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    • 3. 发明授权
    • Semiconductor device with an oxygen diffusion barrier layer formed from a composite nitride
    • 具有由复合氮化物形成的氧扩散阻挡层的半导体器件
    • US06753566B2
    • 2004-06-22
    • US10441118
    • 2003-05-20
    • Toshie KutsunaiShinichiro HayashiTakumi MikawaYuji Judai
    • Toshie KutsunaiShinichiro HayashiTakumi MikawaYuji Judai
    • H01L27108
    • H01L28/55
    • An impurity diffusion layer serving as the source or the drain of a transistor is formed in a semiconductor substrate, and a protection insulating film is formed so as to cover the transistor. A capacitor lower electrode, a capacitor dielectric film of an oxide dielectric film and a capacitor upper electrode are successively formed on the protection insulating film. A plug for electrically connecting the impurity diffusion layer of the transistor to the capacitor lower electrode is buried in the protection insulating film. An oxygen barrier layer is formed between the plug and the capacitor lower electrode. The oxygen barrier layer is made from a composite nitride that is a mixture or an alloy of a first nitride having a conducting property and a second nitride having an insulating property.
    • 在半导体衬底中形成用作晶体管的源极或漏极的杂质扩散层,形成覆盖晶体管的保护绝缘膜。 在保护绝缘膜上依次形成电容器下电极,氧化物电介质膜的电容电介质膜和电容器上电极。 用于将晶体管的杂质扩散层电连接到电容器下电极的插头埋入保护绝缘膜中。 在塞子和电容器下电极之间形成氧阻隔层。 氧阻隔层由作为具有导电性的第一氮化物和具有绝缘性的第二氮化物的混合物或合金的复合氮化物制成。
    • 5. 发明授权
    • Semiconductor device and method for fabricating the same
    • 半导体装置及其制造方法
    • US06723637B2
    • 2004-04-20
    • US10441128
    • 2003-05-20
    • Toshie KutsunaiShinichiro HayashiTakumi MikawaYuji Judai
    • Toshie KutsunaiShinichiro HayashiTakumi MikawaYuji Judai
    • H01L214763
    • H01L28/55
    • An impurity diffusion layer serving as the source or the drain of a transistor is formed in a semiconductor substrate, and a protection insulating film is formed so as to cover the transistor. A capacitor lower electrode, a capacitor dielectric film of an oxide dielectric film and a capacitor upper electrode are successively formed on the protection insulating film. A plug for electrically connecting the impurity diffusion layer of the transistor to the capacitor lower electrode is buried in the protection insulating film. An oxygen barrier layer is formed between the plug and the capacitor lower electrode. The oxygen barrier layer is made from a composite nitride that is a mixture or an alloy of a first nitride having a conducting property and a second nitride having an insulating property.
    • 在半导体衬底中形成用作晶体管的源极或漏极的杂质扩散层,形成覆盖晶体管的保护绝缘膜。 在保护绝缘膜上依次形成电容器下电极,氧化物电介质膜的电容电介质膜和电容器上电极。 用于将晶体管的杂质扩散层电连接到电容器下电极的插头埋入保护绝缘膜中。 在塞子和电容器下电极之间形成氧阻隔层。 氧阻隔层由作为具有导电性的第一氮化物和具有绝缘性的第二氮化物的混合物或合金的复合氮化物制成。
    • 6. 发明授权
    • Semiconductor device with oxygen diffusion barrier layer termed from composite nitride
    • 具有氧复合氮化物的氧扩散阻挡层的半导体器件
    • US06590252B2
    • 2003-07-08
    • US09921884
    • 2001-08-06
    • Toshie KutsunaiShinichiro HayashiTakumi MikawaYuji Judai
    • Toshie KutsunaiShinichiro HayashiTakumi MikawaYuji Judai
    • H01L27108
    • H01L28/55
    • An impurity diffusion layer serving as the source or the drain of a transistor is formed in a semiconductor substrate, and a protection insulating film is formed so as to cover the transistor. A capacitor lower electrode, a capacitor dielectric film of an oxide dielectric film and a capacitor upper electrode are successively formed on the protection insulating film. A plug for electrically connecting the impurity diffusion layer of the transistor to the capacitor lower electrode is buried in the protection insulating film. An oxygen barrier layer is formed between the plug and the capacitor lower electrode. The oxygen barrier layer is made from a composite nitride that is a mixture or an alloy of a first nitride having a conducting property and a second nitride having an insulating property.
    • 在半导体衬底中形成用作晶体管的源极或漏极的杂质扩散层,形成覆盖晶体管的保护绝缘膜。 在保护绝缘膜上依次形成电容器下电极,氧化物电介质膜的电容电介质膜和电容器上电极。 用于将晶体管的杂质扩散层电连接到电容器下电极的插头埋入保护绝缘膜中。 在塞子和电容器下电极之间形成氧阻隔层。 氧阻隔层由作为具有导电性的第一氮化物和具有绝缘性的第二氮化物的混合物或合金的复合氮化物制成。
    • 9. 发明授权
    • Assembling construction of clip to mountable member
    • 夹子安装构件的组装
    • US08671528B2
    • 2014-03-18
    • US13377506
    • 2010-05-25
    • Shinichiro Hayashi
    • Shinichiro Hayashi
    • A44B1/04
    • F16B5/0657F16B5/065F16B21/086
    • An assembling construction assembles a mountable member to a support member by holding a head portion of a clip on a mounting seat of the mountable member while securely fitting a leg portion in a mounting hole in the support member, the mounting seat has an instruction groove and guide grooves, the head portion of the clip has a first flange portion beam-like strip-shaped elastic pieces and which are brought into press contact with end portions of the guide grooves and stopper projections which are adapted to be brought into engagement with the end portions of the guide grooves when the clip is attempted to be shifted largely relative to the mounting seat.
    • 组装结构通过将夹子的头部保持在可安装构件的安装座上,同时将腿部牢固地安装在支撑构件的安装孔中,将安装构件组装到支撑构件上,安装座具有指示槽和 引导槽,夹子的头部具有第一凸缘部分的束状条状弹性片,并与引导槽和止动突起的端部压接,这些端部适于与端部 当试图夹子相对于安装座大幅偏移时,引导槽的部分。
    • 10. 发明授权
    • Measurement apparatus and measurement method
    • 测量仪器及测量方法
    • US08492718B2
    • 2013-07-23
    • US13485686
    • 2012-05-31
    • Yuichi OgawaShinichiro HayashiEiji Kato
    • Yuichi OgawaShinichiro HayashiEiji Kato
    • G01T1/17G01T7/00
    • G01N21/3581G01N21/95692H01L31/0232H01L31/101
    • There is provided a measuring apparatus including a space arrangement structure that includes space regions surrounded by conductors in a plane, an electromagnetic wave emitter that emits electromagnetic waves towards an object held by the space arrangement structure, and an electromagnetic wave detector that measures the electromagnetic waves that have passed through the space arrangement structure. Here, characteristics of the object are measured by measuring the electromagnetic waves that have passed through the space arrangement structure. The electromagnetic waves emitted from the electromagnetic wave emitter towards the space arrangement structure are incident on the plane containing the space regions at an angle, and the electromagnetic waves that have passed through the space arrangement structure are measured.
    • 提供了一种测量装置,包括:空间布置结构,包括由平面内的导体包围的空间区域;朝向由所述空间布置结构保持的物体发射电磁波的电磁波发射器;以及测量电磁波的电磁波检测器 已经通过了空间布置结构。 这里,通过测量已经通过空间排列结构的电磁波来测量物体的特性。 从电磁波发射器朝向空间配置结构发射的电磁波以一定角度入射在包含空间区域的平面上,并且测量已经通过空间布置结构的电磁波。