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1. 发明授权

US08540640B2 Ultrasonic probe and method for manufacturing the same and ultrasonic diagnostic device 有权
标题翻译：超声波探头及其制造方法及超声波诊断装置
公开(公告)号：US08540640B2
公开(公告)日：2013-09-24
申请号：US12525353
申请日：2008-02-27
申请人： Shuzo Sano , Akifumi Sako , Takashi Kobayashi , Mikio Izumi
发明人： Shuzo Sano , Akifumi Sako , Takashi Kobayashi , Mikio Izumi
IPC分类号： A61B8/14
CPC分类号： G01N29/2406 , B06B1/0292 , G01N29/0654 , G01N29/221 , G01N2291/106
摘要： An ultrasonic probe (2) comprises a cMUT chip (20), which has a plurality of vibration elements whose electromechanical coupling coefficient or the sensitivity changes depending on a bias voltage, and transmits/receives an ultrasonic wave; an acoustic lens (26) provided on the ultrasonic wave radiation side of the cMUT chip (20); a backing layer (22) provided on the back side of the cMUT chip (20) for absorbing propagation of the ultrasonic wave; an electric wiring portion (flexible substrate (72)), which is provided from the peripheral portion of the cMUT chip (20) to the side face of the backing layer (22) and has a signal pattern connected with the electrode of the cMUT chip (20) arranged thereon; and a housing (ultrasonic probe cover (25)) for containing the cMUT chip (20), the acoustic lens (26), the backing layer (22) and the electric wiring portion (flexible substrate (72)). A ground layer (conductive film (76)) of ground potential is provided on the ultrasonic wave radiation side of the cMUT chip (20).
摘要翻译：超声波探头（2）包括cMUT芯片（20），其具有多个振动元件，其机电耦合系数或灵敏度根据偏置电压而变化，并且发送/接收超声波; 设置在cMUT芯片（20）的超声波辐射侧的声透镜（26）; 设置在所述cMUT芯片（20）背面的用于吸收超声波传播的背衬层（22）; 从cMUT芯片（20）的周边部分到背衬层（22）的侧面设置的电连接部分（柔性基板（72）），并且具有与cMUT芯片的电极连接的信号图案（20）; 以及用于容纳cMUT芯片（20），声透镜（26），背层（22）和电布线部分（柔性基板（72））的外壳（超声波探头盖（25））。地电位的接地层（导电膜（76））设置在cMUT芯片（20）的超声波辐射侧。

2. 发明申请

US20100179430A1 ULTRASONIC PROBE AND METHOD FOR MANUFACTURING THE SAME AND ULTRASONIC DIAGNOSTIC DEVICE 有权
标题翻译：超声波探头及其制造方法及超声波诊断装置
公开(公告)号：US20100179430A1
公开(公告)日：2010-07-15
申请号：US12525353
申请日：2008-02-27
申请人： Shuzo Sano , Takashi Kobayashi , Mikio Izumi
发明人： Shuzo Sano , Takashi Kobayashi , Mikio Izumi
IPC分类号： A61B8/00 , H04R31/00
CPC分类号： G01N29/2406 , B06B1/0292 , G01N29/0654 , G01N29/221 , G01N2291/106
摘要： An ultrasonic probe (2) comprises a cMUT chip (20), which has a plurality of vibration elements whose electromechanical coupling coefficient or the sensitivity changes depending on a bias voltage, and transmits/receives an ultrasonic wave; an acoustic lens (26) provided on the ultrasonic wave radiation side of the cMUT chip (20); a backing layer (22) provided on the back side of the cMUT chip (20) for absorbing propagation of the ultrasonic wave; an electric wiring portion (flexible substrate (72)), which is provided from the peripheral portion of the cMUT chip (20) to the side face of the backing layer (22) and has a signal pattern connected with the electrode of the cMUT chip (20) arranged thereon; and a housing (ultrasonic probe cover (25)) for containing the cMUT chip (20), the acoustic lens (26), the backing layer (22) and the electric wiring portion (flexible substrate (72)). A ground layer (conductive film (76)) of ground potential is provided on the ultrasonic wave radiation side of the cMUT chip (20).
摘要翻译：超声波探头（2）包括cMUT芯片（20），其具有多个振动元件，其机电耦合系数或灵敏度根据偏置电压而变化，并且发送/接收超声波; 设置在cMUT芯片（20）的超声波辐射侧的声透镜（26）; 设置在所述cMUT芯片（20）背面的用于吸收超声波传播的背衬层（22）; 从cMUT芯片（20）的周边部分到背衬层（22）的侧面设置的电连接部分（柔性基板（72）），并且具有与cMUT芯片的电极连接的信号图案（20）; 以及用于容纳cMUT芯片（20），声透镜（26），背层（22）和电布线部分（柔性基板（72））的外壳（超声波探头盖（25））。地电位的接地层（导电膜（76））设置在cMUT芯片（20）的超声波辐射侧。

3. 发明申请

US20100036257A1 ULTRASONIC PROBE AND ULTRASONIC DIAGNOSTIC APPARATUS USING THE SAME 有权
标题翻译：超声波探头和超声波诊断装置
公开(公告)号：US20100036257A1
公开(公告)日：2010-02-11
申请号：US12513858
申请日：2007-11-06
申请人： Shuzo Sano , Akifumi Sako , Takashi Kobayashi , Mikio Izumi
发明人： Shuzo Sano , Akifumi Sako , Takashi Kobayashi , Mikio Izumi
IPC分类号： A61B8/00
CPC分类号： A61B8/4281 , A61B8/4455 , A61B8/4483 , B06B1/0292 , H04R19/005
摘要： Provided is an ultrasonic probe including: a cMUT chip having a plurality of vibration elements whose electromechanical coupling coefficient or sensitivity is changed according to a bias voltage and transmitting and receiving ultrasonic waves; an acoustic lens arranged above the cMUT chip: and a backing layer arranged below the cMUT chip.Electric leakage preventing means is provided at the ultrasonic wave transmission/reception surface side of the acoustic lens or between the acoustic lens and the cMUT chip.The electric leakage preventing means is, for example, an insulating layer such as a ground layer.By using such a structure, it is possible to provide an ultrasonic probe capable of preventing electric leakage from the ultrasonic probe to an object to be examined so as to improve the electric safety and an ultrasonic diagnostic apparatus using the probe.
摘要翻译：本发明提供一种超声波探头，包括：cMUT芯片，具有多个振动元件，其机电耦合系数或灵敏度根据偏置电压而变化，并且发送和接收超声波; 布置在cMUT芯片上方的声透镜;以及布置在cMUT芯片下方的背衬层。在声透镜的超声波发射/接收表面侧或声透镜和cMUT芯片之间设置防漏电装置。漏电防止装置例如是诸如接地层的绝缘层。通过使用这样的结构，能够提供能够防止从超声波探头向被检体的电泄漏以提高电气安全性的超声波探头和使用该探针的超声波诊断装置。

4. 发明授权

US08758253B2 Ultrasonic probe and ultrasonic diagnostic apparatus using the same 有权
标题翻译：超声波探头和超声波诊断仪使用相同
公开(公告)号：US08758253B2
公开(公告)日：2014-06-24
申请号：US12513858
申请日：2007-11-06
申请人： Shuzo Sano , Akifumi Sako , Takashi Kobayashi , Mikio Izumi
发明人： Shuzo Sano , Akifumi Sako , Takashi Kobayashi , Mikio Izumi
IPC分类号： A61B8/14 , A61B8/00
CPC分类号： A61B8/4281 , A61B8/4455 , A61B8/4483 , B06B1/0292 , H04R19/005
摘要： An ultrasonic probe is disclosed which includes a cMUT chip having a plurality of vibration elements whose electromechanical coupling coefficient or sensitivity is changed according to a bias voltage and transmitting and receiving ultrasonic waves, an acoustic lens arranged above the cMUT chip, and a backing layer arranged below the cMUT chip. An electric leakage preventing unit is provided at the ultrasonic wave transmission/reception surface side of the acoustic lens or between the acoustic lens and the cMUT chip. The electric leakage preventing unit can be, for example, an insulating layer such as a ground layer. Such a structure makes it is possible to provide an ultrasonic probe capable of preventing electric leakage from the ultrasonic probe to an object to be examined so as to improve the electric safety and an ultrasonic diagnostic apparatus using the probe.
摘要翻译：公开了一种超声波探头，其包括具有多个振动元件的cMUT芯片，其中机电耦合系数或灵敏度根据偏置电压而变化，并且发送和接收超声波，布置在cMUT芯片上方的声透镜，以及布置在在cMUT芯片之下。在声透镜的超声波发送/接收表面侧或声透镜和cMUT芯片之间设置漏电防止单元。防漏电单元可以是例如绝缘层，例如接地层。通过这样的结构，能够提供能够防止从超声波探头向被检体的漏电以提高电气安全性的超声波探头以及使用该探针的超声波诊断装置。

5. 发明授权

US5974884A Ultrasonic diagnostic apparatus and ultrasonic probe with acoustic matching layer having continuously varied acoustic impedance in the thickness direction 有权
标题翻译：具有声学匹配层的超声波诊断装置和超声波探头在厚度方向上具有连续变化的声阻抗
公开(公告)号：US5974884A
公开(公告)日：1999-11-02
申请号：US154697
申请日：1998-09-17
申请人： Shuzo Sano , Mikio Izumi
发明人： Shuzo Sano , Mikio Izumi
IPC分类号： A61B8/00 , G01N29/24 , G10K11/02 , H04R17/00 , G01N29/00
CPC分类号： G10K11/02 , G01N29/2462 , G01N2291/02475
摘要： In an ultrasonic probe, an acoustic matching layer, which is fixed on the front side of a transducer for transmitting an ultrasonic wave and receiving a reflected wave thereof and matches in acoustic impedance the transducer to a living tissue in an object to be examined, is formed in such a structure that the acoustic impedance thereof is varied continuously in the thickness direction from the transducer to the object to be examined.
摘要翻译：在超声波探头中，固定在用于发送超声波并且接收其反射波的换能器的前侧的声匹配层，并将换能器的声阻抗与待检查对象中的活体组织匹配，形成为使得其声阻抗在厚度方向上从换能器到被检体的连续变化的结构。

6. 发明申请

US20100312119A1 ULTRASONIC PROBE AND ULTRASONIC IMAGING APPARATUS 审中-公开
标题翻译：超声探头和超声波成像装置
公开(公告)号：US20100312119A1
公开(公告)日：2010-12-09
申请号：US12744996
申请日：2008-11-25
申请人： Kunio Hashiba , Mikio Izumi , Katsunori Asafusa
发明人： Kunio Hashiba , Mikio Izumi , Katsunori Asafusa
IPC分类号： A61B8/14
CPC分类号： B06B1/0292
摘要： There is provided an ultrasound probe including a capacitive transducer for reducing multiple reflections while maintaining a pulse characteristic with which a high-quality image can be obtained, and is also provided an ultrasound imaging apparatus using the ultrasound probe. The ultrasound probe including the capacitive transducer is configured so as to satisfy the condition 6.5/fc
摘要翻译：提供了包括用于减少多次反射的电容式换能器的超声波探头，同时保持可以获得高质量图像的脉冲特性，并且还提供了使用超声波探头的超声成像装置。包括电容式换能器的超声波探头被配置为满足条件6.5 / fc <αd，其中α[dB / mm / MHz]表示声透镜的吸收系数，d [mm]表示声学的最大厚度透镜，fc [MHz]表示电容式换能器的中心频率，满足条件L <1 /（（3＆pgr; fc）2×C），其中L [H]表示电容换能器每通道的电感值，C [pF]表示电容式换能器的每通道的电容，fc [MHz]表示电容换能器的中心频率。

7. 发明授权

US07669090B2 Apparatus and method for verifying custom IC 失效
标题翻译：用于验证定制IC的装置和方法
公开(公告)号：US07669090B2
公开(公告)日：2010-02-23
申请号：US11419051
申请日：2006-05-18
申请人： Hideyuki Kitazono , Toshifumi Sato , Naotaka Oda , Toshiaki Ito , Mikio Izumi
发明人： Hideyuki Kitazono , Toshifumi Sato , Naotaka Oda , Toshiaki Ito , Mikio Izumi
IPC分类号： G01R31/28 , G11C29/00 , G01R31/26 , G06F11/00
CPC分类号： G01R31/317
摘要： An apparatus for verifying a custom IC including a test pattern generating unit for generating a test pattern for verifying a function of the custom IC. The test pattern is output to a master IC and a test IC. The apparatus further includes a comparing unit connected to receive operation signals output from the master IC and the test IC for comparing the operation signals to see if the operation signals are agreed with each other and for generating a comparison signal based on a comparison result, a judging unit connected to receive the comparison signal for judging if there is any abnormality in the test IC and for outputting a judged signal based on a judged result, and a computer connected to receive the judged signal for displaying the judged result of the test IC.
摘要翻译：一种用于验证定制IC的装置，包括用于生成用于验证定制IC的功能的测试图案的测试图案生成单元。测试模式输出到主IC和测试IC。该装置还包括一个比较单元，连接到接收从主IC输出的操作信号和测试IC，用于比较操作信号，以观察操作信号是否彼此一致，并根据比较结果生成比较信号连接的判断单元接收比较信号，以判断测试IC中是否存在异常，并根据判断结果输出判断信号;以及计算机，连接以接收用于显示测试IC的判断结果的判断信号。

8. 发明申请

US20070271489A1 APPARATUS AND METHOD FOR VERIFYING CUSTOM IC 失效
标题翻译：用于验证定制IC的装置和方法
公开(公告)号：US20070271489A1
公开(公告)日：2007-11-22
申请号：US11419051
申请日：2006-05-18
申请人： Hideyuki Kitazono , Toshifumi Sato , Naotaka Oda , Toshiaki Ito , Mikio Izumi
发明人： Hideyuki Kitazono , Toshifumi Sato , Naotaka Oda , Toshiaki Ito , Mikio Izumi
IPC分类号： G01R31/28
CPC分类号： G01R31/317
摘要： An apparatus for verifying a custom IC including a test pattern generating unit for generating a test pattern for verifying a function of the custom IC. The test pattern is output to a master IC and a test IC. The apparatus further includes a comparing unit connected to receive operation signals output from the master IC and the test IC for comparing the operation signals to see if the operation signals are agreed with each other and for generating a comparison signal based on a comparison result, a judging unit connected to receive the comparison signal for judging if there is any abnormality in the test IC and for outputting a judged signal based on a judged result, and a computer connected to receive the judged signal for displaying the judged result of the test IC.
摘要翻译：一种用于验证定制IC的装置，包括用于生成用于验证定制IC的功能的测试图案的测试图案生成单元。测试模式输出到主IC和测试IC。该装置还包括一个比较单元，连接到接收从主IC输出的操作信号和测试IC，用于比较操作信号，以观察操作信号是否彼此一致，并根据比较结果生成比较信号连接的判断单元接收比较信号，以判断测试IC中是否存在异常，并根据判断结果输出判断信号;以及计算机，连接以接收用于显示测试IC的判断结果的判断信号。

9. 发明授权

US06836523B2 Radiation measurement device 有权
标题翻译：辐射测量装置
公开(公告)号：US06836523B2
公开(公告)日：2004-12-28
申请号：US10106895
申请日：2002-03-27
申请人： Mikio Izumi , Masafumi Yamada , Tatsuyuki Maekawa , Teruji Tarumi
发明人： Mikio Izumi , Masafumi Yamada , Tatsuyuki Maekawa , Teruji Tarumi
IPC分类号： G21C1708
CPC分类号： G01T1/17
摘要： A radiation measurement device includes a radiation detector generating an analog signal containing pulse components, an A/D converter converting the analog signal into sampled data, an n-th power pulse discrimination unit calculating n-th power values of the sampled data to discriminate the pulse component, where n is two or more, and a pulse counter counting a number of the discriminated pulse components.
摘要翻译：辐射测量装置包括产生包含脉冲分量的模拟信号的辐射检测器，将模拟信号转换为采样数据的A / D转换器，计算采样数据的n值的第n个功率脉冲鉴别单元，以区分脉冲分量，其中n是两个或更多个，以及脉冲计数器来计数多个所识别的脉冲分量。

10. 发明授权

US07766838B2 Ultrasonic probe in body cavity 有权
标题翻译：超声波探头在体腔内
公开(公告)号：US07766838B2
公开(公告)日：2010-08-03
申请号：US10511184
申请日：2003-04-03
申请人： Tomoyuki Yagi , Takashi Ito , Mikio Izumi
发明人： Tomoyuki Yagi , Takashi Ito , Mikio Izumi
IPC分类号： A61B8/14
CPC分类号： B06B1/0622 , A61B8/12 , A61B8/445 , A61B8/4483 , A61B2562/222 , G01N29/225 , G01N29/2487 , H01R12/594 , H01R12/63 , H01R2201/12
摘要： To miniaturize a probe, increase the channel number, and improve the flexibility of a flexible section, an ultrasound probe includes a transducer unit having a plurality of channels arranged for transmitting and receiving an ultrasound wave, and flexible circuit board is connected to the respective channels of the transducer unit in which a signal line for supplying a transmission signal and extracting a reception signal to/from transducer unit is provided. The flexible circuit board forms at least two channel blocks which are formed by dividing the plurality of channels and are spirally wound individually.
摘要翻译：为了使探头小型化，增加通道数量，提高柔性部分的灵活性，超声波探头包括具有布置用于发送和接收超声波的多个通道的换能器单元，并且柔性电路板连接到各个通道提供用于提供发送信号的信号线并向/从换能器单元提取接收信号的换能器单元。柔性电路板形成至少两个通道块，它们通过分开多个通道而形成，并分别螺旋卷绕。

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