流体中心,获得NRM脉冲信号 并继续循环,直到获得了来自样品的所需数量的NMR响应数据信号。 然后对来自多次获取的响应数据进行平均。
    • 8. 发明申请
    • Method and apparatus for Terminating A Test Signal Applied To Multiple Semiconductor Loads Under Test
    • 用于终止被测试的多个半导体负载的测试信号的方法和装置
    • US20100253374A1
    • 2010-10-07
    • US12416375
    • 2009-04-01
    • Guang ChenCharles MillerDavid Pritzkau
    • Guang ChenCharles MillerDavid Pritzkau
    • G01R31/02G01R31/26
    • G01R31/31905
    • Apparatus for terminating a test signal applied to multiple semiconductor loads under test is described—for example apparatus for interfacing a test signal between a tester and a semiconductor device under test (DUT). In some examples, a probe card assembly may include at least one probe substrate each having test probes configured to contact test features of a DUT; a wiring substrate, coupled to the at least one probe substrate, having a connector configured for coupling with a source termination of a tester; a signal path formed on and/or in the wiring substrate and the at least one probe substrate, the signal path having a trace and trace stubs fanning out from the trace, an input of the trace being coupled to the connector and outputs of the trace stubs being coupled to the test probes; and a resistive termination coupled between the trace and at least one potential.
    • 描述了用于终止施加到被测试的多个半导体负载的测试信号的装置,例如用于在测试器和待测半导体器件(DUT)之间接合测试信号的装置。 在一些示例中,探针卡组件可以包括至少一个探针基板,每个探针基板具有被配置为接触DUT的测试特征的测试探针; 耦合到所述至少一个探针衬底的布线衬底,具有被配置为与测试器的源端接耦合的连接器; 形成在布线基板和至少一个探针基板上和/或布线基板和至少一个探针基板上的信号路径,该信号路径具有从迹线扇出的迹线和迹线短线,迹线的输入耦合到连接器和迹线的输出 桩被耦合到测试探针; 以及耦合在迹线和至少一个电位之间的电阻终端。