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    • 7. 发明专利
    • FORMATION OF MULTILAYER FILM AND ITS FORMING DEVICE
    • JPH04323362A
    • 1992-11-12
    • JP8836691
    • 1991-04-19
    • ULVAC CORP
    • UKISHIMA YOSHIYUKIONO SHINICHIMASUDA YUKIO
    • C23C14/06C23C14/24C23C14/56H01L21/31H01L21/312
    • PURPOSE:To form a multilayer film at an optional position on a substrate at the time of vapor-depositing the multilayer film on the substrate in a vacuum chamber by arranging a mask of specified shape on the substrate surface and vapor-depositing materials from plural sources through the openings of the mask. CONSTITUTION:The vaporization sources 3-6 provided respectively with shutters 14-16 are arranged in a vacuum chamber 1, and the substrate 1 is opposed to the sources. The sources 3-6 are heated to the respective vaporizing temps. by an electron beam 7 or a heater 8, the shutters 14-16 are successively and separately opened to successively form the films of the materials from the sources 3-6 on the substrate 9. In this case, an inclined face at an angle increasing toward the substrate is provided on the front surface of the substrate 9, a mask 13 pierced with the openings 12 having a shape conforming to that of the film to be formed on the substrate 9 is arranged, the materials X, Y, Z and X are vapor-deposited on the substrate 9 from different angles through the mask 13, and the film of the sources 3-6 is efficiently formed at the optional position of the substrate 9.
    • 8. 发明专利
    • CONTINUOUS TYPE SPUTTERING DEVICE
    • JPH03191063A
    • 1991-08-21
    • JP33235089
    • 1989-12-20
    • ULVAC CORP
    • NAGASAWA SHOJIHIRANO HIROYUKIONO SHINICHI
    • C23C14/56
    • PURPOSE:To prevent the inflow of gases to a film forming treatment section and to prevent the degradation in film quality by providing a differential pressure mechanism to drop the pressure in a 2nd heating section in the device having a charging section, a heating chamber and the film forming treatment section having the 2nd and 3rd heating sections. CONSTITUTION:A substrate 18 is charged together with a substrate holder 19 into the charging chamber 11 and is heated by a heater 11a; thereafter, the substrate is sent into the heating chamber 12 and is subjected to degassing by a heater 12a in the 1st heating section. The substrate is in succession sent into a process chamber 13 where the substrate is heated by a heater 13a and a heater 13b of the 2nd and 3rd heating sections in this order; thereafter, the film is formed by sputtering on the substrate 18 in the film forming treatment chamber 13c. The substrate is then sent into a take-out chamber 14. A partition plate 20 which is the differential pressure mechanism is provided between the heater 13a and heater 13b of this process chamber 13 and an aperture 21 is formed therein. The inside of the process chamber 13 is evacuated to a vacuum by a vacuum pump 17c. The inflow of the gases generated from the substrate 18 and the holder 19 at the time of heating the substrate 18 with the heater 13b into the film forming treatment chamber 13c is obviated in this way and the formation of the thin film is not adversely affected.