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    • 1. 发明授权
    • Magneto-optical microscope magnetometer
    • 磁光显微镜磁力计
    • US06528993B1
    • 2003-03-04
    • US09717611
    • 2000-11-21
    • Sung Chul ShinSug Bong Choe
    • Sung Chul ShinSug Bong Choe
    • G01R33032
    • G02B21/0016G01R33/032
    • A magneto-optical microscope magnetometer capable of simultaneously measuring a hysteresis loop and activation magnetic moment of a submicrometer-scale local area (about 0.3×0.3 &mgr;m). An electromagnet capable of applying a magnetic field to a magnetic material is attached to a polarizing optical microscope capable of observing a magnetized state of the magnetic material, such that images of the microscope varying with the strength of the applied magnetic field are grabbed in real time by a charge coupled device camera and then analyzed. The magneto-optical microscope magnetometer can measure a hysteresis loop and activation magnetic moment in a submicrometer-scale local area observed by the polarizing optical microscope. Further, the magneto-optical microscope magnetometer can measure hysteresis loops and activation magnetic moments simultaneously with respect to all CCD pixels of the camera and observe coercivity and activation magnetic moment distributions of the entire magnetic material.
    • 能够同时测量亚微米级局域(约0.3×0.3mum)的磁滞回线和激活磁矩的磁光显微镜磁力计。 将能够向磁性材料施加磁场的电磁铁安装在能够观察磁性材料的磁化状态的偏振光学显微镜上,使得随着施加的磁场的强度而变化的显微镜的图像被实时地抓住 通过电荷耦合器件相机进行分析。 磁光显微镜磁力计可以测量由偏光光学显微镜观察到的亚微米级局部区域的磁滞回线和激活磁矩。 此外,磁光显微镜磁力计可以相对于相机的所有CCD像素同时测量磁滞回线和激励磁矩,并观察整个磁性材料的矫顽力和激活磁矩分布。