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    • 2. 发明申请
    • Driver circuit
    • 驱动电路
    • US20060239082A1
    • 2006-10-26
    • US11112267
    • 2005-04-22
    • Siew HoonFranco MalobertiJun Chen
    • Siew HoonFranco MalobertiJun Chen
    • G11C11/34G11C16/06
    • H03K17/0822H03K17/04206H03K17/165
    • A driver circuit includes a first transistor coupled between an input supply node and an output node. The first transistor operates in one of a conductive state to couple the output node with the input supply node and non-conductive state according to cooperative operation of a second transistor and a third transistor. The second transistor is coupled to provide a control input to drive the first transistor to the conductive state thereof in response a first input signal provided at a control input of the second transistor. The third transistor is coupled to provide an output at the output node in response to a second input signal provided at a control input of the third transistor, the first and second input signals being out of phase with each other. Circuitry is coupled between the input supply node and the control input of the first transistor to provide reduced impedance at the control input of the first transistor according to operation of the second transistor.
    • 驱动电路包括耦合在输入电源节点和输出节点之间的第一晶体管。 第一晶体管根据第二晶体管和第三晶体管的协同操作,以导通状态中的一个工作,以将输出节点与输入电源节点耦合和非导通状态。 第二晶体管被耦合以提供控制输入,以响应于提供在第二晶体管的控制输入处的第一输入信号而将第一晶体管驱动到其导通状态。 第三晶体管被耦合以响应于在第三晶体管的控制输入处提供的第二输入信号在输出节点处提供输出,第一和第二输入信号彼此不同相。 电路耦合在输入电源节点和第一晶体管的控制输入之间,以根据第二晶体管的操作在第一晶体管的控制输入处提供降低的阻抗。
    • 3. 发明授权
    • Driver circuit
    • 驱动电路
    • US07230452B2
    • 2007-06-12
    • US11112267
    • 2005-04-22
    • Siew Kuok HoonFranco MalobertiJun Chen
    • Siew Kuok HoonFranco MalobertiJun Chen
    • H03K19/0175
    • H03K17/0822H03K17/04206H03K17/165
    • A driver circuit includes a first transistor coupled between an input supply node and an output node. The first transistor operates in one of a conductive state to couple the output node with the input supply node and non-conductive state according to cooperative operation of a second transistor and a third transistor. The second transistor is coupled to provide a control input to drive the first transistor to the conductive state thereof in response a first input signal provided at a control input of the second transistor. The third transistor is coupled to provide an output at the output node in response to a second input signal provided at a control input of the third transistor, the first and second input signals being out of phase with each other. Circuitry is coupled between the input supply node and the control input of the first transistor to provide reduced impedance at the control input of the first transistor according to operation of the second transistor.
    • 驱动电路包括耦合在输入电源节点和输出节点之间的第一晶体管。 第一晶体管根据第二晶体管和第三晶体管的协同操作,以导通状态中的一个工作,以将输出节点与输入电源节点耦合和非导通状态。 第二晶体管被耦合以提供控制输入,以响应于提供在第二晶体管的控制输入处的第一输入信号而将第一晶体管驱动到其导电状态。 第三晶体管被耦合以响应于在第三晶体管的控制输入处提供的第二输入信号在输出节点处提供输出,第一和第二输入信号彼此不同相。 电路耦合在输入电源节点和第一晶体管的控制输入之间,以根据第二晶体管的操作在第一晶体管的控制输入处提供降低的阻抗。
    • 6. 发明申请
    • System and method for determining channel mobility
    • 用于确定信道移动性的系统和方法
    • US20060261840A1
    • 2006-11-23
    • US11131521
    • 2005-05-18
    • Siew HoonJun Chen
    • Siew HoonJun Chen
    • G01R31/26
    • G01R31/2621
    • A system and method are provided for determining channel mobility. The system includes a threshold voltage (VT) extractor that extracts the VT associated with a metal oxide semiconductor (MOS) transistor and provides an output signal functionally related to the extracted VT. An oscillator generates an oscillating waveform according to the output signal and a calculator computes an estimate of a channel mobility parameter based on the oscillating waveform. A plurality of the VT extractor and oscillators can be distributed across the wafer to provide an indication of channel mobility for different regions of the wafer.
    • 提供了一种用于确定信道移动性的系统和方法。 该系统包括提取与金属氧化物半导体(MOS)晶体管相关联的V SUB T N的阈值电压(V SUB)提取器,并提供与所提取的功能相关的输出信号 V 。 振荡器根据输出信号产生振荡波形,并且计算器基于振荡波形来计算信道移动性参数的估计。 多个V SUB提取器和振荡器可以分布在晶片上,以提供晶片的不同区域的沟道迁移率的指示。