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    • 3. 发明授权
    • Planar phase-change memory cell with parallel electrical paths
    • 具有并联电路径的平面相变存储单元
    • US08861266B2
    • 2014-10-14
    • US13619473
    • 2012-09-14
    • Michele M. FranceschiniJohn P. Karidis
    • Michele M. FranceschiniJohn P. Karidis
    • G11C11/00H01L45/00G11C8/10G11C11/56G11C13/00
    • G11C8/10G11C11/5678G11C13/0004G11C13/0069G11C2013/0083H01L27/2463H01L45/06H01L45/1226H01L45/144H01L45/1675
    • A method for operating a phase change memory that includes initializing a memory cell that includes: a first conductive electrode having a length greater than its width and an axis aligned with the length; a second conductive electrode having an edge oriented at an angle to the axis of the first conductive electrode; an insulator providing a separation distance between an end of the first conductive electrode and the edge of the second conductive electrode; and a phase change material covering a substantial portion of the first conductive electrode and at least a portion of the second conductive electrode. The initializing the memory cell includes creating a first amorphous material region in the phase change material. An active crystalline material region is created inside the first amorphous material region. Information is stored in the memory cell by creating a second amorphous material region inside the active crystalline material region.
    • 一种用于操作相变存储器的方法,包括初始化存储单元,所述存储单元包括:具有大于其宽度的长度的第一导电电极和与所述长度对准的轴线; 第二导电电极,其具有与第一导电电极的轴成一定角度的边缘; 绝缘体,其在所述第一导电电极的端部和所述第二导电电极的边缘之间提供间隔距离; 以及覆盖所述第一导电电极的主要部分和所述第二导电电极的至少一部分的相变材料。 初始化存储单元包括在相变材料中形成第一非晶态材料区域。 在第一无定形材料区域内形成活性结晶材料区域。 通过在活性结晶材料区域内产生第二非晶态材料区域将信息存储在存储器单元中。
    • 8. 发明授权
    • Memory reading method for resistance drift mitigation
    • 电阻漂移缓解的记忆读取方法
    • US08144508B2
    • 2012-03-27
    • US12984682
    • 2011-01-05
    • Michele M. FranceschiniJohn P. KaridisLuis A. Lastras
    • Michele M. FranceschiniJohn P. KaridisLuis A. Lastras
    • G11C11/00
    • G11C13/004G11C11/56G11C11/5678G11C13/0004G11C13/0033G11C2013/0052
    • Techniques for reading phase change memory that mitigate resistance drift. One contemplated method includes apply a plurality of electrical input signals to the memory cell. The method includes measuring a plurality of electrical output signals from the memory cell resulting from the plurality of electrical input signals. The method includes calculating an invariant component of the plurality of electrical output signals dependent on the configuration of amorphous material in the memory cell. The method also includes determining a memory state of the memory cell based on the invariant component. In one embodiment of the invention, the method further includes mapping the plurality of electrical output signals to a measurements region of a plurality of measurements regions. The measurements regions correspond to memory states of the memory cell.
    • 读取相变存储器的技术,减轻电阻漂移。 一种预期的方法包括将多个电输入信号应用于存储器单元。 该方法包括从多个电输入信号测量来自存储器单元的多个电输出信号。 该方法包括根据存储单元中非晶材料的配置来计算多个电输出信号的不变分量。 该方法还包括基于不变分量来确定存储器单元的存储器状态。 在本发明的一个实施例中,该方法还包括将多个电输出信号映射到多个测量区域的测量区域。 测量区域对应于存储器单元的存储器状态。