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    • 2. 发明授权
    • Semiconductor device using positive photosensitive resin composition and process for preparation thereof
    • 使用正型感光性树脂组合物的半导体装置及其制备方法
    • US06235436B1
    • 2001-05-22
    • US09442277
    • 1999-11-17
    • Takashi HiranoToshio BanbaHiroaki MakabeNaoshige TakedaToshiro Takeda
    • Takashi HiranoToshio BanbaHiroaki MakabeNaoshige TakedaToshiro Takeda
    • G03F730
    • G03F7/0226G03F7/0755G03F7/0757Y10S430/107
    • A positive type photosensitive resin composition which comprises (A) 100 parts by weight of a polyamide represented by the general formula (1): wherein X represents a tetravalent aromatic group; Y represents a divalent aromatic group; Z represents a divalent group represented by the formula: in which R1 and R2 represent divalent organic groups and R3 and R4 represent monovalent organic groups; a and b represent molar fractions; a+b=100 mole %; a=60.0-100.0 mole %; b=0-40.0 mole %; and n represents an integer of 2 to 500, (B) 1 to 100 parts by weight of a photosensitive diazoquinone compound and (C)1 to 50 parts by weight of a phenol compound represented by a specific structural formula and/or (D) 0.1 to 20 parts by weight of an organosilicon compound represented by a specific structural formula; and a semiconductor device in which a pattern of a polybenzoxazole resin obtained by using the above photosensitive resin composition is formed in a thickness of 0.1 to 20 &mgr;m on a semiconductor element.
    • 一种正型感光性树脂组合物,其包含(A)100重量份由通式(1)表示的聚酰胺:其中X表示四价芳族基团; Y表示二价芳基; Z表示由下式表示的二价基团:其中R 1和R 2表示二价有机基团,并且R 3和R 4表示一价有机基团; a和b表示摩尔分数; a + b = 100摩尔% a = 60.0-100.0摩尔% b = 0-40.0摩尔% n表示2〜500的整数,(B)1〜100重量份感光性重氮醌化合物和(C)1〜50重量份由特定结构式表示的酚化合物和/或(D) 0.1〜20重量份的由具体结构式表示的有机硅化合物; 以及半导体装置,其中通过使用上述感光性树脂组合物得到的聚苯并恶唑树脂的图案在半导体元件上形成为0.1〜20μm的厚度。
    • 3. 发明授权
    • Positive type photosensitive resin composition and semiconductor device
using the same
    • 正型感光性树脂组合物及使用其的半导体装置
    • US6071666A
    • 2000-06-06
    • US854863
    • 1997-05-12
    • Takashi HiranoToshio BanbaHiroaki MakabeNaoshige TakedaToshiro Takeda
    • Takashi HiranoToshio BanbaHiroaki MakabeNaoshige TakedaToshiro Takeda
    • G03F7/022G03F7/075G03F7/023
    • G03F7/0226G03F7/0755G03F7/0757Y10S430/107
    • A positive type photosensitive resin composition which comprises (A) 100 parts by weight of a polyamide represented by the general formula (1): ##STR1## wherein X represents a tetravalent aromatic group; Y represents a divalent aromatic group; Z represents a group represented by the formula: ##STR2## in which R.sub.1 and R.sub.2 represent organic groups and R.sub.3 and R.sub.4 represent monovalent organic groups; a and b represent molar fractions; a+b=100 mole %; a=60.0-100.0 mole %; b=0-40.0 mole %; and n represents an integer of 2 to 500, (B) 1 to 100 parts by weight of a photosensitive diazoquinone compound and (C) 1 to 50 parts by weight of a phenol compound represented by a specific structural formula and/or (D) 0.1 to 20 parts by weight of an organosilicon compound represented by a specific structural formula; and a semiconductor device in which a pattern of a polybenzoxazole resin obtained by using the above photosensitive resin composition is formed in a thickness of 0.1 to 20 .mu.m on a semiconductor element.
    • 一种正型感光性树脂组合物,其包含(A)100重量份由通式(1)表示的聚酰胺:其中X表示四价芳族基团; Y表示二价芳基; Z表示由下式表示的基团:其中R1和R2表示有机基团,R3和R4表示一价有机基团; a和b表示摩尔分数; a + b = 100摩尔% a = 60.0-100.0摩尔% b = 0-40.0摩尔% n表示2〜500的整数,(B)1〜100重量份感光性重氮醌化合物和(C)1〜50重量份由特定结构式表示的酚化合物和/或(D) 0.1〜20重量份的由具体结构式表示的有机硅化合物; 以及半导体装置,其中通过使用上述感光性树脂组合物得到的聚苯并恶唑树脂的图案在半导体元件上形成为0.1〜20μm的厚度。
    • 5. 发明授权
    • Process for producing photosensitive resin
    • 感光性树脂的制造方法
    • US5648451A
    • 1997-07-15
    • US541582
    • 1995-10-10
    • Nobuyuki SashidaToshio BanbaNaoshige Takeda
    • Nobuyuki SashidaToshio BanbaNaoshige Takeda
    • C07D249/18C08G73/10G03F7/037C08G69/26
    • G03F7/037C07D249/18C08G73/1007
    • A process for producing a photosensitive resin, comprises reacting a diamine with a tetracarboxylic acid tetraester represented by the formula (1) at a temperature of 0.degree. to 50.degree. C. in an aprotic polar solvent: ##STR1## wherein R.sub.1 is a tetravalent organic group; R.sub.2 is a group represented by the formula: ##STR2## in which R.sub.5 is a divalent to hexavalent organic group, R.sub.6 is H or CH.sub.3 and p is an integer of 1 to 5; R.sub.3 is a group represented by --OCH.sub.3, --OC.sub.2 H.sub.5, --OC.sub.3 H.sub.7 or the formula: ##STR3## and R.sub.4 is a group of the formula: ##STR4## the tetracarboxylic acid tetraester of the formula (1) is obtained by subjecting to addition reaction a tetracarboxylic dianhydride, an alcohol compound represented by the formula R.sub.2 H in which R.sub.2 is as defined above and an alcohol compound represented by the formula R.sub.3 H in which R.sub.3 is as defined above and thereafter subjecting the resulting addition reaction product to dehydration-condensation with 1-hydroxy-1,2,3-benzotriazole using a carbodiimide compound as a condensation agent.
    • 一种感光性树脂的制造方法,其特征在于,在0〜50℃的温度下,使二胺与式(1)表示的四羧酸四酯在非质子传递极性溶剂中反应:(1)其中R1为 四价有机基团; R2是由下式表示的基团:其中R5是二价至六价有机基团,R6是H或CH3,p是1至5的整数; R3是由-OCH3,-OC2H5,-OC3H7或式AGE表​​示的基团,式(1)的四羧酸四酯通过将四羧酸二酐,由式R 2 H表示的醇化合物加成 其中R 2如上所定义,和由式R3H表示的醇化合物,其中R3如上定义,然后使用碳二亚胺化合物将所得加成反应产物与1-羟基-1,2,3-苯并三唑进行脱水缩合 作为缩合剂。
    • 6. 发明授权
    • Method for the pattern-processing of photosensitive resin composition
    • 感光性树脂组合物的图案处理方法
    • US06207356B1
    • 2001-03-27
    • US09287118
    • 1999-04-07
    • Toshio BanbaToshiro Takeda
    • Toshio BanbaToshiro Takeda
    • G03F730
    • G03F7/0233G03F7/0757G03F7/322
    • A method of pattern-processing a photosensitive resin composition which comprises coating on a substrate a positive photosensitive resin composition of a polyamide of formula (1) below and a diazoquinone compound, subjecting the same to prebaking and then to irradiation with light, thereafter dissolving the exposed portion in an alkaline aqueous solution containing an alkylbenzenesulfonic acid to remove the same, thereby obtaining a pattern. wherein X is a tetravalent aromatic group; Y is a divalent aromatic group; Z is in which R1 and R2 are divalent organic groups and R3 and R4 are nonvalent organic groups; a and b are mole fractions; a+b=100 mole %; a=60.0-100 mole %; b=0-40.0 mole % and n=2-500. When the development is effected with the alkaline aqueous solution containing the alkylbenzenesulfonic acid, a scum-free, very high resolution pattern is obtained.
    • 一种感光性树脂组合物的图案处理方法,其特征在于,在基材上涂布下述式(1)的聚酰胺的正型感光性树脂组合物和重氮醌化合物,使其进行预烘烤,然后用光照射, 暴露部分在含有烷基苯磺酸的碱性水溶液中以除去它,从而获得图案。其中X是四价芳族基团; Y为二价芳基; 其中R1和R2是二价有机基团,R3和R4是非常有机基团; a和b是摩尔分数; a + b = 100摩尔% a = 60.0-100摩尔% b = 0-40.0摩尔%,n = 2-500。 当用含有烷基苯磺酸的碱性水溶液进行显影时,获得无浮渣,非常高的分辨率图案。
    • 7. 发明申请
    • POSITIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, CURED FILM, PROTECTIVE FILM, INSULATING FILM, AND SEMICONDUCTOR DEVICE
    • 阳离子型感光树脂组合物,固化膜,保护膜,绝缘膜和半导体器件
    • US20100239977A1
    • 2010-09-23
    • US12669565
    • 2008-08-08
    • Toshio Banba
    • Toshio Banba
    • G03F7/004
    • G03F7/0233G03F7/40
    • A positive-type photosensitive resin composition includes (A) a polyamide resin that includes a structural unit shown by the following formula (1) and a structural unit shown by the following formula (2), and (B) a photosensitive compound, the polyamide resin (A) having a weight average molecular weight (Mw) of 5000 to 80,000, and a cured film obtained by curing the positive-type photosensitive resin composition at 250° C. having a tensile modulus of elasticity of 2.0 to 4.0 GPa and a tensile elongation of 10 to 100%. According to the present invention, a positive-type photosensitive resin composition that can be cured at a low temperature and a highly reliable semiconductor device including a cured film of the positive-type photosensitive resin composition can be provided.
    • 正型感光性树脂组合物包括(A)包含下式(1)所示的结构单元和下述式(2)所示的结构单元的聚酰胺树脂,(B)感光性化合物,聚酰胺 重均分子量(Mw)为5000〜80,000的树脂(A)和通过使正型感光性树脂组合物在250℃下固化而得到的固化膜,拉伸弹性模量为2.0〜4.0GPa, 拉伸伸长率为10〜100%。 根据本发明,可以提供能够在低温下固化的正型感光性树脂组合物和包含正型感光性树脂组合物的固化膜的高可靠性的半导体装置。
    • 8. 发明授权
    • Positive photosensitive resin compositions and semiconductor device
    • 正型感光性树脂组合物和半导体装置
    • US06927013B2
    • 2005-08-09
    • US10474831
    • 2002-04-30
    • Toshio BanbaHiroaki MakabeTakashi Hirano
    • Toshio BanbaHiroaki MakabeTakashi Hirano
    • G03F7/022G03F7/023G03F7/075G03F7/039
    • G03F7/037G03F7/022G03F7/0233G03F7/0757
    • The present invention provides a positive-working photosensitive resin composition with high sensitivity that gives a pattern having a high resolution and a high film thickness retention rate. In other words, the present invention provides a positive-working photosensitive resin composition comprising 100 parts by weight of a polyamide and 1 to 50 parts by weight of a photosensitive material, that is, a 1,2-naphthoquinone-2-diazide-5-sulfonate ester compound or a 1,2-naphthoquinone-2-diazide-4-sulfonate ester compound of a phenol compound. In addition, the present invention provides a positive-working photosensitive resin composition comprising 100 parts by weight of a polyamide, 1 to 50 parts by weight of a photosensitive material, that is, a 1,2-naphthoquinone-2-diazide-5-sulfonate ester compound or a 1,2-naphthoquinone-2-diazide-4-sulfonate ester compound of a phenol compound and 1 to 30 parts by weight of a phenol compound. Furthermore, the present invention provides a semiconductor device manufactured by using said positive-working photosensitive resin composition.
    • 本发明提供一种具有高灵敏度的正性感光性树脂组合物,其具有高分辨率和高膜厚保持率的图案。 换句话说,本发明提供一种正性感光性树脂组合物,其包含100重量份的聚酰胺和1至50重量份的感光材料,即1,2-萘醌-2-重氮化物-5 - 磺酸酯化合物或酚化合物的1,2-萘醌-2-重氮化物-4-磺酸酯化合物。 此外,本发明提供一种正性感光性树脂组合物,其包含100重量份的聚酰胺,1至50重量份的感光材料,即1,2-萘醌-2-重氮基-5- 磺酸酯化合物或酚化合物的1,2-萘醌-2-二叠氮-4-磺酸酯化合物和1〜30重量份苯酚化合物。 此外,本发明提供了通过使用所述正性感光性树脂组合物制造的半导体器件。