专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US07259756B2 Method and apparatus for selecting information in multi-dimensional space 有权
标题翻译：用于在多维空间中选择信息的方法和装置
公开(公告)号：US07259756B2
公开(公告)日：2007-08-21
申请号：US10484505
申请日：2002-07-22
申请人： Tae-Sik Park , Sang-Goog Lee , Kwang-Woon Lee
发明人： Tae-Sik Park , Sang-Goog Lee , Kwang-Woon Lee
IPC分类号： G09G5/00
CPC分类号： G06F3/016 , G06F3/011 , G06F3/014 , G06F3/0346 , G06F2203/0331
摘要： Method and apparatus for selecting information in a multi-dimensional space are provided. The method includes the steps of sensing the motion of a user intending to select information, and determining whether the sensed motion is an effective motion intended for information selection and returning to the sensing step if it is determined that the motion is not the effective one. Accordingly, difficulty in setting a predetermined threshold to a single value can be overcome. In addition, even a very slight motion can be accurately detected without being influenced by gravity and offsets. Moreover, it can be accurately determined whether a user's two- or three-dimensional motion is an effective motion for selecting information and which motion unit among at least two motion units has generated the effective motion, so that a high correct recognition rate for information and high reliability can be achieved, and a user is allowed to easily select information.
摘要翻译：提供了用于在多维空间中选择信息的方法和装置。该方法包括以下步骤：感测想要选择信息的用户的运动，以及确定所感测的运动是否是用于信息选择的有效运动，并且如果确定运动不是有效运动则返回到感测步骤。因此，可以克服将预定阈值设置为单个值的困难。此外，即使非常轻微的运动也能够被精确地检测而不受重力和偏移的影响。此外，可以准确地确定用户的二维或三维运动是否是用于选择信息的有效运动，以及至少两个运动单元中的哪个运动单元已经产生有效运动，使得用于信息的高正确识别率可以实现高可靠性，并且允许用户容易地选择信息。

2. 发明申请

US20070273642A1 METHOD AND APPARATUS FOR SELECTING INFORMATION IN MULTI-DIMENSIONAL SPACE 审中-公开
标题翻译：用于选择多维空间信息的方法和装置
公开(公告)号：US20070273642A1
公开(公告)日：2007-11-29
申请号：US11697670
申请日：2007-04-06
申请人： Tae-Sik Park , Sang-Goog Lee , Kwang-Woon Lee
发明人： Tae-Sik Park , Sang-Goog Lee , Kwang-Woon Lee
IPC分类号： G09G5/00
CPC分类号： G06F3/016 , G06F3/011 , G06F3/014 , G06F3/0346 , G06F2203/0331
摘要： Method and apparatus for selecting information in a multi-dimensional space are provided. The method includes the steps of sensing the motion of a user intending to select information, and determining whether the sensed motion is an effective motion intended for information selection and returning to the sensing step if it is determined that the motion is not the effective one. Accordingly, difficulty in setting a predetermined threshold to a single value can be overcome. In addition, even a very slight motion can be accurately detected without being influenced by gravity and offsets. Moreover, it can be accurately determined whether a user's two- or three-dimensional motion is an effective motion for selecting information and which motion unit among at least two motion units has generated the effective motion, so that a high correct recognition rate for information and high reliability can be achieved, and a user is allowed to easily select information.
摘要翻译：提供了用于在多维空间中选择信息的方法和装置。该方法包括以下步骤：感测想要选择信息的用户的运动，以及确定所感测的运动是否是用于信息选择的有效运动，并且如果确定运动不是有效运动则返回到感测步骤。因此，可以克服将预定阈值设置为单个值的困难。此外，即使非常轻微的运动也能够被精确地检测而不受重力和偏移的影响。此外，可以准确地确定用户的二维或三维运动是否是用于选择信息的有效运动，以及至少两个运动单元中的哪个运动单元已经产生有效运动，使得用于信息的高正确识别率可以实现高可靠性，并且允许用户容易地选择信息。

3. 发明申请

US20060145233A1 Method of fabricating a semiconductor device capacitor having a dielectric barrier layer and a semiconductor device capacitor having the same 审中-公开
标题翻译：制造具有电介质阻挡层的半导体器件电容器及其半导体器件电容器的方法
公开(公告)号：US20060145233A1
公开(公告)日：2006-07-06
申请号：US11320385
申请日：2005-12-28
申请人： Kyong-Min Kim , Dong-Jun Kim , Kwang-Woon Lee
发明人： Kyong-Min Kim , Dong-Jun Kim , Kwang-Woon Lee
IPC分类号： H01L29/00 , H01L21/36
CPC分类号： H01L28/56 , H01L27/10852 , H01L28/57
摘要： A method of forming a capacitor of a semiconductor device is provided. In the method, a capacitor lower electrode is deposited on a semiconductor substrate and then a dielectric layer is deposited on the lower electrode. A dielectric barrier layer is deposited on an upper part of the dielectric layer. The dielectric barrier layer comprises a material for preventing degradation of a leakage current characteristic of the dielectric layer. The method further comprises depositing a capacitor upper electrode on an upper part of the dielectric barrier layer.
摘要翻译：提供一种形成半导体器件的电容器的方法。在该方法中，在半导体衬底上沉积电容器下电极，然后在下部电极上沉积电介质层。介电阻挡层沉积在电介质层的上部。电介质阻挡层包括用于防止介电层的漏电流特性劣化的材料。该方法还包括在电介质阻挡层的上部上沉积电容器上电极。

4. 发明授权

US07268895B2 Inspection system and a method for inspecting a semiconductor wafer 失效
标题翻译：检查系统和检查半导体晶片的方法
公开(公告)号：US07268895B2
公开(公告)日：2007-09-11
申请号：US11052698
申请日：2005-02-07
申请人： Kwang-Woon Lee , Jang-Hyeok Lee , Wook-Sung Son
发明人： Kwang-Woon Lee , Jang-Hyeok Lee , Wook-Sung Son
IPC分类号： G01N21/00 , G01B11/14
CPC分类号： G01N21/9501
摘要： An inspection system for inspecting a wafer and an inspection method thereof are provided. The inspection system includes a rotating means for turning and arranging a wafer to an inspection position, an angle measuring means for measuring a rotational angle used by the rotating means to rotate to the inspection position, an inspection apparatus for acquiring inspection data associated with the wafer, and a controller for determining an amending angle from the rotational angle and for amending the inspection data in accordance with the amending angle to calculate amended inspection data, wherein the amended inspection data reflects a state of the wafer on the rotating means.
摘要翻译：提供了一种用于检查晶片的检查系统及其检查方法。检查系统包括用于将晶片转动并布置到检查位置的旋转装置，用于测量由旋转装置旋转到检查位置的旋转角度的角度测量装置，用于获取与晶片相关联的检查数据的检查装置以及控制器，用于根据所述旋转角度确定修正角度，并根据所述修正角修正所述检查数据，以计算修正的检查数据，其中所述经修改的检查数据反映所述旋转装置上的所述晶片的状态。

5. 发明授权

US07112936B2 Apparatus and method for controlling brushless DC motor 有权
标题翻译：无刷直流电机控制装置及方法
公开(公告)号：US07112936B2
公开(公告)日：2006-09-26
申请号：US10636540
申请日：2003-08-08
申请人： Kwang-Woon Lee
发明人： Kwang-Woon Lee
IPC分类号： H01R39/46 , H02K13/00 , H02P25/13
CPC分类号： H02P6/10
摘要： An apparatus and method for controlling a brushless DC motor, which minimizes a torque ripple thereof, and includes a power converting unit to convert alternating current (AC) power to polyphase AC power and to supply the polyphase AC power to the brushless DC motor. A rotator position/speed detecting unit detects status information of a rotator. A terminal voltage detecting unit detects variations of terminal voltages of the polyphase AC power. A control unit detects phase commutation periods of the polyphase AC power using the status information provided from the rotator position/speed detecting unit and the terminal voltage variation information of the polyphase AC power provided from the terminal voltage detecting unit. The control unit controls the power converting unit to supply a compensation voltage used to constantly maintain a mean voltage of a non-commutation phase of the polyphase AC power during the detected phase commutation periods.
摘要翻译：一种用于控制无刷直流电动机的装置和方法，其使其扭矩波动最小化，并且包括将交流（AC）功率转换为多相交流电力并将多相交流电力提供给无刷直流电动机的功率转换单元。旋转体位置/速度检测单元检测旋转体的状态信息。端子电压检测单元检测多相交流电源的端子电压的变化。控制单元使用从旋转体位置/速度检测单元提供的状态信息和从端子电压检测单元提供的多相交流电力的端子电压变化信息来检测多相交流电力的相位换向周期。控制单元控制功率转换单元，以在检测到的相位换向周期期间提供用于恒定地维持多相AC电力的非换向相位的平均电压的补偿电压。

6. 发明申请

US20050213085A1 Inspection system and a method for inspecting a semiconductor wafer 失效
标题翻译：检查系统和检查半导体晶片的方法
公开(公告)号：US20050213085A1
公开(公告)日：2005-09-29
申请号：US11052698
申请日：2005-02-07
申请人： Kwang-Woon Lee , Jang-Hyeok Lee , Wook-Sung Son
发明人： Kwang-Woon Lee , Jang-Hyeok Lee , Wook-Sung Son
IPC分类号： H01L21/66 , G01N21/88 , G01N21/95
CPC分类号： G01N21/9501
摘要： An inspection system for inspecting a wafer and an inspection method thereof are provided. The inspection system includes a rotating means for turning and arranging a wafer to an inspection position, an angle measuring means for measuring a rotational angle used by the rotating means to rotate to the inspection position, an inspection apparatus for acquiring inspection data associated with the wafer, and a controller for determining an amending angle from the rotational angle and for amending the inspection data in accordance with the amending angle to calculate amended inspection data, wherein the amended inspection data reflects a state of the wafer on the rotating means.
摘要翻译：提供了一种用于检查晶片的检查系统及其检查方法。检查系统包括用于将晶片转动并布置到检查位置的旋转装置，用于测量由旋转装置旋转到检查位置的旋转角度的角度测量装置，用于获取与晶片相关联的检查数据的检查装置以及控制器，用于根据所述旋转角度确定修正角度，并根据所述修正角修正所述检查数据，以计算修正的检查数据，其中所述经修改的检查数据反映所述旋转装置上的所述晶片的状态。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式