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    • 1. 发明授权
    • Methods of sampling specimens for microanalysis
    • 微量分析样品取样方法
    • US06700121B1
    • 2004-03-02
    • US10428372
    • 2003-05-01
    • Thomas F. KellyRichard L. MartensSteven L. Goodman
    • Thomas F. KellyRichard L. MartensSteven L. Goodman
    • G01N132
    • G01N1/32Y10T436/25
    • Methods of sampling specimens for microanalysis, particularly microanalysis by atom probe microscopy, include steps of forming a study specimen in a first study object (as by use of focused ion beam milling); removing the study specimen from the study object; situating the study specimen on a second study object; and microanalyzing the study specimen. Where the first study object is of particular interest for study, the study specimen may be taken from a functional portion of the first study object so that microanalysis will provide information regarding this functional portion. Where the second study object is of particular interest for study, the second study object may be subjected to manufacturing processes (e.g., deposition of layers of materials) after the study specimen is situated thereon so that the study specimen will provide information regarding the results of the manufacturing process. The study specimen may have study regions formed thereon which are particularly suitable for study by atom probes, e.g., regions bearing raised protrusions, at virtually any point during the process, thereby greatly enhancing the speed and efficiency of specimen preparation.
    • 用于微量分析的样品取样方法,特别是通过原子探针显微镜进行微量分析的方法包括在第一研究对象中(如通过使用聚焦离子束研磨)形成研究样品的步骤; 从研究对象中取出研究标本; 将研究样本置于第二个研究对象上; 并微观分析研究样本。 如果第一研究对象对于研究特别感兴趣,则研究样本可以从第一研究对象的功能部分获取,使得微量分析将提供关于该功能部分的信息。 在第二研究对象特别感兴趣的研究中,第二研究对象可以在研究样本位于其上之后进行制造过程(例如,材料层的沉积),使得研究样本将提供关于 制造过程。 研究样本可以具有在其上形成的研究区域,其特别适合于在原子探针(例如,具有凸起突起的区域)的研究中,在该过程中的几乎任何点,从而大大提高了样品制备的速度和效率。
    • 2. 发明授权
    • Methods of sampling specimens for microanalysis
    • 微量分析样品取样方法
    • US06576900B2
    • 2003-06-10
    • US09861405
    • 2001-05-18
    • Thomas F. KellyRichard L. MartensSteven L. Goodman
    • Thomas F. KellyRichard L. MartensSteven L. Goodman
    • G01N132
    • G01N1/32Y10T436/25
    • Methods of sampling specimens for microanalysis, particularly microanalysis by atom probe microscopy, include steps of forming a study specimen in a first study object (as by use of focused ion beam milling); removing the study specimen from the study object; situating the study specimen on a second study object; and microanalyzing the study specimen. Where the first study object is of particular interest for study, the study specimen may be taken from a functional portion of the first study object so that microanalysis will provide information regarding this functional portion. Where the second study object is of particular interest for study, the second study object may be subjected to manufacturing processes (e.g., deposition of layers of materials) after the study specimen is situated thereon so that the study specimen will provide information regarding the results of the manufacturing process. The study specimen may have study regions formed thereon which are particularly suitable for study by atom probes, e.g., regions bearing raised protrusions, at virtually any point during the process, thereby greatly enhancing the speed and efficiency of specimen preparation.
    • 用于微量分析的样品取样方法,特别是通过原子探针显微镜进行微量分析的方法包括在第一研究对象中(如通过使用聚焦离子束研磨)形成研究样品的步骤; 从研究对象中取出研究标本; 将研究样本置于第二个研究对象上; 并微观分析研究样本。 如果第一研究对象对于研究特别感兴趣,则研究样本可以从第一研究对象的功能部分获取,使得微量分析将提供关于该功能部分的信息。 在第二研究对象特别感兴趣的研究中,第二研究对象可以在研究样本位于其上之后进行制造过程(例如,材料层的沉积),使得研究样本将提供关于 制造过程。 研究样本可以具有在其上形成的研究区域,其特别适合于在原子探针(例如,具有凸起突起的区域)的研究中,在该过程中的几乎任何点,从而大大提高了样品制备的速度和效率。
    • 3. 发明申请
    • SPECIMENS FOR MICROANALYSIS PROCESSES
    • 微观分析方法样本
    • US20100152052A1
    • 2010-06-17
    • US11997141
    • 2006-07-28
    • Steven L. GoodmanThomas F. KellyTerri J. Tomicki
    • Steven L. GoodmanThomas F. KellyTerri J. Tomicki
    • C40B30/00C12Q1/70C12Q1/02G01N1/00C40B50/14
    • G01N1/36Y10T436/2525
    • The present invention relates to specimens for use in microanalysis processes. One aspect of the invention is directed toward using a mold to form specimens for a microanalysis process (e.g., including an atom probe and/or transmission electron microscope processes). Other aspects of the invention are directed towards embedding specimen material (e.g., including nanoparticles) in an embedment material to produce a specimen suitable for use in a microanalysis process. Still other aspects include combining specimen material with an embedment material to enhance a microanalysis process. Yet other embodiments of the invention are directed toward combining a specimen material with multiple embedment materials to produce specimens suitable for a microanalysis process. Further aspects of the invention are directed toward analyzing at least a portion of a specimen produced by one or more of the processes discussed above.
    • 本发明涉及用于微量分析方法的试样。 本发明的一个方面涉及使用模具来形成用于微量分析方法的样品(例如,包括原子探针和/或透射电子显微镜方法)。 本发明的其它方面涉及将样品材料(例如,包括纳米颗粒)嵌入到嵌入材料中以产生适合用于微量分析过程的试样。 还有一些方面包括将样品材料与嵌入材料组合以增强微量分析过程。 本发明的其它实施方案涉及将样品材料与多种嵌入材料组合以产生适于微量分析工艺的试样。 本发明的另外方面涉及分析由上述一个或多个过程产生的样本的至少一部分。
    • 6. 发明申请
    • DEVICE FOR HOLDING ELECTRON MICROSCOPE GRIDS AND OTHER MATERIALS
    • 用于保持电子显微镜网格和其他材料的装置
    • US20120006711A1
    • 2012-01-12
    • US13043220
    • 2011-03-08
    • Steven L. GoodmanJack LaSeeMark T. Nelson
    • Steven L. GoodmanJack LaSeeMark T. Nelson
    • B65D85/48
    • H01J37/20H01J2237/2007H01J2237/201
    • A device for holding a specimen holder, the device including a body with a slot formed therein. The slot includes an interior for receiving the specimen holder which may be a flat disk with edges and a pair of opposing sides. The disk may be made of a resilient deformable material. The slot may be sized to receive the specimen holder through an open top end and may taper from top bottom, such that the bottom end of the slot is smaller than the specimen holder. The slot further configured to contact the specimen holder along edges of the specimen holder and to allow some sideways deformation of the specimen holder without either side of the specimen holder distant from the edges coming into contact with the interior of the slot.
    • 一种用于保持试样保持器的装置,该装置包括其中形成有槽的主体。 狭槽包括用于容纳样品架的内部,其可以是具有边缘的平板和一对相对的侧面。 盘可以由弹性可变形材料制成。 狭槽的尺寸可以通过敞开的顶端容纳样品架,并且可以从顶部底部逐渐变细,使得狭槽的底端小于样品架。 所述槽进一步构造成沿着所述试样保持器的边缘接触所述试样保持器,并且允许所述试样保持器的一些侧向变形,而所述试样保持器的任何一侧远离所述边缘与所述槽的内部接触。
    • 7. 发明申请
    • DEVICE FOR PREPARING MICROSCOPY SAMPLES
    • 制备微观样品的装置
    • US20080068707A1
    • 2008-03-20
    • US11752570
    • 2007-05-23
    • Steven L. Goodman
    • Steven L. Goodman
    • G02B21/00
    • G01N1/31B01L3/0275B01L3/502B01L2300/042B01L2300/0609B01L2300/0681G01N1/36G01N2035/0427G01N2035/1048G02B21/34H01J2237/20H01J2237/2007H01J2237/201
    • A device, method and system for preparing and storing samples for microscopic analysis is disclosed. The device provides a reservoir that can be attached to a displacement pipette thereby filling the reservoir with reagents desired for preparing the samples for microscopic analysis. In some embodiments, the specimen may be contained on a transmission electron microscope (TEM) grid. In other embodiments, the sample may be a light microscope (LM) specimen or a scanning electron microscope (SEM) specimen. In yet another embodiment, the invention provides a method of preparing samples for microscopic examination including a device for preparing TEM grids with, a device for preparing TEM, SEM or LM specimens with and a device for storing both grids and specimens in. In yet another embodiment, the invention provides a system for tracking the preparation, analysis and histological evaluation of multiple samples while also providing for their long term storage.
    • 公开了用于制备和存储用于显微镜分析的样品的装置,方法和系统。 该装置提供一个可以连接到移液移液管的储液器,从而用准备用于显微镜分析的样品所需的试剂填充储存器。 在一些实施例中,样品可以包含在透射电子显微镜(TEM)网格上。 在其他实施方案中,样品可以是光学显微镜(LM)样品或扫描电子显微镜(SEM)样品。 在另一个实施方案中,本发明提供了一种制备用于显微镜检查的样品的方法,包括用于制备TEM格栅的装置,用于制备TEM,SEM或LM样品的装置以及用于储存两个栅格和标本的装置。另外 本发明提供了一种用于跟踪多个样品的制备,分析和组织学评估的系统,同时还提供其长期储存。
    • 9. 发明授权
    • Device for holding electron microscope grids and other materials
    • 用于保存电子显微镜网格和其他材料的装置
    • US08507876B2
    • 2013-08-13
    • US13043220
    • 2011-03-08
    • Steven L. GoodmanJack LaSeeMark T. Nelson
    • Steven L. GoodmanJack LaSeeMark T. Nelson
    • B65D85/48G21K5/08G21K5/10
    • H01J37/20H01J2237/2007H01J2237/201
    • A device for holding a specimen holder, the device including a body with a slot formed therein. The slot includes an interior for receiving the specimen holder which may be a flat disk with edges and a pair of opposing sides. The disk may be made of a resilient deformable material. The slot may be sized to receive the specimen holder through an open top end and may taper from top bottom, such that the bottom end of the slot is smaller than the specimen holder. The slot further configured to contact the specimen holder along edges of the specimen holder and to allow some sideways deformation of the specimen holder without either side of the specimen holder distant from the edges coming into contact with the interior of the slot.
    • 一种用于保持试样保持器的装置,该装置包括其中形成有槽的主体。 狭槽包括用于容纳样品架的内部,其可以是具有边缘的平板和一对相对的侧面。 盘可以由弹性可变形材料制成。 狭槽的尺寸可以通过敞开的顶端容纳样品架,并且可以从顶部底部逐渐变细,使得狭槽的底端小于样品架。 所述槽进一步构造成沿着所述试样保持器的边缘接触所述试样保持器,并且允许所述试样保持器的一些侧向变形,而所述试样保持器的任何一侧远离所述边缘与所述槽的内部接触。