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    • 3. 发明专利
    • Nrom device and its manufacturing method
    • NROM设备及其制造方法
    • JP2006114921A
    • 2006-04-27
    • JP2005322821
    • 2005-10-07
    • Silicon Storage Technology Incシリコン ストーリッジ テクノロージー インコーポレイテッドSilicon Storage Technology, Inc.
    • CHEN BOMYLEE DANAHU YAW WENYEH BING
    • H01L21/8247H01L27/115H01L29/788H01L29/792
    • H01L27/115H01L21/28114H01L27/11568H01L29/66553
    • PROBLEM TO BE SOLVED: To form a nonvolatile read only device with a self alignment method.
      SOLUTION: A method of forming a memory device (and a device obtained as a result) comprises the steps of: forming an electron trap dielectric material on a substrate; forming a conductive material on the dielectric material; forming a material spacer on the conductive material; forming a segment thereof positioned under the material spacer by removing a part of each of the dielectric material and the conductive material; forming inside the substrate first and second spaced regions having a secondary conductivity type different from that of the substrate; extending a channel region between the first and second regions; controlling a conductivity thereof by positioning the segments of the dielectric material and a first conductive material on the first part of the channel region; forming a second conductive material on the second part of the channel region; and controlling a conductivity thereof so as to be isolated from this second conductive material.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:形成具有自对准方法的非易失性只读器件。 解决方案:形成存储器件(以及由此获得的器件)的方法包括以下步骤:在衬底上形成电子阱电介质材料; 在电介质材料上形成导电材料; 在导电材料上形成材料间隔物; 通过去除所述电介质材料和所述导电材料的一部分,形成位于所述材料间隔物下方的段; 在衬底内形成具有不同于衬底的次级导电类型的第一和第二间隔区域; 在第一和第二区域之间延伸通道区域; 通过将介电材料的段和第一导电材料定位在沟道区的第一部分上来控制其导电性; 在所述沟道区域的第二部分上形成第二导电材料; 并控制其导电性,以便与该第二导电材料隔离。 版权所有(C)2006,JPO&NCIPI