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    • 2. 发明授权
    • Polishing apparatus
    • 抛光设备
    • US06280292B1
    • 2001-08-28
    • US09370225
    • 1999-08-09
    • Shuzo SatoHiizu OotoriiTakaaki Kozuki
    • Shuzo SatoHiizu OotoriiTakaaki Kozuki
    • B24B900
    • B23Q11/0032B24B37/04B24B41/042B24B49/16
    • A polishing wheel is pushed up and down in the Z-axis direction owing to a wafer surface shape. And the polishing amount depends on the height of protrusions on a wafer surface. Where a spindle is a rigid body in the Z-axis direction, the pressing force of the polishing wheel caused by vertical movement of a tool varies depending on the position on a wafer and hence polishing is not performed uniformly. To solve this problem, the spindle is provided with a Z-axis parallel leaf spring mechanism. Push-up and push-down actions of the polishing wheel are absorbed by displacement of the parallel leaf spring mechanism. This enables uniform polishing. Since the tool can be hardened, the flatness can also be improved.
    • 由于晶片表面形状,抛光轮在Z轴方向上下移动。 并且抛光量取决于晶片表面上的突起的高度。 在主轴是Z轴方向的刚体的情况下,由工具的垂直移动引起的抛光轮的按压力根据晶片上的位置而变化,因此不进行均匀的抛光。 为了解决这个问题,主轴设有Z轴平行板簧机构。 抛光轮的上推和下推动作被平行板簧机构的位移所吸收。 这使得均匀的抛光。 由于该工具可以硬化,所以也可以提高平坦度。