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1. 发明申请

US20120056181A1 METHOD OF MANUFACTURING ELECTRONIC ELEMENT AND ELECTRONIC ELEMENT 审中-公开
标题翻译：制造电子元件和电子元件的方法
公开(公告)号：US20120056181A1
公开(公告)日：2012-03-08
申请号：US13218907
申请日：2011-08-26
申请人： Masanao Kamata , Hiroaki Yamana , Iwao Yagi , Noriyuki Kawashima
发明人： Masanao Kamata , Hiroaki Yamana , Iwao Yagi , Noriyuki Kawashima
IPC分类号： H01L23/522 , H01L21/28 , H05K3/00 , H01L29/786 , H05K1/02 , H01L51/44 , H01L21/768 , H01L51/48
CPC分类号： H01L27/3276 , H01L21/485 , H01L21/76894 , H01L23/4985 , H01L27/323 , H01L31/022425 , H01L2251/5338 , H01L2251/568 , H01L2924/0002 , Y02E10/549 , Y02P70/521 , Y10T29/49124 , H01L2924/00
摘要： There is provided a method of manufacturing an electronic element for forming the electronic element including one or more wiring layers and an organic insulating layer stacked on a substrate. The method includes a wiring layer formation step of forming the wiring layer on the substrate; an organic insulating layer formation step of forming an organic insulating layer on the wiring layer; and an irradiation step of irradiating a short-circuit portion of the wiring layer through the organic insulating layer with a laser beam having a wavelength transmissive through the organic insulating layer.
摘要翻译：提供了一种制造用于形成电子元件的电子元件的方法，所述电子元件包括一个或多个布线层和堆叠在基板上的有机绝缘层。该方法包括在基板上形成布线层的布线层形成步骤; 在所述布线层上形成有机绝缘层的有机绝缘层形成工序; 以及照射步骤，其通过有机绝缘层通过有机绝缘层透射波长的激光束照射有机绝缘层的布线层的短路部分。

2. 发明申请

US20060067376A1 Emissivity measuring device 审中-公开
标题翻译：发射率测量装置
公开(公告)号：US20060067376A1
公开(公告)日：2006-03-30
申请号：US11237941
申请日：2005-09-29
申请人： Shozo Katsuki , Akira Ohnishi , Sumitaka Tachikawa , Hosei Nagano , Hiroaki Yamana
发明人： Shozo Katsuki , Akira Ohnishi , Sumitaka Tachikawa , Hosei Nagano , Hiroaki Yamana
IPC分类号： G01N25/00
CPC分类号： G01J5/0003 , G01J5/522
摘要： The emissivity measuring device 10 of the present invention includes an integrating sphere 18 having an energy entering hole 12 through which radiation energy is made to enter from an infrared ray source 11, a sample hole 14 placed being opposite to an entering direction of radiation energy supplied from the energy entering hole 12 and open edge portions of which are put into contact, in a struck manner, with an object 13 to be tested, and a detecting hole 16 to which a detector 15 to detect radiation energy is attached, wherein the detector 15 detects radiation energy emitted from the object 13 to be tested being multiple-scattered by the integrating sphere 17 via the detecting hole 16 and the detected radiation energy is compared with a measured value of emissivity of a known sample in a calculation controlling means 18 to calculate emissivity of the object 13 to be tested. The temperature sensor is attached to aperture edge portions of the sample hole 14.
摘要翻译：本发明的发射率测量装置10包括具有能量进入孔12的积分球18，通过该能量进入孔12使辐射能量从红外线源11进入，与供给的辐射能量的进入方向相反放置的样本孔14 从能量进入孔12和其开口边缘部分以被击打的方式与要测试的物体13接触，并且附接有检测器15以检测辐射能的检测孔16，其中检测器 15通过检测孔16检测由积分球17多次散射的待测物体13发射的辐射能量，将检测出的放射能与计算控制装置18中的已知样品的发射率的测定值进行比较，计算要测试对象13的发射率。温度传感器附接到样品孔14的孔边缘部分。

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