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    • 2. 发明授权
    • Analog to digital converter with a series of delay units
    • 具有一系列延时单元的模数转换器
    • US07755530B2
    • 2010-07-13
    • US12218531
    • 2008-07-16
    • Tomohito TerazawaTakamoto Watanabe
    • Tomohito TerazawaTakamoto Watanabe
    • H03M1/60
    • H03M1/502
    • An A/D converter has a series of M delay units through which a pulse signal is transmitted while being delayed in each delay unit by a delay time depending on a level of an analog signal. A unit of the converter latches the pulse signal outputted from each delay unit at N sampling times to hold M×N latched data. Another unit of the converter receives the M×N pieces of latched data as a piece of combined data composed of the latched data arranged in an order corresponding to an arranging order of M×N sampling points in the pulse signal, converts the combined data into numeral data, corresponding to a position of the pulse signal in the delay units, at one time, and produces converted digital data corresponding to the level of the analog signal from the numeral data.
    • A / D转换器具有一系列M个延迟单元,根据模拟信号的电平,在每个延迟单元中延迟延迟时间,脉冲信号通过该延迟单元被发送。 转换器的单位在N个采样时间中锁存从每个延迟单元输出的脉冲信号,以保持M×N个锁存数据。 转换器的另一单元接收M×N个锁存数据作为由按脉冲信号中的M×N个采样点的排列次序排列的锁存数据组成的一组合数据,将组合数据转换成 数字数据对应于延迟单元中的脉冲信号的位置,并且产生与来自数字数据的模拟信号的电平对应的转换的数字数据。
    • 4. 发明授权
    • Image sensor and control method of the image sensor
    • 图像传感器的图像传感器和控制方法
    • US07671313B2
    • 2010-03-02
    • US11393818
    • 2006-03-31
    • Takamoto Watanabe
    • Takamoto Watanabe
    • H01L27/00H01J40/14
    • H04N5/37455
    • An image sensor has plural array blocks B1 to B20 arranged in a two dimensional (2D) arrangement. Each array block has a sub array and a corresponding analogue to digital (A/D) converter for performing an A/D conversion of light signals (or detection signals) output from the sub array. The sub array has plural picture element cells arranged in a 2D arrangement. Each A/D converter has a pulse delay circuit having delay units of plural stages connected in series. Each delay unit delays an input pulse by a delay time corresponding to a level of the light signals received from the sub array. A pulse delay type A/D converter is used as the A/D converter, which outputs the number of the delay units as an A/D conversion data item through which the input pulse passes for a measurement time period.
    • 图像传感器具有以二维(2D)布置排列的多个阵列块B1至B20。 每个阵列块具有子阵列和相应的模数(A / D)转换器,用于执行从子阵列输出的光信号(或检测信号)的A / D转换。 子阵列具有以2D排列布置的多个像素单元。 每个A / D转换器具有串联连接的多级延迟单元的脉冲延迟电路。 每个延迟单元将输入脉冲延迟与从子阵列接收的光信号的电平相对应的延迟时间。 使用脉冲延迟型A / D转换器作为A / D转换器,其输出延迟单元的数量作为输入脉冲经过测量时间段的A / D转换数据项。
    • 6. 发明授权
    • Method of testing A/D converter circuit and A/D converter circuit
    • A / D转换电路和A / D转换电路的测试方法
    • US07292175B2
    • 2007-11-06
    • US11407211
    • 2006-04-20
    • Takamoto Watanabe
    • Takamoto Watanabe
    • H03M1/60
    • H03M1/108H03M1/14H03M1/502H03M1/60
    • For testing an A/D converter circuit including a pulse delay circuit constituted by a plurality of cascade-connected delay units, and an encoding circuit configured to count the number of the delay units through which the input pulse signal passes within a predetermined measuring time and to output a digital signal representing the counted number, the method includes the steps of setting the A/D converter circuit in a test mode where the measuring time is set at a short test-use sampling period, applying the input pulse signal to each of serial delay blocks each of which is constituted by a predetermined number of the delay units, and determining good and bad of the A/D converter circuit on the basis of digital signals outputted from the encoding circuit representing the numbers of the delay units through which the input pulse signal has passed within each of the serial delay blocks.
    • 为了测试包括由多个级联连接的延迟单元构成的脉冲延迟电路的A / D转换电路,以及编码电路,被配置为对在预定测量时间内输入脉冲信号通过的延迟单元的数量进行计数;以及 为了输出表示所述计数的数字信号,所述方法包括以下步骤:将所述A / D转换电路设定为测试时间设定在短的测试使用采样周期的测试模式,将所述输入脉冲信号施加到 串行延迟块,每个延迟块由预定数量的延迟单元构成,并且基于从编码电路输出的数字信号确定A / D转换器电路的好坏,所述数字信号表示延迟单元的数量, 输入脉冲信号已通过每个串行延迟块。
    • 10. 发明授权
    • Time measuring device
    • 时间测量装置
    • US5818797A
    • 1998-10-06
    • US908975
    • 1997-08-08
    • Takamoto WatanabeHirofumi Isomura
    • Takamoto WatanabeHirofumi Isomura
    • G04F10/04G04F10/00G04F8/00H03B5/00
    • G04F10/00
    • To provide a time measuring apparatus which is compact and capable of highly accurate measurements, on a semiconductor chip, flip-flops constituting a delayed-signal holding circuit of a first channel and flip-flops constituting a delayed-signal holding circuit of a second channel are disposed alternatingly and in a single row in a circuit region of the delayed-signal holding circuits to latch delayed signals from a pulse-circulating circuit, and flip-flops for latching the same delay signals are mutually adjacent. Due to this, distances between the pulse-circulating circuit and the respective delayed-signal holding circuits become equal, and delay signals having no deviation in delay due to difference in wiring length are supplied to the respective channels, and so uniform measurement can be performed between the respective channels.
    • 为了提供紧凑且能够高精度测量的时间测量装置,在半导体芯片上,构成第一通道的延迟信号保持电路的触发器和构成第二通道的延迟信号保持电路的触发器 在延迟信号保持电路的电路区域中交替且单行地设置,以锁存来自脉冲循环电路的延迟信号,并且用于锁存相同延迟信号的触发器相互相邻。 由此,脉冲循环电路和各延迟信号保持电路之间的距离变得相等,并且由于布线长度的差异而没有延迟偏差的延迟信号被提供给各个通道,因此可以进行均匀的测量 在各个通道之间。