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    • 6. 发明申请
    • Error detecting circuit
    • 错误检测电路
    • US20060005091A1
    • 2006-01-05
    • US10882523
    • 2004-06-30
    • Subhasish MitraKee KimTak MakPrashant Goteti
    • Subhasish MitraKee KimTak MakPrashant Goteti
    • G01R31/28
    • G01R31/318541G01R31/31816G01R31/318566G11C2029/3202
    • In one embodiment, an apparatus includes a datapath circuit to generate a data output signal in response to a data input signal and at least a first data clock signal; a shadow circuit, coupled to the datapath circuit, to generate a shadow output signal in response the data input signal and at least a second data clock signal during a functional mode of operation and to generate a scan-out signal in response to a scan-in signal and at least a first test clock signal during a test mode of operation; and an error detect circuit, coupled to the datapath and the shadow circuits, to generate an error signal in response to a mismatch between the data output signal and the shadow output signal.
    • 在一个实施例中,一种装置包括数据路径电路,用于响应于数据输入信号和至少第一数据时钟信号而产生数据输出信号; 阴影电路,耦合到数据路径电路,以在功能操作模式期间响应于数据输入信号和至少第二数据时钟信号产生阴影输出信号,并且响应于扫描信号产生扫描输出信号, 在测试操作模式期间的信号和至少第一测试时钟信号; 以及耦合到数据路径和阴影电路的误差检测电路,以响应于数据输出信号和阴影输出信号之间的失配而产生误差信号。