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热词
    • 8. 发明授权
    • Integrated circuit tester
    • 集成电路测试仪
    • US5398252A
    • 1995-03-14
    • US794894
    • 1991-11-20
    • Kazuhiko Ohashi
    • Kazuhiko Ohashi
    • G01R31/28G01R31/3193G06F11/00
    • G01R31/31935G06F2201/865
    • An integrated circuit tester uses the information compared between a test executed result and an expected value, for the operation of a driver, which applies test patterns to a device under test. Once a test executed result obtained from the device is compared with an expected value, the compared information is fedback to the driver so as to specify, for example, test cycles and test patterns. Therefore, in an evaluation of maximum operating frequencies, the failure which occurs in the (n+1)th lower frequency can be effectively observed without being masked by other failures which occur in the nth lower frequency or less.
    • 集成电路测试仪使用将测试模式应用于被测设备的驱动程序的操作的测试执行结果与期望值之间的信息进行比较。 将从设备获得的测试执行结果与预期值进行比较后,将比较的信息反馈给驱动器,以指定例如测试周期和测试模式。 因此,在最大工作频率的评价中,可以有效地观察发生在第(n + 1)低频中的故障,而不会被发生在第n次以下频率以下的其他故障所掩盖。