专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20100152052A1 SPECIMENS FOR MICROANALYSIS PROCESSES 审中-公开
标题翻译：微观分析方法样本
公开(公告)号：US20100152052A1
公开(公告)日：2010-06-17
申请号：US11997141
申请日：2006-07-28
申请人： Steven L. Goodman , Thomas F. Kelly , Terri J. Tomicki
发明人： Steven L. Goodman , Thomas F. Kelly , Terri J. Tomicki
IPC分类号： C40B30/00 , C12Q1/70 , C12Q1/02 , G01N1/00 , C40B50/14
CPC分类号： G01N1/36 , Y10T436/2525
摘要： The present invention relates to specimens for use in microanalysis processes. One aspect of the invention is directed toward using a mold to form specimens for a microanalysis process (e.g., including an atom probe and/or transmission electron microscope processes). Other aspects of the invention are directed towards embedding specimen material (e.g., including nanoparticles) in an embedment material to produce a specimen suitable for use in a microanalysis process. Still other aspects include combining specimen material with an embedment material to enhance a microanalysis process. Yet other embodiments of the invention are directed toward combining a specimen material with multiple embedment materials to produce specimens suitable for a microanalysis process. Further aspects of the invention are directed toward analyzing at least a portion of a specimen produced by one or more of the processes discussed above.
摘要翻译：本发明涉及用于微量分析方法的试样。本发明的一个方面涉及使用模具来形成用于微量分析方法的样品（例如，包括原子探针和/或透射电子显微镜方法）。本发明的其它方面涉及将样品材料（例如，包括纳米颗粒）嵌入到嵌入材料中以产生适合用于微量分析过程的试样。还有一些方面包括将样品材料与嵌入材料组合以增强微量分析过程。本发明的其它实施方案涉及将样品材料与多种嵌入材料组合以产生适于微量分析工艺的试样。本发明的另外方面涉及分析由上述一个或多个过程产生的样本的至少一部分。

IPRDB

热门服务

关于我们

友情链接

联系方式