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    • 1. 发明授权
    • Programmable logic arrays
    • 可编程逻辑阵列
    • US06396168B2
    • 2002-05-28
    • US09782173
    • 2001-02-12
    • Stefano GhezziDonato FerrarioEmilio YeroGiovanni Campardo
    • Stefano GhezziDonato FerrarioEmilio YeroGiovanni Campardo
    • H03K19096
    • H03K19/17736H03K19/17704H03K19/1778Y10T307/505
    • A programmable logic array (PLA) includes at least one AND plane including an array of transistors arranged in rows and columns. The transistors belonging to a same column may be connected in series with each other. Two end conduction terminals of the series connected transistors may be coupled to a supply voltage rail and to a reference, respectively. The transistors of the first and last rows of the array may have their control terminals coupled to respective opposite enabling/disabling potentials. Except for the first and last rows, first, second, and third control lines are associated with each row of the array. Except for the first and last rows, each transistor of each row may have its control terminal connected to one of the three control lines associated with its row. The PLA may alternatively include at least one OR plane.
    • 可编程逻辑阵列(PLA)包括至少一个AND平面,其包括以行和列排列的晶体管阵列。 属于同一列的晶体管可以彼此串联连接。 串联连接的晶体管的两个端部导电端子可以分别耦合到电源电压轨和参考。 阵列的第一行和最后一行的晶体管可以使它们的控制端耦合到各自相对的使能/禁止电位。 除了第一行和最后一行,第一,第二和第三控制行都与数组的每一行相关联。 除了第一行和最后一行之外,每行的每个晶体管可以将其控制端连接到与其行相关联的三条控制线之一。 PLA可以替代地包括至少一个OR平面。
    • 3. 发明授权
    • Method and circuit for regulating the length of an ATD pulse signal
    • 用于调节ATD脉冲信号长度的方法和电路
    • US06169423A
    • 2001-01-02
    • US09186496
    • 1998-11-04
    • Giovanni CampardoRino MicheloniMatteo ZammattioDonato Ferrario
    • Giovanni CampardoRino MicheloniMatteo ZammattioDonato Ferrario
    • H03K522
    • G11C8/18
    • The invention relates to a method and a circuit for regulating a pulse synchronization signal (ATD) for the memory cell read phase in semiconductor integrated electronic memory devices. The pulse signal (ATD) is generated upon detection of a change in logic state of at least one of a plurality of address input terminals of the memory cells, so as to also generate an equalization signal (SAEQ) to a sense amplifier. The SAEQ pulse is blocked (STOP) upon the row voltage reaching a predetermined sufficient value to provide reliable reading. Advantageously, the pulse blocking is produced by a logic signal (STOP) activated upon a predetermined voltage value being exceeded during the overboost phase of the addressed memory row.
    • 本发明涉及一种用于调整半导体集成电子存储器件中存储单元读取相位的脉冲同步信号(ATD)的方法和电路。 在检测到存储器单元的多个地址输入端中的至少一个的逻辑状态的变化时产生脉冲信号(ATD),以便还产生到读出放大器的均衡信号(SAEQ)。 当行电压达到预定的足够值时,SAEQ脉冲被阻塞(STOP),以提供可靠的读数。 有利地,通过在寻址的存储器行的过载阶段期间超过预定电压值而激活的逻辑信号(STOP)产生脉冲阻塞。
    • 6. 发明授权
    • Memory cell integrated structure with corresponding biasing device
    • 存储单元集成结构与相应的偏置装置
    • US6151251A
    • 2000-11-21
    • US295667
    • 1999-04-21
    • Giovanni CampardoStefano ZanardiMaurizio BranchettiStefano Ghezzi
    • Giovanni CampardoStefano ZanardiMaurizio BranchettiStefano Ghezzi
    • G05F3/20H01L27/115G11C11/34
    • H01L27/115G05F3/205
    • A biasing device for biasing a memory cell having a substrate bias terminal associated therewith. The biasing device includes a first sub-threshold circuitry block adapted to supply an appropriate current during the device standby phase through a restore transistor connected between a supply voltage reference and the substrate bias terminal of the memory cell, and having a control terminal connected to a bias circuit, in turn connected between the supply voltage reference and a ground voltage reference to drive the restore transistor with a current of limited value. The device further includes a second feedback block for fast charging the substrate bias terminal, being connected between the supply voltage reference and the ground voltage reference and comprising a first bias transistor having a control terminal connected to the ground voltage reference via a stabilization transistor, having in turn a control terminal connected to an output node, and to the control terminal of a first regulation transistor connected between the supply voltage reference and the ground voltage reference, the stabilization transistor and first regulation transistor providing feedback for the bias transistor, thereby to restrict the voltage range of the output node.
    • 一种用于偏置具有与其相关联的衬底偏置端子的存储单元的偏置装置。 偏置装置包括第一子阈值电路块,其适于在器件待机阶段期间通过连接在电源电压基准和存储单元的衬底偏置端之间的恢复晶体管提供适当的电流,并且具有连接到存储器单元的控制端 偏置电路又连接在电源参考电压和地电压基准之间,以有限的电流驱动恢复晶体管。 该装置还包括用于对衬底偏置端子进行快速充电的第二反馈块,其连接在电源电压基准和接地电压基准之间,并且包括具有经由稳定晶体管连接到接地电压基准的控制端的第一偏置晶体管, 连接到输出节点的控制终端,以及连接在电源电压基准和接地电压基准之间的第一调节晶体管的控制端,稳压晶体管和第一调节晶体管为偏置晶体管提供反馈,从而限制 输出节点的电压范围。
    • 7. 发明授权
    • Memory cell integrated structure with corresponding biasing device
    • 存储单元集成结构与相应的偏置装置
    • US06304490B1
    • 2001-10-16
    • US09675985
    • 2000-09-29
    • Giovanni CampardoStefano ZanardiMaurizio BranchettiStefano Ghezzi
    • Giovanni CampardoStefano ZanardiMaurizio BranchettiStefano Ghezzi
    • G11C1134
    • H01L27/115G05F3/205
    • A biasing device for biasing a memory cell having a substrate bias terminal associated therewith. The biasing device includes a first sub-threshold circuitry block adapted to supply an appropriate current during the device standby phase through a restore transistor connected between a supply voltage reference and the substrate bias terminal of the memory cell, and having a control terminal connected to a bias circuit, in turn connected between the supply voltage reference and a ground voltage reference to drive the restore transistor with a current of limited value. The device further includes a second feedback block for fast charging the substrate bias terminal, being connected between the supply voltage reference and the ground voltage reference and comprising a first bias transistor having a control terminal connected to the ground voltage reference via a stabilization transistor, having in turn a control terminal connected to an output node, and to the control terminal of a first regulation transistor connected between the supply voltage reference and the ground voltage reference, the stabilization transistor and first regulation transistor providing feedback for the bias transistor, thereby to restrict the voltage range of the output node.
    • 一种用于偏置具有与其相关联的衬底偏置端子的存储单元的偏置装置。 偏置装置包括第一子阈值电路块,其适于在器件待机阶段期间通过连接在电源电压基准和存储单元的衬底偏置端之间的恢复晶体管提供适当的电流,并且具有连接到存储器单元的控制端 偏置电路又连接在电源参考电压和地电压基准之间,以有限的电流驱动恢复晶体管。 该装置还包括用于对衬底偏置端子进行快速充电的第二反馈块,其连接在电源电压基准和接地电压基准之间,并且包括具有经由稳定晶体管连接到接地电压基准的控制端的第一偏置晶体管, 连接到输出节点的控制终端,以及连接在电源电压基准和接地电压基准之间的第一调节晶体管的控制端,稳压晶体管和第一调节晶体管为偏置晶体管提供反馈,从而限制 输出节点的电压范围。
    • 10. 发明申请
    • INTERFACE BOARD OF A TESTING HEAD FOR A TEST EQUIPMENT OF ELECTRONIC DEVICES AND CORRESPONDING PROBE HEAD
    • 用于电子设备测试设备和相关探头的测试头接口板
    • US20140015560A1
    • 2014-01-16
    • US13548004
    • 2012-07-12
    • Giovanni CampardoFlavio MaggioniRiccardo Liberini
    • Giovanni CampardoFlavio MaggioniRiccardo Liberini
    • G01R1/073
    • G01R1/07378
    • An interface board of a testing head for a test equipment of electronic devices is described. The testing head includes a plurality of contact probes, each contact probe having at least one contact tip suitable to abut against contact pads of a device to be tested, as well as a contact element for the connection with a board of the test equipment. Suitably, the interface board comprises a substrate and at least one redirecting die housed on a first surface of that substrate and a plurality of contact pins projecting from a second surface of that substrate opposed to the first surface. The redirecting die includes at least one semiconductor substrate whereon at least a first plurality of contact pads is realized, suitable to contact a contact element of a contact probe of the testing head, the contact pins being suitable to contact the board.
    • 描述了用于电子设备的测试设备的测试头的接口板。 测试头包括多个接触探针,每个接触探针具有至少一个适于邻接待测试装置的接触垫的接触尖端,以及用于与测试设备的板连接的接触元件。 适当地,接口板包括衬底和容纳在该衬底的第一表面上的至少一个重定向模具和从该衬底的与第一表面相对的第二表面突出的多个接触针。 重定向管芯包括至少一个半导体衬底,其中至少第一多个接触焊盘被实现,适于接触测试头的接触探针的接触元件,接触针适于接触该板。