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    • 6. 发明授权
    • Sense amplifier driving circuit employing current mirror for
semiconductor memory device
    • 使用半导体存储器件的电流镜的感应放大器驱动电路
    • US5130580A
    • 1992-07-14
    • US550997
    • 1990-07-11
    • Dong-sun MinHong-sun HwangSoo-in ChoDae-Je Chin
    • Dong-sun MinHong-sun HwangSoo-in ChoDae-Je Chin
    • G11C11/419G11C7/06G11C11/407G11C11/409
    • G11C7/065
    • A sense amplifier driving circuit for controlling sense amplifiers of high density semiconductor memory device by turning-on/off a driving transistor connected between an external voltage Vcc terminal and a ground voltage Vss terminal, comprises a bias circuit including a MOS transistor being connected to the driving MOS transistor to form a current mirror circuit therewith which is controlled by a sense amplifier enable clock and a constant current source having a MOS transistor with a bias voltage of an intermediate level between Vcc and Vss being applied to its gate terminal. The bias circuit is connected to the gate terminal of the driving transistor to control the gate voltage of the driving transistor, thereby reducing the peak current of a sense amplifier driving signal. Further, the driving signals are generated in the waveform having a linear dual slope, resulting in a decrease in power-noise. The bias circuit is connected to a clamping circuit having a comparator circuit to clamp the active restore voltage of the sense amplifier driving circuit, so that the active restore voltage can be maintained at the level of an internal voltage (approximately 4V), thereby preventing the distortion of the characteristics of the cell device and eliminating the necessity of additional standby current by enabling the sense amplifier only for the active restore operation. Further, the sense amplifier driving circuit comprises a constant circuit including two or more current mirror circuits which are sequentially activated, whereby the sense amplifier driving signals are made to have stable linear dual slopes.
    • 一种读出放大器驱动电路,用于通过接通/断开连接在外部电压Vcc端子和接地电压Vss端子之间的驱动晶体管来控制高密度半导体存储器件的读出放大器,包括:偏置电路,包括MOS晶体管,连接到 驱动MOS晶体管与其形成电流镜像电路,其由读出放大器使能时钟控制,并且具有MOS晶体管的恒定电流源,其中Vcc和Vss之间的中间电平的偏置电压被施加到其栅极端子。 偏置电路连接到驱动晶体管的栅极端子,以控制驱动晶体管的栅极电压,从而降低读出放大器驱动信号的峰值电流。 此外,在具有线性双斜率的波形中产生驱动信号,导致功率噪声的降低。 偏置电路连接到具有比较器电路的钳位电路,以钳位读出放大器驱动电路的有效恢复电压,使得有效恢复电压可以保持在内部电压(大约4V)的水平,从而防止 通过使感测放大器仅用于主动恢复操作,从而消除了电池装置特性的失真,并消除了额外待机电流的必要性。 此外,读出放大器驱动电路包括一个恒定电路,该恒定电路包括被依次激活的两个或多个电流镜电路,从而使读出放大器驱动信号具有稳定的线性双斜率。
    • 10. 再颁专利
    • Stack capacitor DRAM cell having increased capacitor area
    • 堆叠电容器DRAM单元具有增加的电容器面积
    • USRE36261E
    • 1999-08-03
    • US761082
    • 1996-12-04
    • Dae-Je ChinTae-Young Chung
    • Dae-Je ChinTae-Young Chung
    • H01L27/04H01L21/822H01L21/8242H01L27/10H01L27/108H01L29/78H01L29/92
    • H01L27/10852H01L27/10808
    • A saddled and wrapped stack capacitor DRAM and a method thereof are provided. The DRAM of the invention includes three factors in increasing the effective area for a capacitor. One is a storage poly layer comprising a first poly layer and a second poly layer, which is formed thick in a region over a field oxide layer through two steps; another is a spacer which is formed through an etchback technique for an oxide layer coated on another oxide layer being patterened to selectively remove the storage poly layer, and the spacer maximizes the size of the storage poly; another is an undercut which is formed in boundary regions on an upper oxide layer, on which a .�.plat.!. .Iadd.plate .Iaddend.poly material is coated and wrapped.
    • 提供了一种叠置和堆叠的堆叠电容器DRAM及其方法。 本发明的DRAM包括增加电容器有效面积的三个因素。 一种是存储多层,其包括第一多晶层和第二多晶硅层,其通过两个步骤在场氧化物层上的区域中形成为厚; 另一个是通过蚀刻技术形成的间隔物,其中涂覆在另一氧化物层上的氧化物层被选择性地选择性地去除存储多晶硅层,并且间隔物使存储聚硅的尺寸最大化; 另一种是在上部氧化物层上的边界区域上形成底切,在其上涂覆并包裹有[平板]多晶材料。