会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 5. 发明授权
    • Device for splitting the light beam incident
    • 用于分离光束入射的装置
    • US4302075A
    • 1981-11-24
    • US125581
    • 1980-02-28
    • Kazuya MatsumotoSusumu Matsumura
    • Kazuya MatsumotoSusumu Matsumura
    • G02B5/00G02B27/10G03B7/099G03B7/0997G03B19/12G02B27/14
    • G02B27/108G02B27/1086G03B19/12G03B7/09976
    • This invention relates to a device for splitting a light beam applicable to a light metering apparatus of a single lens reflex camera. Having a diffraction lattice structure built in the condenser lens, this device has both a beam splitting function and a light condensing function. More in detail, this device includes a condenser lens section and a transparent sheet having a diffraction lattice in one portion which are interconnect by having a lower index layer inbetween. One portion of the light that passes through the taking lens of the camera and is incident on said transparent sheet is diffracted by said diffraction lattice, and further the diffracted light is totally reflected at the boundary surface between said lower index layer and transparent sheet, and transmitted to the end surface of the transparent sheet when it is detected.
    • 本发明涉及一种用于分割适用于单个透镜反光相机的光计量装置的光束的装置。 具有聚光透镜中的衍射晶格结构,该器件具有光束分离功能和聚光功能。 更详细地,该装置包括聚光透镜部分和透明片材,透明片材在一部分中具有通过在其间具有较低折射率层互连的衍射晶格。 通过相机的拍摄镜头并入射在所述透明片上的光的一部分被所述衍射光栅衍射,并且所述衍射光在所述下折射率层和透明片之间的边界面全反射,并且 当检测到透明片材的端面时,被传送到透明片材的端面。
    • 6. 发明授权
    • Device for measuring light incident on an image forming optical system
    • 用于测量入射在图像形成光学系统上的光的装置
    • US4178084A
    • 1979-12-11
    • US869447
    • 1978-01-16
    • Kazuya MatsumotoSusumu MatsumuraAiichiro KoyamaYouichi OkunoTokuichi TsunlkawaTadashi Ito
    • Kazuya MatsumotoSusumu MatsumuraAiichiro KoyamaYouichi OkunoTokuichi TsunlkawaTadashi Ito
    • G02B5/32G03B7/099G03B7/00G03B19/12
    • G02B5/32G03B7/09976
    • The present invention relates to a device for measuring light incident on an image-forming optical system, making use of a plural number of diffraction elements. The plural number of the diffraction elements are respectively provided in the optical path of the image-forming optical system. Further the plural number of the diffraction elements respectively have a certain predetermined area. The plural number of the diffraction elements, seen along the direction of the optical axis of the image-forming optical system, are substantially only partially overlapped with respect to each other. The light beam incident on a diffraction element is divided into a non-diffracted light beam and a diffracted light beam. Thus, the diffracted light beam is directed toward the light detecting means so as to be measured while the non-diffracted light beam advances along the above mentioned optical axis. Consequently, at the part at which the diffraction elements overlap each other, the non-diffracted light beam emerging from the preceeding diffraction element again enters the following diffraction element. This light beam is again divided into a non-diffracted light beam and a diffracted light beam by means of the following diffraction element. The diffracted light beam is measured by a light detecting means in the same way as in the above mentioned case, while the non-diffracted light beam advances along the above mentioned optical axis. Thus, the light beam which passes through the overlapping parts is measured a plural number of times.
    • 本发明涉及一种利用多个衍射元件测量入射在图像形成光学系统上的光的装置。 多个衍射元件分别设置在成像光学系统的光路中。 此外,多个衍射元件分别具有一定的预定面积。 沿着图像形成光学系统的光轴的方向看到的多个衍射元件相对于彼此基本上仅部分重叠。 入射到衍射元件上的光束被分成非衍射光束和衍射光束。 因此,衍射光束被引导到光检测装置,以便当非衍射光束沿着上述光轴前进时被测量。 因此,在衍射元件彼此重叠的部分,从前面的衍射元件出射的非衍射光束再次进入随后的衍射元件。 该光束通过以下衍射元件再分为非衍射光束和衍射光束。 衍射光束以与上述情况相同的方式由光检测装置测量,而非衍射光束沿着上述光轴前进。 因此,通过重叠部分的光束被测量多次。
    • 9. 发明授权
    • Interferometric optical phase discrimination apparatus
    • 干涉光学相位鉴别装置
    • US4105335A
    • 1978-08-08
    • US813298
    • 1977-07-06
    • Nobuyoshi TanakaNaoki AyataMitsuo TakedaSusumu MatsumuraKazuya Matsumoto
    • Nobuyoshi TanakaNaoki AyataMitsuo TakedaSusumu MatsumuraKazuya Matsumoto
    • G01B9/02G01B11/06G02B21/06
    • G01B9/0209G01B11/06G01B11/0675
    • Film of a known refractive index whose thickness is to be measured is illuminated by a white light beam. Two wave fronts from both sides of the film are directed to an interferometer. The wave fronts are out of phase in accordance with the thickness of the film. The two wave fronts are amplitude-split, respectively, by the beam splitter of the interferometer. Two of the split wave fronts are tilted by tilting means in the interferometer. The other two split wave fronts, as well as the two tilted wave fronts, are directed to an interference surface. Thus, there is formed a white interference pattern on the interference surface. The white interference pattern has a middle peak and two side peaks. The space interval between these peaks is measured by a scanner. By knowing the peak-to-peak interval, it is possible to discriminate the space interval between both sides of the film.
    • 其厚度被测量的已知折射率的膜被白光束照射。 电影两侧的两个波前被引导到干涉仪。 根据薄膜的厚度,波前是相位相异的。 两个波前分别由干涉仪的分束器进行振幅分割。 两个分波锋面通过倾斜装置在干涉仪中倾斜。 另外两个分裂波阵面以及两个倾斜的波前方向被引导到干涉面。 因此,在干涉面上形成白色干涉图案。 白色干涉图案具有中间峰和两个边峰。 这些峰之间的间隔由扫描仪测量。 通过知道峰到峰间隔,可以区分膜的两侧之间的间隔。