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    • 1. 发明授权
    • Inductance element and manufacturing method thereof, and snubber using thereof
    • 电感元件及其制造方法以及使用其的缓冲器
    • US06480084B1
    • 2002-11-12
    • US09606188
    • 2000-06-29
    • Tadao SaitoYasuaki MoriyaKazumi SakaiTakao Kusaka
    • Tadao SaitoYasuaki MoriyaKazumi SakaiTakao Kusaka
    • H01F2730
    • H01F17/04H01F37/00
    • An inductance element comprises a coil having a hollow portion opened at both ends and provided with a winding of which number of turns (N) per length 10 mm is 20 or more and 500 or less, and a core having a single layer or a plurality of layers of magnetic ribbon of a thickness of 4 &mgr;m or more and 50 &mgr;m or less and a width of 2 mm or more and 40 mm or less, at least part thereof being disposed in the hollow portion. In such an inductance element, a ratio (N/n) of a number of turns (N) of the coil per length 10 mm to a number of layers (n) of the magnetic ribbon is set at 20 or more and 500 or less. The magnetic ribbon, for instance in a state disposed in the hollow portion of the coil, has an open magnetic circuit structure. Instead, the magnetic ribbon, by disposing penetrating the hollow portion and magnetically connecting both ends thereof, forms a closed magnetic circuit loop. Such an inductance element possesses excellent inductance characteristics and is good in winding efficiency.
    • 电感元件包括具有在两端开口的中空部分的线圈,并且设置有每个长度10mm的匝数(N)为20以上且500以下的绕组,以及具有单层或多层的芯 的厚度为4μm以上且50μm以下,宽度为2mm以上且40mm以下的磁性层的至少一部分设置在中空部中。 在这种电感元件中,每个长度10mm的线圈的匝数(N)与磁带的层数(n)的比(N / n)设定为20以上且500以下 。 例如,在设置在线圈的中空部分的状态下的磁带具有开放的磁路结构。 相反,磁带通过穿透中空部分并且磁性地连接其两端而形成闭合的磁路回路。 这种电感元件具有优异的电感特性,绕组效率好。
    • 8. 发明授权
    • Probe microscope and measuring method using probe microscope
    • 探针显微镜和使用探针显微镜的测量方法
    • US07609048B2
    • 2009-10-27
    • US11797116
    • 2007-05-01
    • Takao Kusaka
    • Takao Kusaka
    • G01R31/02
    • G01Q60/30G01Q60/32G01Q60/40G01Q70/10
    • Provided is a probe microscope for measuring a surface potential of a sample, including a contact electrification mechanism (circuit (C)) for bringing an electroconductive probe device into contact with a surface of the sample and applying a voltage in the contact state to induce electrification on the surface of the sample, and a potential measuring mechanism (circuit (K)) for measuring the surface potential of the sample caused by the contact electrification mechanism in a non-contact state of the electroconductive probe device and the surface of the sample, wherein the electrification induced by the contact electrification mechanism and the measurement of the surface potential by the potential measuring mechanism alternate in time series while the voltage applied during the contact is gradually changed, thereby measuring a correlation between the applied voltage and the surface potential.
    • 提供了一种用于测量样品的表面电位的探针显微镜,其包括用于使导电探针装置与样品表面接触并且以接触状态施加电压以诱导起电的接触带电机构(电路(C)) 在电导探针装置的非接触状态和样品表面之间测量由接触带电机构引起的样品的表面电位的电位测量机构(电路(K)), 其中由接触带电机构引起的带电和通过电位测量机构测量的表面电位在接触期间施加的电压逐渐改变,从而测量施加的电压和表面电位之间的相关性。