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    • 1. 发明授权
    • Process for the formation of a polycrystalline semiconductor film by
microwave plasma chemical vapor deposition method
    • 通过微波等离子体化学气相沉积法形成多晶半导体膜的工艺
    • US5192717A
    • 1993-03-09
    • US799900
    • 1991-12-02
    • Soichiro KawakamiMasahiro KanaiTakeshi Aoki
    • Soichiro KawakamiMasahiro KanaiTakeshi Aoki
    • H01L21/205
    • H01L21/02422H01L21/02521H01L21/02532H01L21/0262Y10S148/122
    • A process for forming a high quality polycrystalline semiconductor film on an insulating substrate which comprises using a MW-PCVD apparatus comprising a plasma generation chamber provided with a microwave introducing means and a film-forming chamber connected through a grid electrode to said plasma generation chamber, said film-forming chamber containing said insulating substrate positioned on a substrate holder made of a conductive material being installed therein, producing plasma by contacting a film-forming raw material gas with a microwave energy applied through said microwave introducing means in said plasma generation chamber and introducing said plasma into said film-forming chamber while applying a high frequency voltage with a frequency in the range of from 20 to 500 MHz between said grid electrode and said substrate holder to thereby cause the formation of said polycrystalline semiconductor film on said insulating substrate maintained at a desired temperature.
    • 一种用于在绝缘基板上形成高质量多晶半导体膜的方法,其包括使用包括具有微波引入装置的等离子体产生室和通过格栅电极连接到所述等离子体产生室的成膜室的MW-PCVD装置, 所述成膜室包含位于由导电材料制成的衬底保持器上的所述绝缘衬底,其安装在其中,通过使成膜原料气体与通过所述微波引入装置在所述等离子体产生室中施加的微波能量接触而产生等离子体;以及 将所述等离子体引入所述成膜室,同时在所述栅电极和所述衬底保持器之间施加频率范围为20-500MHz的高频电压,从而在所述绝缘衬底上形成所述多晶半导体膜保持 在期望的温度。
    • 9. 发明授权
    • Pin heterojunction photovoltaic elements with polycrystal AlAs(H,F)
semiconductor film
    • 引脚异质结光电元件与多晶AlAs(H,F)半导体膜
    • US5002617A
    • 1991-03-26
    • US467540
    • 1990-01-19
    • Masahiro KanaiTatsuyuki AoikeKoichi MatsudaSoichiro Kawakami
    • Masahiro KanaiTatsuyuki AoikeKoichi MatsudaSoichiro Kawakami
    • H01L31/0304H01L31/0392H01L31/075H01L31/18
    • H01L31/03042H01L31/075H01L31/184H01L31/1852Y02E10/544Y02E10/548
    • A pin heterojunction photovoltaic element which generates photoelectromotive force by the junction of a p-type semiconductor layer, an i-type semiconductor layer and an n-type semiconductor layer, characterized in that at least one of said p-type and n-type semiconductor layers comprises a polycrystal semiconductor film comprised of aluminum atoms (Al), arsenic atoms (As), hydrogen atoms (H), optionally fluorine atoms (F), and atoms (M) of a p-type or n-type dopant element, said polycrystal semiconductor film contains crystal grains of an average size in the range of 50 to 800 .ANG., and said polycrystal semiconductor film contains the hydrogen atoms (H) in an amount of 0.5 to 7 atomic %; said i-type comprises either (a) a non-single crystal semiconductor film containing silicon atoms (Si) as a matrix and at least one kind of atoms selected from the group consisting of hydrogen atoms (H) and fluorine atoms (F) or (b) a non-single crystal semiconductor film containing silicon atoms (Si) as a matrix, at least one kind of atoms selected from the group consisting of carbon atoms (C) and germanium atoms (Ge), and at least one kind of atoms selected from the group consisting of hydrogen atoms (H) and fluorine atoms (F).
    • 一种由p型半导体层,i型半导体层和n型半导体层的接合产生光电动势的pin异质结光电元件,其特征在于,所述p型和n型半导体中的至少一种 层包括由铝原子(Al),砷原子(As),氢原子(H),任选的氟原子(F)和p型或n型掺杂元素的原子(M)组成的多晶半导体膜, 所述多晶半导体膜含有平均尺寸在50〜800范围内的晶粒,所述多晶半导体膜含有0.5〜7原子%的氢原子(H); 所述i型包括(a)以硅原子(Si)为基质的非单晶半导体膜和选自氢原子(H)和氟原子(F)的至少一种原子或 (b)含有硅原子(Si)作为基体的非单晶半导体膜,选自碳原子(C)和锗原子(Ge)中的至少一种原子,以及至少一种 选自氢原子(H)和氟原子(F)的原子。