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1. 发明申请

US20140014840A1 TERAHERTZ-WAVE SPECTROMETER 有权
标题翻译： TERAHERTZ波形光谱仪
公开(公告)号：US20140014840A1
公开(公告)日：2014-01-16
申请号：US14005841
申请日：2012-02-21
申请人： Takashi Yasuda , Kouichiro Akiyama , Yoichi Kawada , Atsushi Nakanishi , Hironori Takahashi
发明人： Takashi Yasuda , Kouichiro Akiyama , Yoichi Kawada , Atsushi Nakanishi , Hironori Takahashi
IPC分类号： G01J3/42
CPC分类号： G01J3/42 , G01N21/3581
摘要： In a terahertz-wave spectrometer, a spectroscopic prism is provided with a prism part slidable with respect to a main part thereof. Along the sliding direction, an arrangement surface in an upper face of the prism part is provided with a plurality of arrangement regions K to be arranged with objects to be measured. Therefore, after completing the measurement of optical constants for one object, the prism part is slid, so as to shift the next object onto an optical path of a terahertz wave T, whereby a plurality of objects can be measured smoothly without cleaning the arrangement surface.
摘要翻译：在太赫兹波谱仪中，分光棱镜设置有相对于其主要部分可滑动的棱镜部分。沿着滑动方向，棱镜部的上表面的配置面设置有多个配置区域K，配置有被测量物体。因此，在完成了对于一个物体的光学常数的测量之后，棱镜部分被滑动，以将下一个物体移动到太赫兹波T的光路上，从而能够平滑地测量多个物体，而不需要清洁布置表面。

2. 发明授权

US09080913B2 Terahertz-wave spectrometer and prism member 有权
标题翻译：太赫兹波谱仪和棱镜成员
公开(公告)号：US09080913B2
公开(公告)日：2015-07-14
申请号：US14005849
申请日：2012-02-21
申请人： Takashi Yasuda , Yoichi Kawada , Atsushi Nakanishi , Kouichiro Akiyama , Hironori Takahashi
发明人： Takashi Yasuda , Yoichi Kawada , Atsushi Nakanishi , Kouichiro Akiyama , Hironori Takahashi
IPC分类号： G01J5/02 , G01J3/42 , G01N21/3581 , G01J3/02 , G01N21/552
CPC分类号： G01J3/42 , G01J3/0205 , G01N21/3581 , G01N21/552
摘要： By mating a main part with a first prism part or second prism part, a terahertz-wave spectrometer can easily switch between optical paths of a terahertz wave T propagating within a spectroscopic prism. When the main part mates with the first prism part, the terahertz wave T incident on an entrance surface passes through a depression, so as to be reflected by an arrangement part, whereby reflection spectrometry can be performed. When the main part mates with the second prism part, the terahertz wave T incident on the entrance surface is refracted by the depression, so as to pass through an object to be measured within a groove, whereby transmission spectrometry can be preformed.
摘要翻译：通过将主要部分与第一棱镜部分或第二棱镜部分配合，太赫兹波谱仪可以容易地在分光棱镜内传播的太赫兹波T的光路之间切换。当主体与第一棱镜部分配合时，入射表面上的太赫兹波T穿过凹陷，以便被布置部反射，从而可以进行反射光谱测定。当主要部分与第二棱镜部分配合时，入射表面上的太赫兹波T被凹陷折射，以便在沟槽内通过待测物体，从而可进行透射光谱测定。

3. 发明申请

US20140008541A1 TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD 审中-公开
标题翻译：总反射光谱测量方法
公开(公告)号：US20140008541A1
公开(公告)日：2014-01-09
申请号：US14005863
申请日：2012-02-28
申请人： Kouichiro Akiyama , Yoichi Kawada , Takashi Yasuda , Atsushi Nakanishi , Hironori Takahashi
发明人： Kouichiro Akiyama , Yoichi Kawada , Takashi Yasuda , Atsushi Nakanishi , Hironori Takahashi
IPC分类号： G01J3/42
CPC分类号： G01J3/42 , G01N21/3577 , G01N21/3581 , G01N21/552
摘要： A total reflection measurement method using a total reflection spectrometer 1 is a total reflection measurement method comprising arranging an object to be measured on a total reflection surface 31c of an internal total reflection prism 31 and measuring an optical constant concerning the object 34 according to a terahertz wave totally reflected by the total reflection surface 31c after passing the prism 31, wherein a liquid 50 incapable of dissolving the object 34 is interposed at least between the total reflection surface 31c and the object 34. A force such as an adhesion force acting between the liquid 50 and the object 34 can place the object 34 closer to the total reflection surface 31c, thereby stably generating an interaction between an evanescent component and the object 34.
摘要翻译：使用全反射光谱仪1的全反射测量方法是全反射测量方法，包括在内部全反射棱镜31的全反射表面31c上布置被测物体，并根据太赫兹测量关于物体34的光常数在通过棱镜31之后，由全反射面31c全反射的波形，其中不能溶解物体34的液体50至少插入在全反射面31c和物体34之间。诸如作用在物体34之间的粘附力的力液体50和物体34可以使物体34更靠近全反射面31c，从而稳定地产生ev逝部件与物体34之间的相互作用。

4. 发明授权

US09696206B2 Terahertz-wave spectrometer 有权
公开(公告)号：US09696206B2
公开(公告)日：2017-07-04
申请号：US14005841
申请日：2012-02-21
申请人： Takashi Yasuda , Kouichiro Akiyama , Yoichi Kawada , Atsushi Nakanishi , Hironori Takahashi
发明人： Takashi Yasuda , Kouichiro Akiyama , Yoichi Kawada , Atsushi Nakanishi , Hironori Takahashi
IPC分类号： G01N5/02 , G01J3/42 , G01N21/3581
CPC分类号： G01J3/42 , G01N21/3581
摘要： In a terahertz-wave spectrometer, a spectroscopic prism is provided with a prism part slidable with respect to a main part thereof. Along the sliding direction, an arrangement surface in an upper face of the prism part is provided with a plurality of arrangement regions K to be arranged with objects to be measured. Therefore, after completing the measurement of optical constants for one object, the prism part is slid, so as to shift the next object onto an optical path of a terahertz wave T, whereby a plurality of objects can be measured smoothly without cleaning the arrangement surface.

5. 发明申请

US20140008540A1 TERAHERTZ-WAVE SPECTROMETER AND PRISM MEMBER 有权
标题翻译： TERAHERTZ-WAVE光谱仪和PRISM会员
公开(公告)号：US20140008540A1
公开(公告)日：2014-01-09
申请号：US14005849
申请日：2012-02-21
申请人： Takashi Yasuda , Yoichi Kawada , Atsushi Nakanishi , Kouichiro Akiyama , Hironori Takahashi
发明人： Takashi Yasuda , Yoichi Kawada , Atsushi Nakanishi , Kouichiro Akiyama , Hironori Takahashi
IPC分类号： G01J3/42 , G01J3/02
CPC分类号： G01J3/42 , G01J3/0205 , G01N21/3581 , G01N21/552
摘要： By mating a main part with a first prism part or second prism part, a terahertz-wave spectrometer can easily switch between optical paths of a terahertz wave T propagating within a spectroscopic prism. When the main part mates with the first prism part, the terahertz wave T incident on an entrance surface passes through a depression, so as to be reflected by an arrangement part, whereby reflection spectrometry can be performed. When the main part mates with the second prism part, the terahertz wave T incident on the entrance surface is refracted by the depression, so as to pass through an object to be measured within a groove, whereby transmission spectrometry can be preformed.
摘要翻译：通过将主要部分与第一棱镜部分或第二棱镜部分配合，太赫兹波谱仪可以容易地在分光棱镜内传播的太赫兹波T的光路之间切换。当主体与第一棱镜部分配合时，入射表面上的太赫兹波T穿过凹陷，以便被布置部反射，从而可以进行反射光谱测定。当主要部分与第二棱镜部分配合时，入射表面上的太赫兹波T被凹陷折射，以便在沟槽内通过待测物体，从而可进行透射光谱测定。

6. 发明授权

US08564875B2 Terahertz wave generation device 有权
标题翻译：太赫兹波发生装置
公开(公告)号：US08564875B2
公开(公告)日：2013-10-22
申请号：US13128988
申请日：2009-09-28
申请人： Yoichi Kawada , Atsushi Nakanishi , Takashi Yasuda , Hironori Takahashi
发明人： Yoichi Kawada , Atsushi Nakanishi , Takashi Yasuda , Hironori Takahashi
IPC分类号： G02F1/35 , H01S3/10
CPC分类号： G02F1/3534 , G02F2001/3546 , G02F2203/13
摘要： A terahertz wave generating apparatus 2 includes an excitation light source 10, a transmission-type diffraction grating 32, a variable imaging optical system 61, and a nonlinear optical crystal 70. The transmission-type diffraction grating 32 inputs pulsed excitation light output from the excitation light source 10, and diffracts and outputs the pulsed excitation light. In the transmission-type diffraction grating 32, its orientation is variable with a straight central axis, that is parallel to the grooves and passing through an incident position of a principal ray of the pulsed excitation light. The variable imaging optical system 61 is configured to input the pulsed excitation light diffracted to be output by the transmission-type diffraction grating 32, to form an image of the pulsed excitation light by the transmission-type diffraction grating 32, and its imaging magnification is variable. The nonlinear optical crystal 70 is disposed at a position at which the pulsed excitation light is formed as the image by the variable imaging optical system 61, and inputs the pulsed excitation light via the variable imaging optical system 61, and generates a terahertz wave T. Thereby, a terahertz wave generating apparatus, in which it is easy to adjust a phase matching condition, can be realized.
摘要翻译：太赫波发生装置2包括激发光源10，透射型衍射光栅32，可变摄像光学系统61和非线性光学晶体70.透射型衍射光栅32输入从激发输出的脉冲激发光光源10，衍射并输出脉冲激发光。在透射型衍射光栅32中，其取向可以直线中心轴变化，平行于凹槽并通过脉冲激发光的主射线的入射位置。可变成像光学系统61被配置为输入由透射型衍射光栅32衍射的被衍射的脉冲激发光，以通过透射型衍射光栅32形成脉冲激发光的图像，并且其成像倍率为变量。非线性光学晶体70被配置在通过可变成像光学系统61形成脉冲激发光作为图像的位置，并且经由可变成像光学系统61输入脉冲激励光，并产生太赫兹波T. 由此，能够实现容易调整相位匹配条件的太赫兹波发生装置。

7. 发明申请

US20110249253A1 TOTAL REFLECTION TERAHERTZ WAVE MEASUREMENT DEVICE 有权
标题翻译：总反射TERAHERTZ波形测量装置
公开(公告)号：US20110249253A1
公开(公告)日：2011-10-13
申请号：US12988158
申请日：2009-04-27
申请人： Atsushi Nakanishi , Yoichi Kawada , Takashi Yasuda , Hironori Takahashi , Masatoshi Fujimoto , Shinichiro Aoshima , Atsuko Aoshima
发明人： Atsushi Nakanishi , Yoichi Kawada , Takashi Yasuda , Hironori Takahashi , Masatoshi Fujimoto , Shinichiro Aoshima , Atsuko Aoshima
IPC分类号： G01J3/00
CPC分类号： G01N21/552 , G01N21/3504 , G01N21/3586
摘要： A total reflection terahertz wave measuring apparatus 1 includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a beam splitter 17, a terahertz wave generating element 20, a filter 25, an internal total reflection prism 31, a terahertz wave detecting element 40, a ¼ wavelength plate 51, a polarization split element 52, a photodetector 53a, a photodetector 53b, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance surface 31a, an exit surface 31b, and a reflection surface 31c. The terahertz wave generating element 20 and the filter 25 are provided to be integrated with the entrance surface 31a of the internal total reflection prism 31, and the terahertz wave detecting element 40 is provided to be integrated with the exit surface 31b of the internal total reflection prism 31. The filter 25 allows a terahertz wave to be transmitted therethrough and blocks pump light. Accordingly, a total reflection terahertz wave measuring apparatus, which can be downsized, can be realized.
摘要翻译：全反射太赫波测量装置1包括光源11，分支部12，斩波器13，光程长度差调节部14，偏振器15，分束器17，太赫兹波发生元件20，滤光器 25，内部全反射棱镜31，太赫兹波检测元件40，1/4波片51，偏振分离元件52，光电检测器53a，光电检测器53b，差分放大器54和锁定放大器55。内部全反射棱镜31是所谓的平行棱镜，具有入射面31a，出射面31b和反射面31c。太赫兹波发生元件20和滤波器25设置成与内部全反射棱镜31的入射面31a一体化，太赫兹波检测元件40设置成与内部全反射棱镜31的出射面31b一体化滤光器25允许太赫兹波被透过并阻止泵浦光。因此，能够实现小型化的全反射太赫兹波测量装置。

8. 发明授权

US08415625B2 Total reflection terahertz wave measurement device 有权
标题翻译：全反射太赫兹波测量装置
公开(公告)号：US08415625B2
公开(公告)日：2013-04-09
申请号：US12988158
申请日：2009-04-27
申请人： Atsushi Nakanishi , Yoichi Kawada , Takashi Yasuda , Hironori Takahashi , Masatoshi Fujimoto , Shinichiro Aoshima , Atsuko Aoshima
发明人： Atsushi Nakanishi , Yoichi Kawada , Takashi Yasuda , Hironori Takahashi , Masatoshi Fujimoto , Shinichiro Aoshima
IPC分类号： G01J5/02
CPC分类号： G01N21/552 , G01N21/3504 , G01N21/3586
摘要： A total reflection terahertz wave measuring apparatus 1 includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a beam splitter 17, a terahertz wave generating element 20, a filter 25, an internal total reflection prism 31, a terahertz wave detecting element 40, a ¼ wavelength plate 51, a polarization split element 52, a photodetector 53a, a photodetector 53b, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance surface 31a, an exit surface 31b, and a reflection surface 31c. The terahertz wave generating element 20 and the filter 25 are provided to be integrated with the entrance surface 31a of the internal total reflection prism 31, and the terahertz wave detecting element 40 is provided to be integrated with the exit surface 31b of the internal total reflection prism 31. The filter 25 allows a terahertz wave to be transmitted therethrough and blocks pump light. Accordingly, a total reflection terahertz wave measuring apparatus, which can be downsized, can be realized.
摘要翻译：全反射太赫波测量装置1包括光源11，分支部12，斩波器13，光程长度差调节部14，偏振器15，分束器17，太赫兹波发生元件20，滤光器 25，内部全反射棱镜31，太赫兹波检测元件40，1/4波片51，偏振分离元件52，光电检测器53a，光电检测器53b，差分放大器54和锁定放大器55。内部全反射棱镜31是所谓的平行棱镜，具有入射面31a，出射面31b和反射面31c。太赫兹波发生元件20和滤波器25设置成与内部全反射棱镜31的入射面31a一体化，太赫兹波检测元件40设置成与内部全反射棱镜31的出射面31b一体化滤光器25允许太赫兹波被透过并阻止泵浦光。因此，能够实现小型化的全反射太赫兹波测量装置。

9. 发明申请

US20110242642A1 TERAHERTZ WAVE GENERATION DEVICE 有权
标题翻译： TERAHERTZ波形发生装置
公开(公告)号：US20110242642A1
公开(公告)日：2011-10-06
申请号：US13128988
申请日：2009-09-28
申请人： Yoichi Kawada , Atsushi Nakanishi , Takashi Yasuda , Hironori Takahashi
发明人： Yoichi Kawada , Atsushi Nakanishi , Takashi Yasuda , Hironori Takahashi
IPC分类号： G02F1/35
CPC分类号： G02F1/3534 , G02F2001/3546 , G02F2203/13
摘要： A terahertz wave generating apparatus 2 includes an excitation light source 10, a transmission-type diffraction grating 32, a variable imaging optical system 61, and a nonlinear optical crystal 70. The transmission-type diffraction grating 32 inputs pulsed excitation light output from the excitation light source 10, and diffracts and outputs the pulsed excitation light. In the transmission-type diffraction grating 32, its orientation is variable with a straight central axis, that is parallel to the grooves and passing through an incident position of a principal ray of the pulsed excitation light. The variable imaging optical system 61 is configured to input the pulsed excitation light diffracted to be output by the transmission-type diffraction grating 32, to form an image of the pulsed excitation light by the transmission-type diffraction grating 32, and its imaging magnification is variable. The nonlinear optical crystal 70 is disposed at a position at which the pulsed excitation light is formed as the image by the variable imaging optical system 61, and inputs the pulsed excitation light via the variable imaging optical system 61, and generates a terahertz wave T. Thereby, a terahertz wave generating apparatus, in which it is easy to adjust a phase matching condition, can be realized.
摘要翻译：太赫波发生装置2包括激发光源10，透射型衍射光栅32，可变摄像光学系统61和非线性光学晶体70.透射型衍射光栅32输入从激发输出的脉冲激发光光源10，衍射并输出脉冲激发光。在透射型衍射光栅32中，其取向可以直线中心轴变化，平行于凹槽并通过脉冲激发光的主射线的入射位置。可变成像光学系统61被配置为输入由透射型衍射光栅32衍射的被衍射的脉冲激发光，以通过透射型衍射光栅32形成脉冲激发光的图像，并且其成像倍率为变量。非线性光学晶体70被配置在通过可变成像光学系统61形成脉冲激发光作为图像的位置，并通过可变成像光学系统61输入脉冲激励光，并产生太赫兹波T. 由此，能够实现容易调整相位匹配条件的太赫兹波发生装置。

10. 发明申请

US20100090112A1 SINGLE TERAHERTZ WAVE TIME-WAVEFORM MEASURING DEVICE 有权
标题翻译：单TERAHERTZ波形时间波形测量装置
公开(公告)号：US20100090112A1
公开(公告)日：2010-04-15
申请号：US12444209
申请日：2007-09-13
申请人： Yoichi Kawada , Takashi Yasuda , Hironori Takahashi , Shinichiro Aoshima
发明人： Yoichi Kawada , Takashi Yasuda , Hironori Takahashi , Shinichiro Aoshima
IPC分类号： G01N21/35
CPC分类号： G01N21/35 , G01N21/23 , G01N21/3581
摘要： A single terahertz wave time-waveform measuring device 1 acquires information on an object to be measured 9 by using a terahertz wave, and includes a light source 11, a beam diameter adjuster 12, a separator 13, a terahertz wave generator 21, a light path length difference adjuster 31, a pulse front tilting unit 32, a polarizer 33, a wave synthesizer 41, an electro-optic crystal 42, an analyzer 43, and a photodetector 44. The terahertz wave generator 21 generates a pulse terahertz wave in response to an input of pump light and outputs the pulse terahertz wave. The pulse front tilting unit 32 makes pulse fronts of the terahertz wave and the probe light when being input into the electro-optic crystal 42 nonparallel to each other by tilting the pulse front of the probe light.
摘要翻译：单个太赫兹波时间波形测量装置1通过使用太赫兹波获取关于被测量物体9的信息，并且包括光源11，光束直径调节器12，隔膜13，太赫兹波发生器21，光路径长度差调节器31，脉冲前倾斜单元32，偏振器33，波合成器41，电光晶体42，分析器43和光电检测器44.太赫兹波发生器21响应地产生脉冲太赫兹波到泵浦光的输入并输出脉冲太赫兹波。当脉冲前倾斜单元32通过倾斜探测光的脉冲前沿而彼此不平行地输入到电光晶体42中时，使太赫兹波和探测光的脉冲前沿。

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