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    • 2. 发明授权
    • Wireless measuring device
    • 无线测量设备
    • US07174268B2
    • 2007-02-06
    • US11206157
    • 2005-08-18
    • Shozo KatsukiYutaka SaitohTsutomu TanakaAkira OhnishiSumitaka Tachikawa
    • Shozo KatsukiYutaka SaitohTsutomu TanakaAkira OhnishiSumitaka Tachikawa
    • G06F15/00
    • H04Q9/00
    • A wireless measuring device 1 is provided which includes a plurality of child units 2 and a parent unit 3 to receive data measured by these child units 2 by wireless communication. Each of the child units 2 has a controlling section 20 that can move to a standby state, a measuring section 21, a signal receiving section 22 to receive a measurement instructing signal from the parent unit 3, and a signal transmitting section 23 to transmit the measured data by wireless communication. The parent unit 3 has a signal transmitting section to transmit the measurement instructing signal to each of the child units 2 and a measured data receiving section 32 to receive measured data to be transmitted from the signal transmitting section 23.
    • 提供一种无线测量装置1,其包括多个子单元2和母单元3,以通过无线通信来接收由这些子单元2测量的数据。 每个子单元2具有可以移动到待机状态的控制部分20,测量部分21,用于接收来自母单元3的测量指令信号的信号接收部分22以及信号发送部分23, 通过无线通信测量数据。 母单元3具有信号发送部分,用于将测量指示信号发送到每个子单元2和测量数据接收部分32,以接收从信号发送部分23发送的测量数据。
    • 3. 发明申请
    • Small sized wide wave-range spectroscope
    • 小尺寸宽波段光谱仪
    • US20050168738A1
    • 2005-08-04
    • US11048211
    • 2005-02-01
    • Akira OhnishiSumitaka TachikawaShozo KatsukiKoji Masutani
    • Akira OhnishiSumitaka TachikawaShozo KatsukiKoji Masutani
    • G01J3/18G01J3/36G01J3/28
    • G01J3/36G01J3/0208G01J3/0294G01J3/18
    • The present invention provides a small sized wide wave-range spectroscope with a simple structure which requires a short time to measure light for measurement over a wide wavelength spectrum. The small sized wide wave-range spectroscope has a collimator (43) for changing light for measurement (L) transmitted through a slit (41) into collimated light (L0), a plurality of diffraction gratings (44a, 44b) with different grating constants d supported rotatably around a rotational axis in parallel with the incident slit (41) and disposed side by side in the direction of the rotational axis in the optical path of the collimated light (L0), and a diffracted-light focusing members (45a, 45b) for focusing a plurality of diffracted light rays (L1 to L4) provided by the plurality of diffraction gratings (44a, 44b) by which the collimated light (L0) is diffracted, each of the diffracted-light focusing members (45a, 45b) being provided in association with each of the plurality of diffraction gratings (44a, 44b).
    • 本发明提供了一种具有简单结构的小尺寸宽波段分光镜,其需要很短时间来测量用于宽波长光谱测量的光。 小尺寸宽波段分光镜具有用于将通过狭缝(41)透射的测量用光(L)变换成准直光(L 0)的准直仪(43),多个衍射光栅(44a,44b),具有 不同的光栅常数d可以与入射狭缝(41)平行地围绕旋转轴线可旋转地支撑并且在准直光(L 0)的光路中沿旋转轴线的方向并排布置,并且衍射光聚焦 用于聚焦由衍射光(L 0)衍射的多个衍射光栅(44a,44b)提供的多个衍射光(L 1至L 4)的各个部件(45a,45b) 的衍射光聚焦构件(45a,45b)与多个衍射光栅(44a,44b)中的每一个相关联地设置。
    • 4. 发明授权
    • Small sized wide wave-range spectroscope
    • 小尺寸宽波段光谱仪
    • US07193707B2
    • 2007-03-20
    • US11048211
    • 2005-02-01
    • Akira OhnishiSumitaka TachikawaShozo KatsukiKoji Masutani
    • Akira OhnishiSumitaka TachikawaShozo KatsukiKoji Masutani
    • G01J3/28G01J3/18
    • G01J3/36G01J3/0208G01J3/0294G01J3/18
    • The present invention provides a small sized wide wave-range spectroscope with a simple structure which requires a short time to measure light for measurement over a wide wavelength spectrum. The small sized wide wave-range spectroscope has a collimator (43) for changing light for measurement (L) transmitted through a slit (41) into collimated light (L0), a plurality of diffraction gratings (44a, 44b) with different grating constants d supported rotatably around a rotational axis in parallel with the incident slit (41) and disposed side by side in the direction of the rotational axis in the optical path of the collimated light (L0), and a diffracted-light focusing members (45a, 45b) for focusing a plurality of diffracted light rays (L1 to L4) provided by the plurality of diffraction gratings (44a, 44b) by which the collimated light (L0) is diffracted, each of the diffracted-light focusing members (45a, 45b) being provided in association with each of the plurality of diffraction gratings (44a, 44b).
    • 本发明提供了一种具有简单结构的小尺寸宽波段分光镜,其需要很短时间来测量用于宽波长光谱测量的光。 小尺寸宽波段分光镜具有用于将通过狭缝(41)透射的测量用光(L)变换成准直光(L 0)的准直仪(43),多个衍射光栅(44a,44b),具有 不同的光栅常数d可以与入射狭缝(41)平行地围绕旋转轴线可旋转地支撑并且在准直光(L 0)的光路中沿旋转轴线的方向并排布置,并且衍射光聚焦 用于聚焦由衍射光(L 0)衍射的多个衍射光栅(44a,44b)提供的多个衍射光(L 1至L 4)的各个部件(45a,45b) 的衍射光聚焦构件(45a,45b)与多个衍射光栅(44a,44b)中的每一个相关联地设置。
    • 5. 发明申请
    • Emissivity measuring device
    • 发射率测量装置
    • US20060067376A1
    • 2006-03-30
    • US11237941
    • 2005-09-29
    • Shozo KatsukiAkira OhnishiSumitaka TachikawaHosei NaganoHiroaki Yamana
    • Shozo KatsukiAkira OhnishiSumitaka TachikawaHosei NaganoHiroaki Yamana
    • G01N25/00
    • G01J5/0003G01J5/522
    • The emissivity measuring device 10 of the present invention includes an integrating sphere 18 having an energy entering hole 12 through which radiation energy is made to enter from an infrared ray source 11, a sample hole 14 placed being opposite to an entering direction of radiation energy supplied from the energy entering hole 12 and open edge portions of which are put into contact, in a struck manner, with an object 13 to be tested, and a detecting hole 16 to which a detector 15 to detect radiation energy is attached, wherein the detector 15 detects radiation energy emitted from the object 13 to be tested being multiple-scattered by the integrating sphere 17 via the detecting hole 16 and the detected radiation energy is compared with a measured value of emissivity of a known sample in a calculation controlling means 18 to calculate emissivity of the object 13 to be tested. The temperature sensor is attached to aperture edge portions of the sample hole 14.
    • 本发明的发射率测量装置10包括具有能量进入孔12的积分球18,通过该能量进入孔12使辐射能量从红外线源11进入,与供给的辐射能量的进入方向相反放置的样本孔14 从能量进入孔12和其开口边缘部分以被击打的方式与要测试的物体13接触,并且附接有检测器15以检测辐射能的检测孔16,其中检测器 15通过检测孔16检测由积分球17多次散射的待测物体13发射的辐射能量,将检测出的放射能与计算控制装置18中的已知样品的发射率的测定值进行比较, 计算要测试对象13的发射率。 温度传感器附接到样品孔14的孔边缘部分。