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    • 1. 发明授权
    • Global statistical optimization, characterization, and design
    • 全局统计优化,表征和设计
    • US08024682B2
    • 2011-09-20
    • US12396972
    • 2009-03-03
    • Trent Lorne McConaghyPat DrennanJoel CooperJeffrey DyckDavid CalleleShawn RusawSamer SallamJiangdon GeAnthony ArklesKristopher BreenSean Cocks
    • Trent Lorne McConaghyPat DrennanJoel CooperJeffrey DyckDavid CalleleShawn RusawSamer SallamJiangdon GeAnthony ArklesKristopher BreenSean Cocks
    • G06F17/50
    • G06F17/5063
    • For application to analog, mixed-signal, and custom digital circuits, a system and method to do: global statistical optimization (GSO), global statistical characterization (GSC), global statistical design (GSD), and block-specific design. GSO can perform global yield optimization on hundreds of variables, with no simplifying assumptions. GSC can capture and display mappings from design variables to performance, across the whole design space. GSC can handle hundreds of design variables in a reasonable time frame, e.g., in less than a day, for a reasonable number of simulations, e.g., less than 100,000. GSC can capture design variable interactions and other possible nonlinearities, explicitly capture uncertainties, and intuitively display them. GSD can support the user's exploration of design-to-performance mappings with fast feedback, thoroughly capturing design variable interactions in the whole space, and allow for more efficiently created, more optimal designs. Block-specific design should make it simple to design small circuit blocks, in less time and with lower overhead than optimization through optimization.
    • 对于应用于模拟,混合信号和定制数字电路的系统和方法:全局统计优化(GSO),全局统计特征(GSC),全局统计设计(GSD)和块特定设计。 GSO可以对数百个变量执行全局收益优化,而不需要简化假设。 GSC可以在整个设计空间中捕获并显示从设计变量到性能的映射。 GSC可以在合理的时间范围内处理数百个设计变量,例如在不到一天的时间内,对于合理数量的模拟,例如小于100,000。 GSC可以捕获设计变量交互和其他可能的非线性,明确地捕获不确定性,并直观显示它们。 GSD可以通过快速反馈支持用户对设计到性能映射的探索,彻底地捕获整个空间中的设计变量交互,并允许更有效地创建,更优化的设计。 块特定设计应使设计小电路块的设计变得简单,在优化过程中,在更短的时间内和更低的开销。
    • 4. 发明申请
    • PROXIMITY-AWARE CIRCUIT DESIGN METHOD
    • 临近电路设计方法
    • US20110055782A1
    • 2011-03-03
    • US12870559
    • 2010-08-27
    • Patrick G. DRENNANRyan SilkJoel CooperJeffrey DyckSamer SallamTrent Lorne McCONAGHY
    • Patrick G. DRENNANRyan SilkJoel CooperJeffrey DyckSamer SallamTrent Lorne McCONAGHY
    • G06F17/50
    • G06F17/5068
    • A method for proximity-aware circuit design where a set of layout constraint values that satisfy predetermined performance or yield goals is determined in accordance with a layout effect model. One of the layout constraint values is then selected as a constraint input to layout design, and a design layout is performed with the selected layout constraint value to provide a semiconductor circuit design for the semiconductor circuit. The set of layout constraint values can be determined by varying an instance parameter of the layout effect model to determine a set of instance parameters that satisfy the at least one predetermined performance or yield goal in accordance with the layout effect model, and determining layout constraints associated with each instance parameter of the set of instance parameters, thus providing a number of candidates in a design space that can be evaluated according to performance and/or yield tradeoffs.
    • 一种用于接近感知电路设计的方法,其中根据布局效应模型确定满足预定性能或产量目标的一组布局约束值。 然后选择布局约束值中的一个作为布局设计的约束输入,并且利用所选择的布局约束值执行设计布局,以为半导体电路提供半导体电路设计。 可以通过改变布局效应模型的实例参数来确定一组布局约束值,以根据布局效应模型来确定满足至少一个预定表现或收益目标的一组实例参数,并且确定相关联的布局约束 与实例参数集合的每个实例参数,从而在可以根据性能和/或产出权衡来评估的设计空间中提供多个候选。
    • 5. 发明授权
    • Method and system for proximity-aware circuit design
    • 接近感知电路设计方法与系统
    • US08281270B2
    • 2012-10-02
    • US12870559
    • 2010-08-27
    • Patrick G. DrennanRyan SilkJoel CooperJeffrey DyckSamer SallamTrent Lome McConaghy
    • Patrick G. DrennanRyan SilkJoel CooperJeffrey DyckSamer SallamTrent Lome McConaghy
    • G06F17/50
    • G06F17/5068
    • A method for proximity-aware circuit design where a set of layout constraint values that satisfy predetermined performance or yield goals is determined in accordance with a layout effect model. One of the layout constraint values is then selected as a constraint input to layout design, and a design layout is performed with the selected layout constraint value to provide a semiconductor circuit design for the semiconductor circuit. The set of layout constraint values can be determined by varying an instance parameter of the layout effect model to determine a set of instance parameters that satisfy the at least one predetermined performance or yield goal in accordance with the layout effect model, and determining layout constraints associated with each instance parameter of the set of instance parameters, thus providing a number of candidates in a design space that can be evaluated according to performance and/or yield tradeoffs.
    • 一种用于接近感知电路设计的方法,其中根据布局效应模型确定满足预定性能或产量目标的一组布局约束值。 然后选择布局约束值中的一个作为布局设计的约束输入,并且利用所选择的布局约束值执行设计布局,以为半导体电路提供半导体电路设计。 可以通过改变布局效应模型的实例参数来确定一组布局约束值,以根据布局效应模型来确定满足至少一个预定表现或收益目标的一组实例参数,并且确定相关联的布局约束 与实例参数集合的每个实例参数,从而在可以根据性能和/或产出权衡来评估的设计空间中提供多个候选。